JPS5715471A - Junction type field effect semiconductor device and manufacture thereof - Google Patents

Junction type field effect semiconductor device and manufacture thereof

Info

Publication number
JPS5715471A
JPS5715471A JP8920680A JP8920680A JPS5715471A JP S5715471 A JPS5715471 A JP S5715471A JP 8920680 A JP8920680 A JP 8920680A JP 8920680 A JP8920680 A JP 8920680A JP S5715471 A JPS5715471 A JP S5715471A
Authority
JP
Japan
Prior art keywords
type
source
region
layer
drain
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8920680A
Other languages
Japanese (ja)
Inventor
Fujihiko Inomata
Shigeo Kubo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8920680A priority Critical patent/JPS5715471A/en
Publication of JPS5715471A publication Critical patent/JPS5715471A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/80Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier
    • H01L29/808Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier with a PN junction gate, e.g. PN homojunction gate

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Junction Field-Effect Transistors (AREA)

Abstract

PURPOSE:To obtain high gm without necessity of increasing the depth of a gate region by covering an epitaxial layer grown when the source and the drain regions of a J-FET are formed with an SiO2 film, opening a hole at the film and burying source and drain regions which contact with the epitaxial layer. CONSTITUTION:An n type layer 2 is epitaxially grown on a P<+> type Si substrate 1 becoming a substrate gate, and with an SiO2 film 6 as a mask a P<+> type isolation region 3 which contacts with the substrate 1 is diffused in the periphery of the layer 2. Then, it is photoetched, a window is opened at the center of the film 6, a shallow P<+> type gate region 4 is formed in the layer 2 by injecting P type impurity ions or depositing, and windows for source and drain contacting are opened at the films 6 disposed at both sides as by the ordinary way. Thereafter, an n type source and drain region 8 is selectively accumulated in the window, an extremely shallow n<+> type region 8a is formed on the lower surface, and source and drain electrodes 7 made of aluminum are mounted on the region 8.
JP8920680A 1980-07-02 1980-07-02 Junction type field effect semiconductor device and manufacture thereof Pending JPS5715471A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8920680A JPS5715471A (en) 1980-07-02 1980-07-02 Junction type field effect semiconductor device and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8920680A JPS5715471A (en) 1980-07-02 1980-07-02 Junction type field effect semiconductor device and manufacture thereof

Publications (1)

Publication Number Publication Date
JPS5715471A true JPS5715471A (en) 1982-01-26

Family

ID=13964237

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8920680A Pending JPS5715471A (en) 1980-07-02 1980-07-02 Junction type field effect semiconductor device and manufacture thereof

Country Status (1)

Country Link
JP (1) JPS5715471A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59173260U (en) * 1983-04-12 1984-11-19 パテント−トロイハント−ゲゼルシヤフト・フユ−ル・エレクトリツシエ・グリユ−ラムペン・ミツト・ベシユレンクテル・ハフツング reflective lamp
JPS61153941A (en) * 1984-12-14 1986-07-12 ゼネラル・エレクリツク・カンパニイ Resin-made skirt for mutual connection of metal cap and glass envelop of lamp

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59173260U (en) * 1983-04-12 1984-11-19 パテント−トロイハント−ゲゼルシヤフト・フユ−ル・エレクトリツシエ・グリユ−ラムペン・ミツト・ベシユレンクテル・ハフツング reflective lamp
JPH0436054Y2 (en) * 1983-04-12 1992-08-26
JPS61153941A (en) * 1984-12-14 1986-07-12 ゼネラル・エレクリツク・カンパニイ Resin-made skirt for mutual connection of metal cap and glass envelop of lamp

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