JPS57131042A - X rays analyzer with automatic calibration apparatus - Google Patents

X rays analyzer with automatic calibration apparatus

Info

Publication number
JPS57131042A
JPS57131042A JP56016476A JP1647681A JPS57131042A JP S57131042 A JPS57131042 A JP S57131042A JP 56016476 A JP56016476 A JP 56016476A JP 1647681 A JP1647681 A JP 1647681A JP S57131042 A JPS57131042 A JP S57131042A
Authority
JP
Japan
Prior art keywords
ray
foil
calibration plate
calibration
turned
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56016476A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0149894B2 (enrdf_load_stackoverflow
Inventor
Tokio Hirano
Masaaki Inoue
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Yokogawa Hokushin Electric Corp
Yokogawa Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp, Yokogawa Hokushin Electric Corp, Yokogawa Electric Works Ltd filed Critical Yokogawa Electric Corp
Priority to JP56016476A priority Critical patent/JPS57131042A/ja
Publication of JPS57131042A publication Critical patent/JPS57131042A/ja
Publication of JPH0149894B2 publication Critical patent/JPH0149894B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP56016476A 1981-02-06 1981-02-06 X rays analyzer with automatic calibration apparatus Granted JPS57131042A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56016476A JPS57131042A (en) 1981-02-06 1981-02-06 X rays analyzer with automatic calibration apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56016476A JPS57131042A (en) 1981-02-06 1981-02-06 X rays analyzer with automatic calibration apparatus

Publications (2)

Publication Number Publication Date
JPS57131042A true JPS57131042A (en) 1982-08-13
JPH0149894B2 JPH0149894B2 (enrdf_load_stackoverflow) 1989-10-26

Family

ID=11917323

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56016476A Granted JPS57131042A (en) 1981-02-06 1981-02-06 X rays analyzer with automatic calibration apparatus

Country Status (1)

Country Link
JP (1) JPS57131042A (enrdf_load_stackoverflow)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003002995A3 (en) * 2001-06-29 2003-05-01 Panalytical Bv Device for and method of material analysis using a shutter comprising a calibration sample
WO2006106012A1 (de) * 2005-04-08 2006-10-12 Robert Bosch Gmbh Sensorvorrichtung einer verpackungsmaschine
US7170462B2 (en) 2002-09-11 2007-01-30 Citizen Watch Co., Ltd. Antenna structure and radio controlled timepiece
US7813712B2 (en) 2004-08-25 2010-10-12 Citizen Holdings Co., Ltd. Electronic device having metal outer case and antenna therein
CN109839399A (zh) * 2019-01-23 2019-06-04 中国科学院上海应用物理研究所 基于kb镜的同步辐射共聚焦荧光实验装置的仪器校准方法
JP2022091880A (ja) * 2019-06-17 2022-06-21 ハネウェル・インターナショナル・インコーポレーテッド 複合シートの重量を同時に決定するための装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS505093A (enrdf_load_stackoverflow) * 1972-12-11 1975-01-20
JPS5594149A (en) * 1979-01-12 1980-07-17 Yokogawa Hokushin Electric Corp Reflecting type ash content meter

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS505093A (enrdf_load_stackoverflow) * 1972-12-11 1975-01-20
JPS5594149A (en) * 1979-01-12 1980-07-17 Yokogawa Hokushin Electric Corp Reflecting type ash content meter

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003002995A3 (en) * 2001-06-29 2003-05-01 Panalytical Bv Device for and method of material analysis using a shutter comprising a calibration sample
US7042978B2 (en) 2001-06-29 2006-05-09 Panalytical B.V. Examination of material samples
US7170462B2 (en) 2002-09-11 2007-01-30 Citizen Watch Co., Ltd. Antenna structure and radio controlled timepiece
US7813712B2 (en) 2004-08-25 2010-10-12 Citizen Holdings Co., Ltd. Electronic device having metal outer case and antenna therein
WO2006106012A1 (de) * 2005-04-08 2006-10-12 Robert Bosch Gmbh Sensorvorrichtung einer verpackungsmaschine
US7792247B2 (en) 2005-04-08 2010-09-07 Robert Bosch Gmbh Sensor device for a packaging machine
CN109839399A (zh) * 2019-01-23 2019-06-04 中国科学院上海应用物理研究所 基于kb镜的同步辐射共聚焦荧光实验装置的仪器校准方法
CN109839399B (zh) * 2019-01-23 2021-04-30 中国科学院上海应用物理研究所 基于kb镜的同步辐射共聚焦荧光实验装置的仪器校准方法
JP2022091880A (ja) * 2019-06-17 2022-06-21 ハネウェル・インターナショナル・インコーポレーテッド 複合シートの重量を同時に決定するための装置

Also Published As

Publication number Publication date
JPH0149894B2 (enrdf_load_stackoverflow) 1989-10-26

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