JPS5742861A - Noncontacting electrometer - Google Patents

Noncontacting electrometer

Info

Publication number
JPS5742861A
JPS5742861A JP11817780A JP11817780A JPS5742861A JP S5742861 A JPS5742861 A JP S5742861A JP 11817780 A JP11817780 A JP 11817780A JP 11817780 A JP11817780 A JP 11817780A JP S5742861 A JPS5742861 A JP S5742861A
Authority
JP
Japan
Prior art keywords
conductor plate
displaced
measured
aperture
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11817780A
Other languages
Japanese (ja)
Other versions
JPS6327662B2 (en
Inventor
Minoru Aoki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP11817780A priority Critical patent/JPS5742861A/en
Publication of JPS5742861A publication Critical patent/JPS5742861A/en
Publication of JPS6327662B2 publication Critical patent/JPS6327662B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/16—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices
    • G01R15/165—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices measuring electrostatic potential, e.g. with electrostatic voltmeters or electrometers, when the design of the sensor is essential

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

PURPOSE:To correct an error in measurement automatically by arranging a conductor plate between a body to be measured and an aperture surface so that it can be displaced, and by operation voltage signals outputted from them by displaying the conductor plate. CONSTITUTION:Between a body 15 to be measured and the aperture surface 3 of a probe 1, a conductor plate 10 is arranged so that it can be displaced. When this conductor plate 10 is displaced to shield the aperture 3, namely, when the conductor plate 10 is displaced to a measurement position where the aperture is released while a voltage signal V2 from the probe 1 is stored without reference to whether a potential to be measured is zero, th stored voltage signal V2 is subtracted from a voltage signal V1 outputted from the probe to detect a potential difference V3. Then, the V3 is outputted as the measurement signal of the surface potential of the body to be measured. With this constitution, an error in measurement results is corrected automatically.
JP11817780A 1980-08-27 1980-08-27 Noncontacting electrometer Granted JPS5742861A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11817780A JPS5742861A (en) 1980-08-27 1980-08-27 Noncontacting electrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11817780A JPS5742861A (en) 1980-08-27 1980-08-27 Noncontacting electrometer

Publications (2)

Publication Number Publication Date
JPS5742861A true JPS5742861A (en) 1982-03-10
JPS6327662B2 JPS6327662B2 (en) 1988-06-03

Family

ID=14730032

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11817780A Granted JPS5742861A (en) 1980-08-27 1980-08-27 Noncontacting electrometer

Country Status (1)

Country Link
JP (1) JPS5742861A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007218693A (en) * 2006-02-15 2007-08-30 Canon Inc Measuring device and image forming apparatus

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0571255A (en) * 1991-09-12 1993-03-23 Hajime Yamazaki Key-holder device
DE102009041172B4 (en) 2009-09-11 2018-03-29 Siemens Healthcare Gmbh Device for flexible positioning of radiation source and radiation detector for medical imaging

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5418782A (en) * 1977-07-13 1979-02-13 Ricoh Co Ltd Surface electrometer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5418782A (en) * 1977-07-13 1979-02-13 Ricoh Co Ltd Surface electrometer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007218693A (en) * 2006-02-15 2007-08-30 Canon Inc Measuring device and image forming apparatus

Also Published As

Publication number Publication date
JPS6327662B2 (en) 1988-06-03

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