JPS5276985A - Flaw detector - Google Patents
Flaw detectorInfo
- Publication number
- JPS5276985A JPS5276985A JP15353275A JP15353275A JPS5276985A JP S5276985 A JPS5276985 A JP S5276985A JP 15353275 A JP15353275 A JP 15353275A JP 15353275 A JP15353275 A JP 15353275A JP S5276985 A JPS5276985 A JP S5276985A
- Authority
- JP
- Japan
- Prior art keywords
- flaw detector
- light source
- scanning
- variation
- real time
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To prevent measurement errors by the variation in the quantity of light of a light source by scanning a reference surface and an object surface with the same light source and comparing detection levels in real time.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15353275A JPS5949533B2 (en) | 1975-12-23 | 1975-12-23 | Ketsukankenshiyutsusouchi |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15353275A JPS5949533B2 (en) | 1975-12-23 | 1975-12-23 | Ketsukankenshiyutsusouchi |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5276985A true JPS5276985A (en) | 1977-06-28 |
JPS5949533B2 JPS5949533B2 (en) | 1984-12-03 |
Family
ID=15564571
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15353275A Expired JPS5949533B2 (en) | 1975-12-23 | 1975-12-23 | Ketsukankenshiyutsusouchi |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5949533B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5658645A (en) * | 1979-10-19 | 1981-05-21 | Tdk Corp | Flaw detecting device |
JPS5950344A (en) * | 1982-09-14 | 1984-03-23 | Meidensha Electric Mfg Co Ltd | Detector for flaw of glass bottle |
-
1975
- 1975-12-23 JP JP15353275A patent/JPS5949533B2/en not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5658645A (en) * | 1979-10-19 | 1981-05-21 | Tdk Corp | Flaw detecting device |
JPS5950344A (en) * | 1982-09-14 | 1984-03-23 | Meidensha Electric Mfg Co Ltd | Detector for flaw of glass bottle |
JPH0331220B2 (en) * | 1982-09-14 | 1991-05-02 | Meidensha Electric Mfg Co Ltd |
Also Published As
Publication number | Publication date |
---|---|
JPS5949533B2 (en) | 1984-12-03 |
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