JPS5249880A - Defect inspecting apparatus - Google Patents

Defect inspecting apparatus

Info

Publication number
JPS5249880A
JPS5249880A JP12577875A JP12577875A JPS5249880A JP S5249880 A JPS5249880 A JP S5249880A JP 12577875 A JP12577875 A JP 12577875A JP 12577875 A JP12577875 A JP 12577875A JP S5249880 A JPS5249880 A JP S5249880A
Authority
JP
Japan
Prior art keywords
inspecting apparatus
defect inspecting
defect
center
made equal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12577875A
Other languages
Japanese (ja)
Other versions
JPS5612815B2 (en
Inventor
Katsuumi Koyanagi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Tateisi Electronics Co
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tateisi Electronics Co, Omron Tateisi Electronics Co filed Critical Tateisi Electronics Co
Priority to JP12577875A priority Critical patent/JPS5249880A/en
Publication of JPS5249880A publication Critical patent/JPS5249880A/en
Publication of JPS5612815B2 publication Critical patent/JPS5612815B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Abstract

PURPOSE:Detecting sensitivity is made equal even at the center or ends of scanning width.
JP12577875A 1975-10-18 1975-10-18 Defect inspecting apparatus Granted JPS5249880A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12577875A JPS5249880A (en) 1975-10-18 1975-10-18 Defect inspecting apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12577875A JPS5249880A (en) 1975-10-18 1975-10-18 Defect inspecting apparatus

Publications (2)

Publication Number Publication Date
JPS5249880A true JPS5249880A (en) 1977-04-21
JPS5612815B2 JPS5612815B2 (en) 1981-03-24

Family

ID=14918596

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12577875A Granted JPS5249880A (en) 1975-10-18 1975-10-18 Defect inspecting apparatus

Country Status (1)

Country Link
JP (1) JPS5249880A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS588584U (en) * 1981-07-06 1983-01-20 日立工機株式会社 Optimal work display device for power tools

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5858402A (en) * 1981-10-01 1983-04-07 Shoei Denki Kk Position detector for rotating body
JPH01110321U (en) * 1988-01-19 1989-07-25

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3589817A (en) * 1968-02-27 1971-06-29 Fuji Photo Film Co Ltd Photoelectric web defect-detecting apparatus which provides for overcoming the ray-diverging effect of roller curvature
JPS5016593A (en) * 1973-06-11 1975-02-21

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3589817A (en) * 1968-02-27 1971-06-29 Fuji Photo Film Co Ltd Photoelectric web defect-detecting apparatus which provides for overcoming the ray-diverging effect of roller curvature
JPS5016593A (en) * 1973-06-11 1975-02-21

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS588584U (en) * 1981-07-06 1983-01-20 日立工機株式会社 Optimal work display device for power tools

Also Published As

Publication number Publication date
JPS5612815B2 (en) 1981-03-24

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