JPS5326185A - Defect inspecting apparatus - Google Patents

Defect inspecting apparatus

Info

Publication number
JPS5326185A
JPS5326185A JP10088476A JP10088476A JPS5326185A JP S5326185 A JPS5326185 A JP S5326185A JP 10088476 A JP10088476 A JP 10088476A JP 10088476 A JP10088476 A JP 10088476A JP S5326185 A JPS5326185 A JP S5326185A
Authority
JP
Japan
Prior art keywords
inspecting apparatus
time
defect inspecting
examined
making
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10088476A
Other languages
Japanese (ja)
Other versions
JPS5626817B2 (en
Inventor
Kenji Ogino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Priority to JP10088476A priority Critical patent/JPS5326185A/en
Publication of JPS5326185A publication Critical patent/JPS5326185A/en
Publication of JPS5626817B2 publication Critical patent/JPS5626817B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Abstract

PURPOSE:To solve problem points based on the width variations of the material being examined by setting timers at a slightly shorter time by one scanning period and making the time after said time an inspection blind sector.
JP10088476A 1976-08-23 1976-08-23 Defect inspecting apparatus Granted JPS5326185A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10088476A JPS5326185A (en) 1976-08-23 1976-08-23 Defect inspecting apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10088476A JPS5326185A (en) 1976-08-23 1976-08-23 Defect inspecting apparatus

Publications (2)

Publication Number Publication Date
JPS5326185A true JPS5326185A (en) 1978-03-10
JPS5626817B2 JPS5626817B2 (en) 1981-06-20

Family

ID=14285742

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10088476A Granted JPS5326185A (en) 1976-08-23 1976-08-23 Defect inspecting apparatus

Country Status (1)

Country Link
JP (1) JPS5326185A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59187746U (en) * 1983-05-31 1984-12-13 東英電子工業株式会社 Pinhole detection mechanism
JPS6036299U (en) * 1983-08-18 1985-03-13 株式会社　パックサプライセンタ− Core barrel for decorative barrels
EP0311991A2 (en) * 1987-10-14 1989-04-19 Futec Incorporated Method and apparatus for detecting significant difference of sheet material

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6071339U (en) * 1983-10-19 1985-05-20 株式会社吉田製作所 Stirrer mounting mechanism

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59187746U (en) * 1983-05-31 1984-12-13 東英電子工業株式会社 Pinhole detection mechanism
JPS6036299U (en) * 1983-08-18 1985-03-13 株式会社　パックサプライセンタ− Core barrel for decorative barrels
EP0311991A2 (en) * 1987-10-14 1989-04-19 Futec Incorporated Method and apparatus for detecting significant difference of sheet material

Also Published As

Publication number Publication date
JPS5626817B2 (en) 1981-06-20

Similar Documents

Publication Publication Date Title
US4000650B1 (en) Method and apparatus for ultrasonic material level measurement
CA1022670A (en) Non-destructive test apparatus and method for a material having a cavity therein
CA1027848A (en) Apparatus for testing and monitoring landfills
SE7603324L (en) REINFORCEMENT FRAMEWORK AND PROCEDURE AND APPARATUS FOR MANUFACTURE THEREOF
CA1006713A (en) Method of and apparatus for nondestructively determining the composition of an unknown material sample
HU172499B (en) Method and apparatus for checking photomasks by substractive method
DE2965385D1 (en) Method and device for inspecting a moving sheet material for streaklike defects
JPS5321980A (en) Method of automatically detecting position indicated by ultrasonic wave in nonndestructive inspection of metallic material
DK134641B (en) A method of making a metal oxide film and an apparatus for carrying out the method.
NO153986C (en) PROCEDURE AND APPARATUS FOR DETERMINING THE CONCENTRATION OF AN ABSORBABLE COMPONENT IN A GAS FLOW.
JPS5326185A (en) Defect inspecting apparatus
JPS5225575A (en) Inspection method of the state of object
ATA676777A (en) DEVICE FOR TESTING MATERIAL
DE2962507D1 (en) Method and device for inspecting a moving sheet material for streaklike defects
DK265477A (en) METHOD AND APPLIANCE FOR ULTRASOUND MATERIAL TESTING
CA1010551A (en) Apparatus and method for making reverberation time measurements
ZA766169B (en) Method of and apparatus for nondestructively testing the material of a finned tube by ultrasound
JPS5379593A (en) Surface inspecting method of objects and apparatus for the same
JPS5249880A (en) Defect inspecting apparatus
JPS52139485A (en) Follow-up apparatus for use in high-speed ultrasonic flaw detection
DK197375A (en) PROCEDURE AND APPARATUS FOR PRODUCING A HOLE OBJECT FROM A TOPIC
HU179426B (en) Method and apparatus for testing the sizes of lasts,for assigning the tendecies determining the measuring and production by forming of projection drawings
SU669287A1 (en) Method of ultrasonic inspection of materials
JPS5342060A (en) Method and apparatus for inspecting holes
JPS5226246A (en) Automatically setting circuit for inspecting conditions