JPS56160662A - Noncontact type electrometer - Google Patents

Noncontact type electrometer

Info

Publication number
JPS56160662A
JPS56160662A JP6404480A JP6404480A JPS56160662A JP S56160662 A JPS56160662 A JP S56160662A JP 6404480 A JP6404480 A JP 6404480A JP 6404480 A JP6404480 A JP 6404480A JP S56160662 A JPS56160662 A JP S56160662A
Authority
JP
Japan
Prior art keywords
probe
aperture
output
sensing electrode
aperture plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6404480A
Other languages
Japanese (ja)
Inventor
Minoru Aoki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP6404480A priority Critical patent/JPS56160662A/en
Publication of JPS56160662A publication Critical patent/JPS56160662A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24—Arrangements for measuring quantities of charge

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

PURPOSE:To decrease the error in the measured result by making it possible to displace an aperture plate of a probe, keeping the output when a sensing electrode is shielded from a unit under test, and compensating a drift in the operation of the electrometer. CONSTITUTION:At the time of measurement, the aperture plate 3 is located at a position where an aperture 3a faces the sensing electrode 4. A dielectric flux current is generated by varying the electric field by a vibrating electrode 9 in response to a potential Vx to be measured. The output, which is obtained by performing the current-to-voltage conversion of said dielectric flux current, is inputted to a sample and hold circuit 15 via a switching circuit from the probe 1. Then, a solenoid in said probe 1 is actuated to move a plunger, and the aperture plate 3 is displaced to the shielded position where the aperture 3a does not face the sensing electrode 4. When the output of the probe 1 is inputted to a sample and hold circuit 16, the measured signal from which the noises are removed by a differential amplifier 7 is outputted. Thus, the error in the measured result caused by the gradual increase in the noises during the operation can be prevented.
JP6404480A 1980-05-16 1980-05-16 Noncontact type electrometer Pending JPS56160662A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6404480A JPS56160662A (en) 1980-05-16 1980-05-16 Noncontact type electrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6404480A JPS56160662A (en) 1980-05-16 1980-05-16 Noncontact type electrometer

Publications (1)

Publication Number Publication Date
JPS56160662A true JPS56160662A (en) 1981-12-10

Family

ID=13246706

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6404480A Pending JPS56160662A (en) 1980-05-16 1980-05-16 Noncontact type electrometer

Country Status (1)

Country Link
JP (1) JPS56160662A (en)

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