JPS57190212A - Device for detecting abnormality of measuring device - Google Patents

Device for detecting abnormality of measuring device

Info

Publication number
JPS57190212A
JPS57190212A JP56074852A JP7485281A JPS57190212A JP S57190212 A JPS57190212 A JP S57190212A JP 56074852 A JP56074852 A JP 56074852A JP 7485281 A JP7485281 A JP 7485281A JP S57190212 A JPS57190212 A JP S57190212A
Authority
JP
Japan
Prior art keywords
measuring device
abnormality
frequency
time
distribution pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56074852A
Other languages
Japanese (ja)
Inventor
Tetsuo Imai
Koji Mizuguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Nippon Genshiryoku Jigyo KK
Nippon Atomic Industry Group Co Ltd
Original Assignee
Toshiba Corp
Nippon Genshiryoku Jigyo KK
Tokyo Shibaura Electric Co Ltd
Nippon Atomic Industry Group Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Nippon Genshiryoku Jigyo KK, Tokyo Shibaura Electric Co Ltd, Nippon Atomic Industry Group Co Ltd filed Critical Toshiba Corp
Priority to JP56074852A priority Critical patent/JPS57190212A/en
Publication of JPS57190212A publication Critical patent/JPS57190212A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00

Abstract

PURPOSE:To detect the abnormality of the measuring device in an early stage, by analying the frequency of the inherent AC component of the measuring device included in a measuring signal and comparing the result with a frequency distribution pattern at the time of normal operational. CONSTITUTION:The inherent AC component of the measuring device included in the measuring signal at the time of the normal operation of the measuring device is detected by a detector 1 and analyzed by a frequency analyzer 2. The result is stored in a memory device 3 as the frequency distributed pattern at the time of the normal operation. When electric noises are superimposed on the detector 1 by any cause, the frequency distribution pattern is changed. By always comparing the frequency distribution pattern at the time of the normal operation in the memory device 4 with the frequency distribution pattern from the detector 1 in a comparator 4, the abnormality can be judged. Based on the judged result, the signal indicating the abnormality of the measuring device outputted from an abnormal signal device 5. Thus the abnormality of the measuring device can be detected in the early stage.
JP56074852A 1981-05-20 1981-05-20 Device for detecting abnormality of measuring device Pending JPS57190212A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56074852A JPS57190212A (en) 1981-05-20 1981-05-20 Device for detecting abnormality of measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56074852A JPS57190212A (en) 1981-05-20 1981-05-20 Device for detecting abnormality of measuring device

Publications (1)

Publication Number Publication Date
JPS57190212A true JPS57190212A (en) 1982-11-22

Family

ID=13559258

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56074852A Pending JPS57190212A (en) 1981-05-20 1981-05-20 Device for detecting abnormality of measuring device

Country Status (1)

Country Link
JP (1) JPS57190212A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61184424A (en) * 1985-02-12 1986-08-18 Tokyo Tatsuno Co Ltd Apparatus for measuring liquid amount
JP2011257309A (en) * 2010-06-10 2011-12-22 Panasonic Electric Works Co Ltd Position sensor
EP2428775A1 (en) * 2010-09-09 2012-03-14 Johannes Hübner Fabrik elektrischer Maschinen Method for monitoring rotary encoders and rotary encoder
WO2019142273A1 (en) * 2018-01-17 2019-07-25 日本電気株式会社 Facility condition monitoring system, analysis device, method and program
JP2019175434A (en) * 2018-01-23 2019-10-10 シーメンス アクチエンゲゼルシヤフトＳｉｅｍｅｎｓ Ａｋｔｉｅｎｇｅｓｅｌｌｓｃｈａｆｔ Verification of sensor data

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61184424A (en) * 1985-02-12 1986-08-18 Tokyo Tatsuno Co Ltd Apparatus for measuring liquid amount
JP2011257309A (en) * 2010-06-10 2011-12-22 Panasonic Electric Works Co Ltd Position sensor
EP2428775A1 (en) * 2010-09-09 2012-03-14 Johannes Hübner Fabrik elektrischer Maschinen Method for monitoring rotary encoders and rotary encoder
WO2019142273A1 (en) * 2018-01-17 2019-07-25 日本電気株式会社 Facility condition monitoring system, analysis device, method and program
US11346867B2 (en) 2018-01-17 2022-05-31 Nec Corporation Facility state monitoring system, analysis apparatus, method, and program
JP2019175434A (en) * 2018-01-23 2019-10-10 シーメンス アクチエンゲゼルシヤフトＳｉｅｍｅｎｓ Ａｋｔｉｅｎｇｅｓｅｌｌｓｃｈａｆｔ Verification of sensor data
US10983157B2 (en) 2018-01-23 2021-04-20 Siemens Aktiengesellschaft Verification of sensor data

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