JPS5769246A - Eddy current type method for judging abnormal quality of material - Google Patents

Eddy current type method for judging abnormal quality of material

Info

Publication number
JPS5769246A
JPS5769246A JP14607180A JP14607180A JPS5769246A JP S5769246 A JPS5769246 A JP S5769246A JP 14607180 A JP14607180 A JP 14607180A JP 14607180 A JP14607180 A JP 14607180A JP S5769246 A JPS5769246 A JP S5769246A
Authority
JP
Japan
Prior art keywords
checked
judging
judged
abnormal quality
computing device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14607180A
Other languages
Japanese (ja)
Inventor
Yasuyuki Furukawa
Kimitaka Inoue
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP14607180A priority Critical patent/JPS5769246A/en
Publication of JPS5769246A publication Critical patent/JPS5769246A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE:To enhance judging accuracy, by dividing a material to be checked into a plurality of sections, detecting the abnormal quality in every unit section, finding the difference in signal levels between the unit sections, integrating and averaging and averaging all the signals, and judging abnormality. CONSTITUTION:In order to detect the abnormal quality of the material to be checked 10, a current is conducted in an eddy current tester 1, and testing conditions are set so that sufficient detected signals can be obtained based on a reference material 11. The output signal from the tester 1 is imputted to A/D converters 13-1 and 13-2. In the case the abnormality of the material to be checked 10 is judged by the level difference between the unit sections along the longitudinal direction,said level difference is computed by a computing device 14-1 and supplied to a judging device 15-1. In the case judgement is performed for every one matrial, the digital value of the A/D converter 13-2 is imputted to an operating device 14-2, and the average value of the entire one material is judged by a judging device 15-2. In the case a plurality of the materials to be checked are compared and judged, the difference between the average value computed by the computing device 14-2, and the detected value for the preceding material to be checked is obtained by a computing device 14-3 and judgement is performed.
JP14607180A 1980-10-18 1980-10-18 Eddy current type method for judging abnormal quality of material Pending JPS5769246A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14607180A JPS5769246A (en) 1980-10-18 1980-10-18 Eddy current type method for judging abnormal quality of material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14607180A JPS5769246A (en) 1980-10-18 1980-10-18 Eddy current type method for judging abnormal quality of material

Publications (1)

Publication Number Publication Date
JPS5769246A true JPS5769246A (en) 1982-04-27

Family

ID=15399428

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14607180A Pending JPS5769246A (en) 1980-10-18 1980-10-18 Eddy current type method for judging abnormal quality of material

Country Status (1)

Country Link
JP (1) JPS5769246A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002261193A (en) * 2001-03-06 2002-09-13 Hitachi Ltd Method for manufacturing semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002261193A (en) * 2001-03-06 2002-09-13 Hitachi Ltd Method for manufacturing semiconductor device

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