JPS53100286A - Monitoring apparatus of eddy current flaw detector - Google Patents

Monitoring apparatus of eddy current flaw detector

Info

Publication number
JPS53100286A
JPS53100286A JP1477077A JP1477077A JPS53100286A JP S53100286 A JPS53100286 A JP S53100286A JP 1477077 A JP1477077 A JP 1477077A JP 1477077 A JP1477077 A JP 1477077A JP S53100286 A JPS53100286 A JP S53100286A
Authority
JP
Japan
Prior art keywords
eddy current
monitoring apparatus
flaw detector
current flaw
flaw detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1477077A
Other languages
Japanese (ja)
Inventor
Takashi Okamoto
Eiichi Nakaoka
Haruo Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP1477077A priority Critical patent/JPS53100286A/en
Publication of JPS53100286A publication Critical patent/JPS53100286A/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE: To make possible flaw detection with predetermined inspection levels by providing monitoring circuits corresponding to respective unit circuits constituting a mimic flaw signal generator and a flaw detection circuit.
COPYRIGHT: (C)1978,JPO&Japio
JP1477077A 1977-02-14 1977-02-14 Monitoring apparatus of eddy current flaw detector Pending JPS53100286A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1477077A JPS53100286A (en) 1977-02-14 1977-02-14 Monitoring apparatus of eddy current flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1477077A JPS53100286A (en) 1977-02-14 1977-02-14 Monitoring apparatus of eddy current flaw detector

Publications (1)

Publication Number Publication Date
JPS53100286A true JPS53100286A (en) 1978-09-01

Family

ID=11870285

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1477077A Pending JPS53100286A (en) 1977-02-14 1977-02-14 Monitoring apparatus of eddy current flaw detector

Country Status (1)

Country Link
JP (1) JPS53100286A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010271318A (en) * 2009-05-20 2010-12-02 Prueftechnik Dieter Busch Ag Instrument and method for measuring induction
JP2010271317A (en) * 2009-05-20 2010-12-02 Prueftechnik Dieter Busch Ag Instrument and method for measuring induction

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010271318A (en) * 2009-05-20 2010-12-02 Prueftechnik Dieter Busch Ag Instrument and method for measuring induction
JP2010271317A (en) * 2009-05-20 2010-12-02 Prueftechnik Dieter Busch Ag Instrument and method for measuring induction
US9091717B2 (en) 2009-05-20 2015-07-28 Prüftechnik Dieter Busch AG Device and method for inductive measurements—self test

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