JPS6423150A - Concentration measuring instrument - Google Patents

Concentration measuring instrument

Info

Publication number
JPS6423150A
JPS6423150A JP62179812A JP17981287A JPS6423150A JP S6423150 A JPS6423150 A JP S6423150A JP 62179812 A JP62179812 A JP 62179812A JP 17981287 A JP17981287 A JP 17981287A JP S6423150 A JPS6423150 A JP S6423150A
Authority
JP
Japan
Prior art keywords
concentration
peak value
primary
current
differentiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62179812A
Other languages
Japanese (ja)
Inventor
Hidetaka Fujimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daikin Industries Ltd
Original Assignee
Daikin Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daikin Industries Ltd filed Critical Daikin Industries Ltd
Priority to JP62179812A priority Critical patent/JPS6423150A/en
Publication of JPS6423150A publication Critical patent/JPS6423150A/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE:To increase a measurable concentration limit value by measuring the concentration of an object material by using a primary differential peak value when the concentration of a low-concentration object material is measured or a secondary differential peak value when the concentration of a high- concentration object material is measured. CONSTITUTION:A current signal detected by a current value circuit 7 is inputted to a 1st differentiating circuit 8, which outputs a current primary differential signal. Then the current primary differential signal is inputted to a 2nd differentiating circuit 9, which outputs a current secondary differential signal. Both differential signal are inputted to a selecting circuit 12 through peak detecting circuits 10 and 11 to select the peak value signal of primary or secondary differentiation. Namely, the concentration is measured by selecting the peak value of primary differentiation within a range wherein the concentration of the object material is obtained based upon the peak value of primary differentiation to improve the measurement accuracy. In a range wherein the accurate concentration measurement is not performed with the peak value of primary differentiation, on the other hand, the peak value of secondary differentiation is selected and the concentration is measured to improve the measurement accuracy.
JP62179812A 1987-07-17 1987-07-17 Concentration measuring instrument Pending JPS6423150A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62179812A JPS6423150A (en) 1987-07-17 1987-07-17 Concentration measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62179812A JPS6423150A (en) 1987-07-17 1987-07-17 Concentration measuring instrument

Publications (1)

Publication Number Publication Date
JPS6423150A true JPS6423150A (en) 1989-01-25

Family

ID=16072322

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62179812A Pending JPS6423150A (en) 1987-07-17 1987-07-17 Concentration measuring instrument

Country Status (1)

Country Link
JP (1) JPS6423150A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003044514A1 (en) * 2001-11-20 2003-05-30 Arkray, Inc. Fail judging method for analysis and analyzer

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003044514A1 (en) * 2001-11-20 2003-05-30 Arkray, Inc. Fail judging method for analysis and analyzer
JPWO2003044514A1 (en) * 2001-11-20 2005-04-07 アークレイ株式会社 Fail determination method and analyzer in analysis processing
US7083712B2 (en) 2001-11-20 2006-08-01 Arkray, Inc. Fail judging method for analysis and analyzer

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