JPS57131042A - X rays analyzer with automatic calibration apparatus - Google Patents

X rays analyzer with automatic calibration apparatus

Info

Publication number
JPS57131042A
JPS57131042A JP56016476A JP1647681A JPS57131042A JP S57131042 A JPS57131042 A JP S57131042A JP 56016476 A JP56016476 A JP 56016476A JP 1647681 A JP1647681 A JP 1647681A JP S57131042 A JPS57131042 A JP S57131042A
Authority
JP
Japan
Prior art keywords
ray
foil
calibration plate
calibration
turned
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56016476A
Other languages
Japanese (ja)
Other versions
JPH0149894B2 (en
Inventor
Tokio Hirano
Masaaki Inoue
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Yokogawa Hokushin Electric Corp
Yokogawa Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp, Yokogawa Hokushin Electric Corp, Yokogawa Electric Works Ltd filed Critical Yokogawa Electric Corp
Priority to JP56016476A priority Critical patent/JPS57131042A/en
Publication of JPS57131042A publication Critical patent/JPS57131042A/en
Publication of JPH0149894B2 publication Critical patent/JPH0149894B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To achieve an easy and quick calibration of an equipment by regulating the voltage applied on an X ray tube with a calibration plate having an Al foil and a Ti foil so that the ratio of individual X ray absorprion coefficient may reach a specified value. CONSTITUTION:Circular Al and Ti foils 61 and 62 are buried into a calibration plate 6 and a notch section 63 is formed thereon. When a selector switch provided on a driver section 7 is turned to the position of 'measurement', a notch section 63 of the calibration plate 6 is provided in a path of X ray 4 and the damping level of X ray 4 from material 2 to be measured is detected with a dtector 3 whereby the content by weight of ash contained therein 2 is determined. Then, after the removal of the material 2, when the selector switch is turned to the position of 'calibration', the Al foil 61 on the calibration plate 6 and the Ti foil 62, a certain time later, are set into the path of X ray 4 to detect the current intensity of the X ray. Both detection signals are computed with an arithmetic processing circuit 5 to regulate the voltage applied on an X ray tube 1 for the ratio of the signals to reach the specified value.
JP56016476A 1981-02-06 1981-02-06 X rays analyzer with automatic calibration apparatus Granted JPS57131042A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56016476A JPS57131042A (en) 1981-02-06 1981-02-06 X rays analyzer with automatic calibration apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56016476A JPS57131042A (en) 1981-02-06 1981-02-06 X rays analyzer with automatic calibration apparatus

Publications (2)

Publication Number Publication Date
JPS57131042A true JPS57131042A (en) 1982-08-13
JPH0149894B2 JPH0149894B2 (en) 1989-10-26

Family

ID=11917323

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56016476A Granted JPS57131042A (en) 1981-02-06 1981-02-06 X rays analyzer with automatic calibration apparatus

Country Status (1)

Country Link
JP (1) JPS57131042A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003002995A3 (en) * 2001-06-29 2003-05-01 Panalytical Bv Device for and method of material analysis using a shutter comprising a calibration sample
WO2006106012A1 (en) * 2005-04-08 2006-10-12 Robert Bosch Gmbh Sensor device for a packaging machine
US7170462B2 (en) 2002-09-11 2007-01-30 Citizen Watch Co., Ltd. Antenna structure and radio controlled timepiece
US7813712B2 (en) 2004-08-25 2010-10-12 Citizen Holdings Co., Ltd. Electronic device having metal outer case and antenna therein
CN109839399A (en) * 2019-01-23 2019-06-04 中国科学院上海应用物理研究所 The instrument calibration method of synchrotron radiation confocal fluorescent experimental provision based on KB mirror
JP2022091880A (en) * 2019-06-17 2022-06-21 ハネウェル・インターナショナル・インコーポレーテッド Apparatus for simultaneously determining weight of composite sheet

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS505093A (en) * 1972-12-11 1975-01-20
JPS5594149A (en) * 1979-01-12 1980-07-17 Yokogawa Hokushin Electric Corp Reflecting type ash content meter

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS505093A (en) * 1972-12-11 1975-01-20
JPS5594149A (en) * 1979-01-12 1980-07-17 Yokogawa Hokushin Electric Corp Reflecting type ash content meter

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003002995A3 (en) * 2001-06-29 2003-05-01 Panalytical Bv Device for and method of material analysis using a shutter comprising a calibration sample
US7042978B2 (en) 2001-06-29 2006-05-09 Panalytical B.V. Examination of material samples
US7170462B2 (en) 2002-09-11 2007-01-30 Citizen Watch Co., Ltd. Antenna structure and radio controlled timepiece
US7813712B2 (en) 2004-08-25 2010-10-12 Citizen Holdings Co., Ltd. Electronic device having metal outer case and antenna therein
WO2006106012A1 (en) * 2005-04-08 2006-10-12 Robert Bosch Gmbh Sensor device for a packaging machine
US7792247B2 (en) 2005-04-08 2010-09-07 Robert Bosch Gmbh Sensor device for a packaging machine
CN109839399A (en) * 2019-01-23 2019-06-04 中国科学院上海应用物理研究所 The instrument calibration method of synchrotron radiation confocal fluorescent experimental provision based on KB mirror
CN109839399B (en) * 2019-01-23 2021-04-30 中国科学院上海应用物理研究所 Instrument calibration method of synchronous radiation confocal fluorescence experimental device based on KB mirror
JP2022091880A (en) * 2019-06-17 2022-06-21 ハネウェル・インターナショナル・インコーポレーテッド Apparatus for simultaneously determining weight of composite sheet

Also Published As

Publication number Publication date
JPH0149894B2 (en) 1989-10-26

Similar Documents

Publication Publication Date Title
JPS5756740A (en) Object inspecting device
JPS57131042A (en) X rays analyzer with automatic calibration apparatus
DE69320442T2 (en) Device with signal strength indicator and circuit arrangement with logarithmic detector
JPS5759143A (en) Measuring method for grain size of granular material
JPS5642412A (en) Automatic gain control circuit
JPS57151808A (en) Level gauge for rail
JPS57190212A (en) Device for detecting abnormality of measuring device
JPS5581325A (en) Distance measuring device of camera
JPS5742861A (en) Noncontacting electrometer
JPS57100362A (en) Ultrasonic wave measuring device
JPS5766993A (en) Method of detecting position in marking breadth direction
JPS6480842A (en) X-ray analyzer
JPS6414855A (en) Ion implantation device
JPS5760254A (en) Grain moisture measuring apparatus
JPS56150372A (en) Decision method for contamination by radiation
JPS531571A (en) Measuring system
JPS53122477A (en) End control system of auto balance circuit in eddy current flaw detector
JPS5776432A (en) Measuring device for degree of vacuum
JPS5598343A (en) Determining method of gas concentration
JPS5684506A (en) Measuring device for radioactive thickness
JPS6423150A (en) Concentration measuring instrument
JPS5682464A (en) Partial discharge measuring method of power cable
JPS5327444A (en) Trouble shooting method and device for object detector
JPS5649948A (en) Output device of moisture-content meter in grain drier
JPS55107945A (en) Water content control device for batcher plant