JPS5712486A - Semiconductor storage device - Google Patents
Semiconductor storage deviceInfo
- Publication number
- JPS5712486A JPS5712486A JP8815080A JP8815080A JPS5712486A JP S5712486 A JPS5712486 A JP S5712486A JP 8815080 A JP8815080 A JP 8815080A JP 8815080 A JP8815080 A JP 8815080A JP S5712486 A JPS5712486 A JP S5712486A
- Authority
- JP
- Japan
- Prior art keywords
- drain
- potential
- capacity
- holding
- level
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title 1
- 230000000694 effects Effects 0.000 abstract 1
- 238000002347 injection Methods 0.000 abstract 1
- 239000007924 injection Substances 0.000 abstract 1
- 230000003071 parasitic effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/412—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only
- G11C11/4125—Cells incorporating circuit means for protecting against loss of information
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Semiconductor Memories (AREA)
- Static Random-Access Memory (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8815080A JPS5712486A (en) | 1980-06-26 | 1980-06-26 | Semiconductor storage device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8815080A JPS5712486A (en) | 1980-06-26 | 1980-06-26 | Semiconductor storage device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5712486A true JPS5712486A (en) | 1982-01-22 |
JPS6118839B2 JPS6118839B2 (enrdf_load_stackoverflow) | 1986-05-14 |
Family
ID=13934896
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8815080A Granted JPS5712486A (en) | 1980-06-26 | 1980-06-26 | Semiconductor storage device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5712486A (enrdf_load_stackoverflow) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6052998A (ja) * | 1983-09-02 | 1985-03-26 | Hitachi Ltd | メモリセル |
JPS6166296A (ja) * | 1984-09-07 | 1986-04-05 | Nec Corp | 相補型mosメモリ装置 |
JPS61276254A (ja) * | 1985-05-30 | 1986-12-06 | Nec Corp | Mos型半導体集積回路装置 |
US4858195A (en) * | 1986-05-22 | 1989-08-15 | Sony Corporation | Bit line charge sensing apparatus having CMOS threshold voltage compensation |
US6479860B2 (en) | 2000-12-08 | 2002-11-12 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory device |
US6597041B2 (en) | 2001-01-16 | 2003-07-22 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor static random access memory device |
US6781869B2 (en) | 2002-01-29 | 2004-08-24 | Renesas Technology Corp. | Semiconductor memory |
US6807081B2 (en) | 2001-12-07 | 2004-10-19 | Renesas Technology Corp. | Semiconductor memory circuit hard to cause soft error |
JP2008052847A (ja) * | 2006-08-25 | 2008-03-06 | Matsushita Electric Ind Co Ltd | ラッチ回路及びこれを備えた半導体集積回路、sram、フリップフロップ回路、情報機器、通信機器、av機器及び移動体 |
-
1980
- 1980-06-26 JP JP8815080A patent/JPS5712486A/ja active Granted
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6052998A (ja) * | 1983-09-02 | 1985-03-26 | Hitachi Ltd | メモリセル |
JPS6166296A (ja) * | 1984-09-07 | 1986-04-05 | Nec Corp | 相補型mosメモリ装置 |
JPS61276254A (ja) * | 1985-05-30 | 1986-12-06 | Nec Corp | Mos型半導体集積回路装置 |
US4858195A (en) * | 1986-05-22 | 1989-08-15 | Sony Corporation | Bit line charge sensing apparatus having CMOS threshold voltage compensation |
US6479860B2 (en) | 2000-12-08 | 2002-11-12 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory device |
US6597041B2 (en) | 2001-01-16 | 2003-07-22 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor static random access memory device |
US6807081B2 (en) | 2001-12-07 | 2004-10-19 | Renesas Technology Corp. | Semiconductor memory circuit hard to cause soft error |
US6781869B2 (en) | 2002-01-29 | 2004-08-24 | Renesas Technology Corp. | Semiconductor memory |
JP2008052847A (ja) * | 2006-08-25 | 2008-03-06 | Matsushita Electric Ind Co Ltd | ラッチ回路及びこれを備えた半導体集積回路、sram、フリップフロップ回路、情報機器、通信機器、av機器及び移動体 |
Also Published As
Publication number | Publication date |
---|---|
JPS6118839B2 (enrdf_load_stackoverflow) | 1986-05-14 |
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