JPS57121236A - Plasma processing and device thereof - Google Patents
Plasma processing and device thereofInfo
- Publication number
- JPS57121236A JPS57121236A JP768681A JP768681A JPS57121236A JP S57121236 A JPS57121236 A JP S57121236A JP 768681 A JP768681 A JP 768681A JP 768681 A JP768681 A JP 768681A JP S57121236 A JPS57121236 A JP S57121236A
- Authority
- JP
- Japan
- Prior art keywords
- susceptor
- holes
- wafers
- plasma processing
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4412—Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Drying Of Semiconductors (AREA)
Abstract
PURPOSE:To reduce unevenness of plasma process of a plasma process device by a method wherein the area of opening or density of distribution of gas discharging holes provided in a susceptor is made to differ in accordance with the position thereof. CONSTITUTION:The gas discharging holes 9A, 9B, etc., are provided at the outside circumferential parts of the positions to be arranged with wafers on a susceptor 3 being put the wafers 6A, 6B, etc., thereon, and the area of opening or density of distribution of the holes thereof is made to differ in accordance with the positions on the susceptor to control flow quantity of gas to be discharged through the holes thereof. Accordingly because relations of reaction gas to the respective wafers are unified, unevenness in plasma processing is reduced.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP768681A JPS57121236A (en) | 1981-01-20 | 1981-01-20 | Plasma processing and device thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP768681A JPS57121236A (en) | 1981-01-20 | 1981-01-20 | Plasma processing and device thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57121236A true JPS57121236A (en) | 1982-07-28 |
Family
ID=11672663
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP768681A Pending JPS57121236A (en) | 1981-01-20 | 1981-01-20 | Plasma processing and device thereof |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57121236A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60179033U (en) * | 1984-05-08 | 1985-11-28 | 株式会社富士電機総合研究所 | discharge electrode |
JPS6261317A (en) * | 1985-09-11 | 1987-03-18 | Toshiba Corp | Vapor growth method |
EP1079423A1 (en) * | 1998-04-09 | 2001-02-28 | Tokyo Electron Limited | Apparatus for gas processing |
-
1981
- 1981-01-20 JP JP768681A patent/JPS57121236A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60179033U (en) * | 1984-05-08 | 1985-11-28 | 株式会社富士電機総合研究所 | discharge electrode |
JPS6261317A (en) * | 1985-09-11 | 1987-03-18 | Toshiba Corp | Vapor growth method |
EP1079423A1 (en) * | 1998-04-09 | 2001-02-28 | Tokyo Electron Limited | Apparatus for gas processing |
EP1079423A4 (en) * | 1998-04-09 | 2005-06-08 | Tokyo Electron Ltd | Apparatus for gas processing |
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