JPS57115857A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS57115857A JPS57115857A JP122181A JP122181A JPS57115857A JP S57115857 A JPS57115857 A JP S57115857A JP 122181 A JP122181 A JP 122181A JP 122181 A JP122181 A JP 122181A JP S57115857 A JPS57115857 A JP S57115857A
- Authority
- JP
- Japan
- Prior art keywords
- region
- type
- layer
- substrate
- reaches
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
Abstract
PURPOSE:To obtain a semiconductor device with a small parasitic capacitance performing a high speed logical operation by a method wherein a semiconductor layer is formed on a substrate hving dielectric property such as sapphire, and on the surface of it a bipolar transistor is provided. CONSTITUTION:On a sapphire substrate 10 whose surface is mirror polished an N<-> type Si layer 11 is grown by epitaxial growth, its surface is covered by an SiO2 film 12 and by removing a part of this an N<+> type buried layer 13 which reaches the substrate 10 is formed by diffusion in a part of the layer 11. Next after the film 12 is removed, on all surface an N<-> type layer 14 is grown epitaxually, and by ion implanted using an SiO2 film 15 as a mask a P type base region 16 for a bipolar transistor element which reaches the layer 13, a P type isolation region 17 which reaches the substrate 10, and a P type region 18 for an N channel MOSFET element are formed. Subsequently a P<+> type base contact region 23 and an N<+> type emitter region 26 in the region 16, an N<+> type emitter region 26 in the region 16, an N<+> collector contact region 27 and P<+> type source-drain regions 24 and 25 in a layer 14 between which the region 17 is put, and an N<+> type source-drain regions 28 and 29 in the region 18 are individually formed by diffusion.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP122181A JPS57115857A (en) | 1981-01-09 | 1981-01-09 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP122181A JPS57115857A (en) | 1981-01-09 | 1981-01-09 | Semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57115857A true JPS57115857A (en) | 1982-07-19 |
Family
ID=11495405
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP122181A Pending JPS57115857A (en) | 1981-01-09 | 1981-01-09 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57115857A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6091663A (en) * | 1983-10-26 | 1985-05-23 | Seiko Epson Corp | Bi-mos element |
JPS60101962A (en) * | 1983-11-07 | 1985-06-06 | Seiko Epson Corp | Semiconductor element |
US6759303B1 (en) * | 2000-03-02 | 2004-07-06 | The United States Of America As Represented By The Secretary Of The Navy | Complementary vertical bipolar junction transistors fabricated of silicon-on-sapphire utilizing wide base PNP transistors |
WO2011040016A1 (en) * | 2009-09-29 | 2011-04-07 | Fuji Electric Systems Co., Ltd. | High voltage semiconductor device and driving circuit |
-
1981
- 1981-01-09 JP JP122181A patent/JPS57115857A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6091663A (en) * | 1983-10-26 | 1985-05-23 | Seiko Epson Corp | Bi-mos element |
JPS60101962A (en) * | 1983-11-07 | 1985-06-06 | Seiko Epson Corp | Semiconductor element |
US6759303B1 (en) * | 2000-03-02 | 2004-07-06 | The United States Of America As Represented By The Secretary Of The Navy | Complementary vertical bipolar junction transistors fabricated of silicon-on-sapphire utilizing wide base PNP transistors |
WO2011040016A1 (en) * | 2009-09-29 | 2011-04-07 | Fuji Electric Systems Co., Ltd. | High voltage semiconductor device and driving circuit |
JP2012519371A (en) * | 2009-09-29 | 2012-08-23 | 富士電機株式会社 | High voltage semiconductor device and drive circuit |
US8674729B2 (en) | 2009-09-29 | 2014-03-18 | Fuji Electric Co., Ltd. | High voltage semiconductor device and driving circuit |
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