JPS57112063A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS57112063A
JPS57112063A JP18726580A JP18726580A JPS57112063A JP S57112063 A JPS57112063 A JP S57112063A JP 18726580 A JP18726580 A JP 18726580A JP 18726580 A JP18726580 A JP 18726580A JP S57112063 A JPS57112063 A JP S57112063A
Authority
JP
Japan
Prior art keywords
layer
region
forming
oxide film
base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18726580A
Other languages
Japanese (ja)
Inventor
Yuki Shimauchi
Yasushi Yasuda
Hiroshi Enomoto
Katsuharu Mitono
Akinori Tawara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP18726580A priority Critical patent/JPS57112063A/en
Publication of JPS57112063A publication Critical patent/JPS57112063A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/08Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Element Separation (AREA)
  • Bipolar Transistors (AREA)

Abstract

PURPOSE:To reduce collector resistance and enhance a bipolar circuit in speed, by providing a protection film in a base region, forming a thick oxide film, removing the oxide film after forming a base layer, and forming a collector contact layer and an emitter layer at the same time. CONSTITUTION:An n<+>-buried layer is diffused on a p-substrate 1. A transistor formation region is established by growing an n-epitaxial layer 3 (1.5mum thick or so) and forming a p<+>-separated layer 4. Next, a protection layer 10 of nitride is provided on a base region. A selective oxide film 11 is thickly formed (1mum thick or so), and the protection layer 10 is removed. A p-base layer 7 is formed by ion implantation. Next, the oxide layer 11 in a collector contact formation region is removed. A resist mask is provided. An n<+> layer (0.3mum deep or so) is formed in a contact region 12 and an emitter region 8. This makes a high resistance region thinner by inroads of the oxide film 11 into the epitaxial layer 3. The decrease in collector resistance enhances the finely divided bipolar IC in speed.
JP18726580A 1980-12-29 1980-12-29 Manufacture of semiconductor device Pending JPS57112063A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18726580A JPS57112063A (en) 1980-12-29 1980-12-29 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18726580A JPS57112063A (en) 1980-12-29 1980-12-29 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS57112063A true JPS57112063A (en) 1982-07-12

Family

ID=16202947

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18726580A Pending JPS57112063A (en) 1980-12-29 1980-12-29 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS57112063A (en)

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