JPS57109324A - Method for junction and formation of amorphous silicon film - Google Patents
Method for junction and formation of amorphous silicon filmInfo
- Publication number
- JPS57109324A JPS57109324A JP55185841A JP18584180A JPS57109324A JP S57109324 A JPS57109324 A JP S57109324A JP 55185841 A JP55185841 A JP 55185841A JP 18584180 A JP18584180 A JP 18584180A JP S57109324 A JPS57109324 A JP S57109324A
- Authority
- JP
- Japan
- Prior art keywords
- type
- junction
- formation
- amorphous silicon
- silicon film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/0257—Doping during depositing
- H01L21/02573—Conductivity type
- H01L21/02576—N-type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/0257—Doping during depositing
- H01L21/02573—Conductivity type
- H01L21/02579—P-type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02631—Physical deposition at reduced pressure, e.g. MBE, sputtering, evaporation
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Photovoltaic Devices (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Abstract
PURPOSE:To obtain P-N or P-I-N junction for the subject amorphous silicon film by a method wherein, using P type and N type, or P type, N type and I type of silicon targets, a sputtering is performed on each target successively in the order of the conductive type corresponding to the desired junction. CONSTITUTION:An N type and P type targets, wherein impurities are doped in advance, and the I type silicon target, wherein no impurities are doped, are used. These targets are sputtered successively in the atmosphere of argon, or mixture of argon and hydrogen. As a result, the junction and formation can be controlled easily and the desired junction can also be obtained without using poisonous gas. The diode obtained using this method has excellent characteristics.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55185841A JPS57109324A (en) | 1980-12-26 | 1980-12-26 | Method for junction and formation of amorphous silicon film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55185841A JPS57109324A (en) | 1980-12-26 | 1980-12-26 | Method for junction and formation of amorphous silicon film |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57109324A true JPS57109324A (en) | 1982-07-07 |
Family
ID=16177809
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55185841A Pending JPS57109324A (en) | 1980-12-26 | 1980-12-26 | Method for junction and formation of amorphous silicon film |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57109324A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110199376A (en) * | 2016-12-06 | 2019-09-03 | 澳大利亚国立大学 | Solar battery manufacture |
-
1980
- 1980-12-26 JP JP55185841A patent/JPS57109324A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110199376A (en) * | 2016-12-06 | 2019-09-03 | 澳大利亚国立大学 | Solar battery manufacture |
JP2020504441A (en) * | 2016-12-06 | 2020-02-06 | ジ オーストラリアン ナショナル ユニバーシティ | Manufacture of solar cells |
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