JPS5694653A - Resistor - Google Patents

Resistor

Info

Publication number
JPS5694653A
JPS5694653A JP17074179A JP17074179A JPS5694653A JP S5694653 A JPS5694653 A JP S5694653A JP 17074179 A JP17074179 A JP 17074179A JP 17074179 A JP17074179 A JP 17074179A JP S5694653 A JPS5694653 A JP S5694653A
Authority
JP
Japan
Prior art keywords
resistor
opening
film
thin film
region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17074179A
Other languages
Japanese (ja)
Inventor
Kazushi Nagata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP17074179A priority Critical patent/JPS5694653A/en
Publication of JPS5694653A publication Critical patent/JPS5694653A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/06Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
    • H01L27/0688Integrated circuits having a three-dimensional layout

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To obtain the resistor not requiring an occupied area nearly at all by using a thin film of retarded conductivity such as a nitride or oxide of Si held by two conductors between as a resistor when the resistor to be used for IC is prepared. CONSTITUTION:On the surface layer of an Si substrate 1 which is the 1st conductive type is formed a diffusion region 2 which is the 2nd conductive type and the whole surface including the region 2 is convered with an insulation film 3. Next, an opening is made in the film 3 so as for it to correspond to a prescribed position in the region 2 and the thin film 7 of retarded conductivity, constituted by Si3N4, SiO2 or the like, is connected to the side wall and bottom surface of the opening with an overhang to the edge part of the opening, and the film 7 is used as the desired resistor. After that, an electrode 4 is pushed into the opening, and the resistor is formed of the thin film 7 held by the electrode 4 and the diffusion region 2 between. In this way, the area occupied by the device is turned extremely small and also it becomes possible to obtain very high resistance.
JP17074179A 1979-12-27 1979-12-27 Resistor Pending JPS5694653A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17074179A JPS5694653A (en) 1979-12-27 1979-12-27 Resistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17074179A JPS5694653A (en) 1979-12-27 1979-12-27 Resistor

Publications (1)

Publication Number Publication Date
JPS5694653A true JPS5694653A (en) 1981-07-31

Family

ID=15910517

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17074179A Pending JPS5694653A (en) 1979-12-27 1979-12-27 Resistor

Country Status (1)

Country Link
JP (1) JPS5694653A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5745967A (en) * 1980-09-04 1982-03-16 Toshiba Corp Semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5745967A (en) * 1980-09-04 1982-03-16 Toshiba Corp Semiconductor device

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