JPS566454A - Formation of metal pattern for semiconductor substrate - Google Patents

Formation of metal pattern for semiconductor substrate

Info

Publication number
JPS566454A
JPS566454A JP8169879A JP8169879A JPS566454A JP S566454 A JPS566454 A JP S566454A JP 8169879 A JP8169879 A JP 8169879A JP 8169879 A JP8169879 A JP 8169879A JP S566454 A JPS566454 A JP S566454A
Authority
JP
Japan
Prior art keywords
film
semiconductor substrate
metal
formation
metal pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8169879A
Other languages
Japanese (ja)
Inventor
Toru Okuma
Kenji Mitsui
Morio Inoue
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Priority to JP8169879A priority Critical patent/JPS566454A/en
Publication of JPS566454A publication Critical patent/JPS566454A/en
Pending legal-status Critical Current

Links

Landscapes

  • Drying Of Semiconductors (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Abstract

PURPOSE:To obtain a pattern with a T-shaped cross section by dry etching with a halogen-affiliated gas of the first metal film and the second metal film added by metal different in the vapor pressure of the halogenide from the metal, both formed on the semiconductor substrate. CONSTITUTION:The Al film 3 containing Cu, for instance, and the highly pure Al film 4 are formed in sequence on the insulator film 2 made of SiO2 provided on the semiconductor substrate 1 made of Si or the like and the photoresist film 5 with a specified shape thereon. The film 5 undergoes a dry etching with a halogen affiliated gas to form an electrode pattern. As Cu is smaller in the vapor pressure as halogenide than that of Al, the Al film containing Cu is lower in the etching speed than that of the highly pure Al film. Thus, the lower layer is tapered. This facilitates the producing of the electrode pattern with a T-shaped cross section. In place of Al, W and Mo may be used and in place of Cu, Zn, Ni, Fe or the like may be used.
JP8169879A 1979-06-28 1979-06-28 Formation of metal pattern for semiconductor substrate Pending JPS566454A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8169879A JPS566454A (en) 1979-06-28 1979-06-28 Formation of metal pattern for semiconductor substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8169879A JPS566454A (en) 1979-06-28 1979-06-28 Formation of metal pattern for semiconductor substrate

Publications (1)

Publication Number Publication Date
JPS566454A true JPS566454A (en) 1981-01-23

Family

ID=13753587

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8169879A Pending JPS566454A (en) 1979-06-28 1979-06-28 Formation of metal pattern for semiconductor substrate

Country Status (1)

Country Link
JP (1) JPS566454A (en)

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