JPS5651678A - Testing method for memory element and pattern generator for test - Google Patents

Testing method for memory element and pattern generator for test

Info

Publication number
JPS5651678A
JPS5651678A JP12746879A JP12746879A JPS5651678A JP S5651678 A JPS5651678 A JP S5651678A JP 12746879 A JP12746879 A JP 12746879A JP 12746879 A JP12746879 A JP 12746879A JP S5651678 A JPS5651678 A JP S5651678A
Authority
JP
Japan
Prior art keywords
whole
group
memory area
written
memory element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12746879A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6132756B2 (enrdf_load_stackoverflow
Inventor
Tsutomu Ishikawa
Kazumitsu Matsuzawa
Noboru Onishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP12746879A priority Critical patent/JPS5651678A/ja
Publication of JPS5651678A publication Critical patent/JPS5651678A/ja
Publication of JPS6132756B2 publication Critical patent/JPS6132756B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP12746879A 1979-10-03 1979-10-03 Testing method for memory element and pattern generator for test Granted JPS5651678A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12746879A JPS5651678A (en) 1979-10-03 1979-10-03 Testing method for memory element and pattern generator for test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12746879A JPS5651678A (en) 1979-10-03 1979-10-03 Testing method for memory element and pattern generator for test

Publications (2)

Publication Number Publication Date
JPS5651678A true JPS5651678A (en) 1981-05-09
JPS6132756B2 JPS6132756B2 (enrdf_load_stackoverflow) 1986-07-29

Family

ID=14960667

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12746879A Granted JPS5651678A (en) 1979-10-03 1979-10-03 Testing method for memory element and pattern generator for test

Country Status (1)

Country Link
JP (1) JPS5651678A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5814399A (ja) * 1981-07-17 1983-01-27 Yamatake Honeywell Co Ltd メモリ用アドレスバツフアの故障診断方法
JPS63202000A (ja) * 1987-02-13 1988-08-22 インターナシヨナル・ビジネス・マシーンズ・コーポレーシヨン アドレス・ライン・テスト方法
US5703818A (en) * 1996-08-26 1997-12-30 Mitsubishi Denki Kabushiki Kaisha Test circuit

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62172249U (enrdf_load_stackoverflow) * 1986-04-21 1987-10-31

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5814399A (ja) * 1981-07-17 1983-01-27 Yamatake Honeywell Co Ltd メモリ用アドレスバツフアの故障診断方法
JPS63202000A (ja) * 1987-02-13 1988-08-22 インターナシヨナル・ビジネス・マシーンズ・コーポレーシヨン アドレス・ライン・テスト方法
US5703818A (en) * 1996-08-26 1997-12-30 Mitsubishi Denki Kabushiki Kaisha Test circuit

Also Published As

Publication number Publication date
JPS6132756B2 (enrdf_load_stackoverflow) 1986-07-29

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