JPS5649565A - Semiconductor memory unit manufacturing method - Google Patents

Semiconductor memory unit manufacturing method

Info

Publication number
JPS5649565A
JPS5649565A JP12722980A JP12722980A JPS5649565A JP S5649565 A JPS5649565 A JP S5649565A JP 12722980 A JP12722980 A JP 12722980A JP 12722980 A JP12722980 A JP 12722980A JP S5649565 A JPS5649565 A JP S5649565A
Authority
JP
Japan
Prior art keywords
electrode
prepared
capacity
gate electrode
pile
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12722980A
Other languages
Japanese (ja)
Other versions
JPS592188B2 (en
Inventor
Shinji Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55127229A priority Critical patent/JPS592188B2/en
Publication of JPS5649565A publication Critical patent/JPS5649565A/en
Publication of JPS592188B2 publication Critical patent/JPS592188B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • H10B12/30DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells

Landscapes

  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)

Abstract

PURPOSE:To improve an integration degree by a method wherein on the insulating film of a semiconductor substrate one electrode of a capacity element is selectively prepared and on another part adjacent thereto an MISFET gate electrode is prepared through the insulating film. CONSTITUTION:An opening is made to the SiO2 film 2' of an n<-> type substrate to selectively form polysilicon 3. Being B-diffused a p<+> source 4, a capacity element electrode 3', a bit line 3' are formed and covered with SiO2 3''. Next an FET gate electrode 5 of conductive polysilicon is prepared to pile on the source 4 and the electrode 3, further a word line 6 of Al is prepared to be connected C1, C2 with the electrode 5. Said constitution allows it to pile up the capacity electrode 3' and the FET gate electrode 5 excluding the FET drain to get a memory cell having a small occupying area. Said unit is capable of high-speed working and has a big memorizing capacity.
JP55127229A 1980-09-16 1980-09-16 Manufacturing method of semiconductor memory device Expired JPS592188B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55127229A JPS592188B2 (en) 1980-09-16 1980-09-16 Manufacturing method of semiconductor memory device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55127229A JPS592188B2 (en) 1980-09-16 1980-09-16 Manufacturing method of semiconductor memory device

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP50066563A Division JPS51142932A (en) 1975-06-04 1975-06-04 Semiconductor memory devices

Publications (2)

Publication Number Publication Date
JPS5649565A true JPS5649565A (en) 1981-05-06
JPS592188B2 JPS592188B2 (en) 1984-01-17

Family

ID=14954918

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55127229A Expired JPS592188B2 (en) 1980-09-16 1980-09-16 Manufacturing method of semiconductor memory device

Country Status (1)

Country Link
JP (1) JPS592188B2 (en)

Also Published As

Publication number Publication date
JPS592188B2 (en) 1984-01-17

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