JPS5648175A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS5648175A JPS5648175A JP12397279A JP12397279A JPS5648175A JP S5648175 A JPS5648175 A JP S5648175A JP 12397279 A JP12397279 A JP 12397279A JP 12397279 A JP12397279 A JP 12397279A JP S5648175 A JPS5648175 A JP S5648175A
- Authority
- JP
- Japan
- Prior art keywords
- electret plate
- sos
- mosfet
- film
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 239000000758 substrate Substances 0.000 abstract 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 abstract 1
- 239000005388 borosilicate glass Substances 0.000 abstract 1
- 235000013869 carnauba wax Nutrition 0.000 abstract 1
- 239000004203 carnauba wax Substances 0.000 abstract 1
- 229910052681 coesite Inorganic materials 0.000 abstract 1
- 229910052906 cristobalite Inorganic materials 0.000 abstract 1
- 239000012535 impurity Substances 0.000 abstract 1
- 239000002184 metal Substances 0.000 abstract 1
- 229910052751 metal Inorganic materials 0.000 abstract 1
- 229910052594 sapphire Inorganic materials 0.000 abstract 1
- 239000010980 sapphire Substances 0.000 abstract 1
- 239000000377 silicon dioxide Substances 0.000 abstract 1
- 235000012239 silicon dioxide Nutrition 0.000 abstract 1
- 229910052682 stishovite Inorganic materials 0.000 abstract 1
- 229910052905 tridymite Inorganic materials 0.000 abstract 1
- 239000011701 zinc Substances 0.000 abstract 1
- 229910052725 zinc Inorganic materials 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78651—Silicon transistors
- H01L29/78654—Monocrystalline silicon transistors
- H01L29/78657—SOS transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78603—Thin film transistors, i.e. transistors with a channel being at least partly a thin film characterised by the insulating substrate or support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
Abstract
PURPOSE:To make possible to control the characteristics of an SOS.MOSFET more widely and at high accuracy by forming a semiconductor element on one principal plane of a dielectric substrate and providing an electret plate on the other principal plane side contacting it or separated from it. CONSTITUTION:On a dielectric substrate 1 of sapphire, etc., a p type Si layer 2 is epitaxially grown, and on its central area, a gate metal film 4 is coated via a gate SiO2 film 3. Next, using the film 4 as a mask and diffusing N type impurities into the layer 2 on its both sides, n<+> type source region 5 and drain region 6 are formed, and thus an SOS.MOSFET is formed. Then a thin electret plate 7 consisting of carnauba wax, magnetized zinc, borosilicate glass, etc., is coated on the back face of the substrate 1. By so doing, the threshold voltage of the FET can be controlled by the surface potential and polarity of the thin electret plate 7.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12397279A JPS5648175A (en) | 1979-09-28 | 1979-09-28 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12397279A JPS5648175A (en) | 1979-09-28 | 1979-09-28 | Semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5648175A true JPS5648175A (en) | 1981-05-01 |
JPS6159670B2 JPS6159670B2 (en) | 1986-12-17 |
Family
ID=14873861
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12397279A Granted JPS5648175A (en) | 1979-09-28 | 1979-09-28 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5648175A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61253055A (en) * | 1985-04-30 | 1986-11-10 | ハダコ・リミテッド | Prosthesis for lower jaw joint |
-
1979
- 1979-09-28 JP JP12397279A patent/JPS5648175A/en active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61253055A (en) * | 1985-04-30 | 1986-11-10 | ハダコ・リミテッド | Prosthesis for lower jaw joint |
JPH0371899B2 (en) * | 1985-04-30 | 1991-11-14 | Vitek Inc |
Also Published As
Publication number | Publication date |
---|---|
JPS6159670B2 (en) | 1986-12-17 |
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