JPS5642234A - Photomask preparation - Google Patents
Photomask preparationInfo
- Publication number
- JPS5642234A JPS5642234A JP11736079A JP11736079A JPS5642234A JP S5642234 A JPS5642234 A JP S5642234A JP 11736079 A JP11736079 A JP 11736079A JP 11736079 A JP11736079 A JP 11736079A JP S5642234 A JPS5642234 A JP S5642234A
- Authority
- JP
- Japan
- Prior art keywords
- parts
- peripheral
- central
- line width
- film thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000002093 peripheral effect Effects 0.000 abstract 3
- 238000005530 etching Methods 0.000 abstract 2
- 238000003384 imaging method Methods 0.000 abstract 2
- 238000000034 method Methods 0.000 abstract 2
- 238000001259 photo etching Methods 0.000 abstract 2
- 239000004065 semiconductor Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/80—Etching
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/36—Masks having proximity correction features; Preparation thereof, e.g. optical proximity correction [OPC] design processes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11736079A JPS5642234A (en) | 1979-09-14 | 1979-09-14 | Photomask preparation |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11736079A JPS5642234A (en) | 1979-09-14 | 1979-09-14 | Photomask preparation |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5642234A true JPS5642234A (en) | 1981-04-20 |
JPS623941B2 JPS623941B2 (enrdf_load_stackoverflow) | 1987-01-28 |
Family
ID=14709745
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11736079A Granted JPS5642234A (en) | 1979-09-14 | 1979-09-14 | Photomask preparation |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5642234A (enrdf_load_stackoverflow) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003282429A (ja) * | 2002-01-28 | 2003-10-03 | Samsung Electronics Co Ltd | 半導体装置の製造のためのパターニング方法 |
JP2006210840A (ja) * | 2005-01-31 | 2006-08-10 | Toshiba Corp | パターン形成方法、フォトマスクの製造方法、半導体装置の製造方法およびプログラム |
US7346882B2 (en) | 2001-07-30 | 2008-03-18 | Kabushiki Kaisha Toshiba | Pattern forming method, mask manufacturing method, and LSI manufacturing method |
-
1979
- 1979-09-14 JP JP11736079A patent/JPS5642234A/ja active Granted
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7346882B2 (en) | 2001-07-30 | 2008-03-18 | Kabushiki Kaisha Toshiba | Pattern forming method, mask manufacturing method, and LSI manufacturing method |
JP2003282429A (ja) * | 2002-01-28 | 2003-10-03 | Samsung Electronics Co Ltd | 半導体装置の製造のためのパターニング方法 |
JP2006210840A (ja) * | 2005-01-31 | 2006-08-10 | Toshiba Corp | パターン形成方法、フォトマスクの製造方法、半導体装置の製造方法およびプログラム |
Also Published As
Publication number | Publication date |
---|---|
JPS623941B2 (enrdf_load_stackoverflow) | 1987-01-28 |
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