JPS5641165B2 - - Google Patents

Info

Publication number
JPS5641165B2
JPS5641165B2 JP1443377A JP1443377A JPS5641165B2 JP S5641165 B2 JPS5641165 B2 JP S5641165B2 JP 1443377 A JP1443377 A JP 1443377A JP 1443377 A JP1443377 A JP 1443377A JP S5641165 B2 JPS5641165 B2 JP S5641165B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1443377A
Other languages
Japanese (ja)
Other versions
JPS5399762A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1443377A priority Critical patent/JPS5399762A/ja
Priority to US05/870,096 priority patent/US4197814A/en
Priority to DE2805247A priority patent/DE2805247C2/de
Publication of JPS5399762A publication Critical patent/JPS5399762A/ja
Publication of JPS5641165B2 publication Critical patent/JPS5641165B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/221Ion beam deposition
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B23/00Single-crystal growth by condensing evaporated or sublimed materials
    • C30B23/02Epitaxial-layer growth
    • C30B23/08Epitaxial-layer growth by condensing ionised vapours
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • H01L21/02617Deposition types
    • H01L21/02631Physical deposition at reduced pressure, e.g. MBE, sputtering, evaporation

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Photovoltaic Devices (AREA)
  • Led Devices (AREA)
JP1443377A 1977-02-12 1977-02-12 Device for producing compound semiconductor film Granted JPS5399762A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP1443377A JPS5399762A (en) 1977-02-12 1977-02-12 Device for producing compound semiconductor film
US05/870,096 US4197814A (en) 1977-02-12 1978-01-17 Apparatus for forming compound semiconductor thin-films
DE2805247A DE2805247C2 (de) 1977-02-12 1978-02-08 Vorrichtung zur Herstellung von Verbindungshalbleiter-Dünnschichten

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1443377A JPS5399762A (en) 1977-02-12 1977-02-12 Device for producing compound semiconductor film

Publications (2)

Publication Number Publication Date
JPS5399762A JPS5399762A (en) 1978-08-31
JPS5641165B2 true JPS5641165B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1981-09-26

Family

ID=11860877

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1443377A Granted JPS5399762A (en) 1977-02-12 1977-02-12 Device for producing compound semiconductor film

Country Status (3)

Country Link
US (1) US4197814A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS5399762A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE2805247C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3810312A1 (de) * 1987-03-27 1988-10-06 Futaba Denshi Kogyo Kk Geraet zum erfassen von agglomerationsbildung

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5941510B2 (ja) * 1979-07-24 1984-10-08 双葉電子工業株式会社 酸化ベリリウム膜とその形成方法
DE2941908C2 (de) * 1979-10-17 1986-07-03 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren zum Herstellen einer eine Silizium-Schicht aufweisenden Solarzelle
US4406252A (en) * 1980-12-29 1983-09-27 Rockwell International Corporation Inductive heating arrangement for evaporating thin film alloy onto a substrate
JPS5943873A (ja) * 1982-09-04 1984-03-12 Konishiroku Photo Ind Co Ltd 蒸発材料収容器
JPH0817154B2 (ja) * 1983-11-07 1996-02-21 株式会社日立製作所 イオンビーム装置
US4560462A (en) * 1984-06-22 1985-12-24 Westinghouse Electric Corp. Apparatus for coating nuclear fuel pellets with a burnable absorber
JPS62260051A (ja) * 1986-05-02 1987-11-12 Hitachi Ltd 蒸気発生装置
KR900005118B1 (ko) * 1986-07-14 1990-07-19 미쓰비시전기주식회사 박막 형성장치
DE3628443C1 (de) * 1986-08-21 1988-02-11 Dornier System Gmbh Verfahren zur Erzeugung amorpher Schichten
JPH075435B2 (ja) * 1987-03-31 1995-01-25 住友電気工業株式会社 超電導薄膜の製造方法及び装置
US4902572A (en) * 1988-04-19 1990-02-20 The Boeing Company Film deposition system
US4951604A (en) * 1989-02-17 1990-08-28 Optical Coating Laboratory, Inc. System and method for vacuum deposition of thin films
JP3169151B2 (ja) * 1992-10-26 2001-05-21 三菱電機株式会社 薄膜形成装置
KR100192228B1 (ko) * 1995-08-04 1999-06-15 한갑수 주석 산화물 박막의 제조방법
KR0182373B1 (ko) * 1996-07-18 1999-04-01 박원훈 박막 증착 장치
US6830626B1 (en) * 1999-10-22 2004-12-14 Kurt J. Lesker Company Method and apparatus for coating a substrate in a vacuum
US20050147753A1 (en) * 1999-10-22 2005-07-07 Kurt J. Lesker Company Material deposition system and a method for coating a substrate or thermally processing a material in a vacuum
US6669824B2 (en) 2000-07-10 2003-12-30 Unaxis Usa, Inc. Dual-scan thin film processing system
US6495010B2 (en) 2000-07-10 2002-12-17 Unaxis Usa, Inc. Differentially-pumped material processing system
GB0127251D0 (en) * 2001-11-13 2002-01-02 Nordiko Ltd Apparatus
US7700166B2 (en) * 2005-06-06 2010-04-20 Createc Fischer & Co. Gmbh Process for evaporating high-melting materials
US20100159132A1 (en) * 2008-12-18 2010-06-24 Veeco Instruments, Inc. Linear Deposition Source
WO2011065999A1 (en) * 2008-12-18 2011-06-03 Veeco Instruments Inc. Linear deposition source
US20100282167A1 (en) * 2008-12-18 2010-11-11 Veeco Instruments Inc. Linear Deposition Source
KR101084234B1 (ko) * 2009-11-30 2011-11-16 삼성모바일디스플레이주식회사 증착원, 이를 구비하는 증착 장치 및 박막 형성 방법
US20120052189A1 (en) * 2010-08-30 2012-03-01 Litian Liu Vapor deposition system
JP5815967B2 (ja) * 2011-03-31 2015-11-17 東京エレクトロン株式会社 基板洗浄装置及び真空処理システム

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2845894A (en) * 1953-03-04 1958-08-05 Oran T Mcilvaine Metallurgy
DE1046437B (de) * 1953-10-15 1958-12-11 Physikalisch Tech Werkstaetten Verfahren zum Verdampfen chemischer Verbindungen
NL103088C (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1957-06-08
US3446936A (en) * 1966-01-03 1969-05-27 Sperry Rand Corp Evaporant source
US3583361A (en) * 1969-12-18 1971-06-08 Atomic Energy Commission Ion beam deposition system
US3751310A (en) * 1971-03-25 1973-08-07 Bell Telephone Labor Inc Germanium doped epitaxial films by the molecular beam method
BE792316A (fr) * 1971-12-07 1973-06-05 Philips Nv Procede permettant de realiser des miroirs pour lumiere froide
JPS50108184A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1974-02-04 1975-08-26
JPS5435920B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1974-06-10 1979-11-06
US4082636A (en) * 1975-01-13 1978-04-04 Sharp Kabushiki Kaisha Ion plating method
JPS52113379A (en) * 1976-03-19 1977-09-22 Hitachi Ltd Vacuum evaporation

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3810312A1 (de) * 1987-03-27 1988-10-06 Futaba Denshi Kogyo Kk Geraet zum erfassen von agglomerationsbildung
DE3810312C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1987-03-27 1993-07-01 Futaba Denshi Kogyo K.K., Mobara, Chiba, Jp

Also Published As

Publication number Publication date
DE2805247C2 (de) 1982-06-24
DE2805247A1 (de) 1978-08-17
JPS5399762A (en) 1978-08-31
US4197814A (en) 1980-04-15

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