JPS5638464A - Formation of nitride film - Google Patents
Formation of nitride filmInfo
- Publication number
- JPS5638464A JPS5638464A JP11340179A JP11340179A JPS5638464A JP S5638464 A JPS5638464 A JP S5638464A JP 11340179 A JP11340179 A JP 11340179A JP 11340179 A JP11340179 A JP 11340179A JP S5638464 A JPS5638464 A JP S5638464A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- nitride film
- laser beam
- semiconductor
- plasma
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C8/00—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
- C23C8/04—Treatment of selected surface areas, e.g. using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C8/00—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
- C23C8/06—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases
- C23C8/36—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases using ionised gases, e.g. ionitriding
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Formation Of Insulating Films (AREA)
- Solid-Phase Diffusion Into Metallic Material Surfaces (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
PURPOSE:To enable a nitriding process for forming a desired nitride film on a semiconductor surface by a method wherein a laser beam is irradiated on the surface of substrate such as semiconductor, etc. in N2 plasma to which a high frequency electromagnetic field is applied so that the surface reacts with N2 plasma. CONSTITUTION:The equipment consists of a laser oscillator 1, a lens 3, a plasma generation chamber 5, gas inlet 6, a high frequency electromagnetic field generator 9, vacuum discharge opening 7, etc. The substrate 4 such as semiconductor or metal is placed in the chamber 5 in nitrogen atmosphere, then a high frequency electromagnetic field is applied so that nitrogen plasma is generated. The laser beam is irradiated on the surface of the substrate 4 so that the substrate surface and N2 are reacted each other to form a normal semiconductor nitride film. Preheating of the substrate 4 by a heater 11 increases the thickness of nitride film when the same laser beam is used. The nitride film with a desired pattern can be formed by irradiating or scanning the laser beam on the substrate surface through a mask.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11340179A JPS593540B2 (en) | 1979-09-03 | 1979-09-03 | Nitride film formation method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11340179A JPS593540B2 (en) | 1979-09-03 | 1979-09-03 | Nitride film formation method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5638464A true JPS5638464A (en) | 1981-04-13 |
JPS593540B2 JPS593540B2 (en) | 1984-01-24 |
Family
ID=14611354
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11340179A Expired JPS593540B2 (en) | 1979-09-03 | 1979-09-03 | Nitride film formation method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS593540B2 (en) |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5850737A (en) * | 1981-09-21 | 1983-03-25 | Mitsubishi Electric Corp | Manufacture apparatus for semiconductor element |
JPS58199857A (en) * | 1982-05-04 | 1983-11-21 | マイクル・ポ−ル・ニアリ− | Chemical process |
JPS6050166A (en) * | 1983-08-26 | 1985-03-19 | Res Dev Corp Of Japan | Method and device for plasma vapor deposition |
JPS60216560A (en) * | 1984-04-12 | 1985-10-30 | Fuji Electric Corp Res & Dev Ltd | Formation of nitride film |
JPS61119676A (en) * | 1984-11-15 | 1986-06-06 | Ulvac Corp | Film forming device using sheet plasma and laser light |
JPS61131431A (en) * | 1984-11-29 | 1986-06-19 | Mitsubishi Electric Corp | Semiconductor manufacturing equipment |
JPS61196525A (en) * | 1985-02-26 | 1986-08-30 | Toshiba Corp | Semiconductor epitaxial growth apparatus |
US4820046A (en) * | 1986-12-01 | 1989-04-11 | Hitachi, Ltd. | Spectroscope apparatus and reaction apparatus using the same |
JPH02138477A (en) * | 1989-07-14 | 1990-05-28 | Hitachi Ltd | Method and device for film forming by microwave plasma |
WO2001040533A1 (en) * | 1999-12-01 | 2001-06-07 | L'air Liquide Societe Anonyme A Directoire Et Conseil De Surveillance Pour L'etude Et L'exploitation Des Procedes Georges Claude | Method and installation for selective surface treatment |
FR2801905A1 (en) * | 1999-12-03 | 2001-06-08 | Air Liquide | Selective surface treatment, especially of copper surfaces, used, e.g., in electronic circuit manufacture involves treating a pretreated, mask-covered surface with an excited or unstable gas species |
-
1979
- 1979-09-03 JP JP11340179A patent/JPS593540B2/en not_active Expired
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6322610B2 (en) * | 1981-09-21 | 1988-05-12 | Mitsubishi Electric Corp | |
JPS5850737A (en) * | 1981-09-21 | 1983-03-25 | Mitsubishi Electric Corp | Manufacture apparatus for semiconductor element |
JPS58199857A (en) * | 1982-05-04 | 1983-11-21 | マイクル・ポ−ル・ニアリ− | Chemical process |
JPS6050166A (en) * | 1983-08-26 | 1985-03-19 | Res Dev Corp Of Japan | Method and device for plasma vapor deposition |
JPS60216560A (en) * | 1984-04-12 | 1985-10-30 | Fuji Electric Corp Res & Dev Ltd | Formation of nitride film |
JPS61119676A (en) * | 1984-11-15 | 1986-06-06 | Ulvac Corp | Film forming device using sheet plasma and laser light |
JPS61131431A (en) * | 1984-11-29 | 1986-06-19 | Mitsubishi Electric Corp | Semiconductor manufacturing equipment |
JPS61196525A (en) * | 1985-02-26 | 1986-08-30 | Toshiba Corp | Semiconductor epitaxial growth apparatus |
US4820046A (en) * | 1986-12-01 | 1989-04-11 | Hitachi, Ltd. | Spectroscope apparatus and reaction apparatus using the same |
US4973159A (en) * | 1986-12-01 | 1990-11-27 | Hitachi, Ltd. | Spectroscope apparatus and reaction apparatus using the same |
JPH02138477A (en) * | 1989-07-14 | 1990-05-28 | Hitachi Ltd | Method and device for film forming by microwave plasma |
WO2001040533A1 (en) * | 1999-12-01 | 2001-06-07 | L'air Liquide Societe Anonyme A Directoire Et Conseil De Surveillance Pour L'etude Et L'exploitation Des Procedes Georges Claude | Method and installation for selective surface treatment |
FR2801905A1 (en) * | 1999-12-03 | 2001-06-08 | Air Liquide | Selective surface treatment, especially of copper surfaces, used, e.g., in electronic circuit manufacture involves treating a pretreated, mask-covered surface with an excited or unstable gas species |
Also Published As
Publication number | Publication date |
---|---|
JPS593540B2 (en) | 1984-01-24 |
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