JPS5614912A - Test device - Google Patents

Test device

Info

Publication number
JPS5614912A
JPS5614912A JP9125179A JP9125179A JPS5614912A JP S5614912 A JPS5614912 A JP S5614912A JP 9125179 A JP9125179 A JP 9125179A JP 9125179 A JP9125179 A JP 9125179A JP S5614912 A JPS5614912 A JP S5614912A
Authority
JP
Japan
Prior art keywords
test
control
encased
checked
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9125179A
Other languages
English (en)
Inventor
Yasushi Matsukawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP9125179A priority Critical patent/JPS5614912A/ja
Publication of JPS5614912A publication Critical patent/JPS5614912A/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP9125179A 1979-07-18 1979-07-18 Test device Pending JPS5614912A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9125179A JPS5614912A (en) 1979-07-18 1979-07-18 Test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9125179A JPS5614912A (en) 1979-07-18 1979-07-18 Test device

Publications (1)

Publication Number Publication Date
JPS5614912A true JPS5614912A (en) 1981-02-13

Family

ID=14021194

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9125179A Pending JPS5614912A (en) 1979-07-18 1979-07-18 Test device

Country Status (1)

Country Link
JP (1) JPS5614912A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58718A (ja) * 1981-06-25 1983-01-05 Sharp Corp マイクロコンピユ−タを応用した機器の検査方法
JPS5923676U (ja) * 1982-08-04 1984-02-14 株式会社アドバンテスト 自己診断機能を持つｉｃ試験装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5039071A (ja) * 1973-08-08 1975-04-10
JPS5414651A (en) * 1977-07-06 1979-02-03 Hitachi Ltd Testing device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5039071A (ja) * 1973-08-08 1975-04-10
JPS5414651A (en) * 1977-07-06 1979-02-03 Hitachi Ltd Testing device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58718A (ja) * 1981-06-25 1983-01-05 Sharp Corp マイクロコンピユ−タを応用した機器の検査方法
JPS5923676U (ja) * 1982-08-04 1984-02-14 株式会社アドバンテスト 自己診断機能を持つｉｃ試験装置
JPH0120700Y2 (ja) * 1982-08-04 1989-06-21

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