JPS5414651A - Testing device - Google Patents

Testing device

Info

Publication number
JPS5414651A
JPS5414651A JP7988577A JP7988577A JPS5414651A JP S5414651 A JPS5414651 A JP S5414651A JP 7988577 A JP7988577 A JP 7988577A JP 7988577 A JP7988577 A JP 7988577A JP S5414651 A JPS5414651 A JP S5414651A
Authority
JP
Japan
Prior art keywords
testing device
selfdiagnostic
forecast
diagnose
trouble
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7988577A
Other languages
Japanese (ja)
Other versions
JPS6014376B2 (en
Inventor
Mutsuyo Kanetani
Kinichi Nakahara
Hisayoshi Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP52079885A priority Critical patent/JPS6014376B2/en
Publication of JPS5414651A publication Critical patent/JPS5414651A/en
Publication of JPS6014376B2 publication Critical patent/JPS6014376B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)

Abstract

PURPOSE: To enable a device to diagnose by itself and to forecast its own trouble, by providing a check printed substrate to each function block and by storing selfdiagnostic programs in a computer.
COPYRIGHT: (C)1979,JPO&Japio
JP52079885A 1977-07-06 1977-07-06 test equipment Expired JPS6014376B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP52079885A JPS6014376B2 (en) 1977-07-06 1977-07-06 test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP52079885A JPS6014376B2 (en) 1977-07-06 1977-07-06 test equipment

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP59104574A Division JPS6022675A (en) 1984-05-25 1984-05-25 Testing method of integrated circuit device

Publications (2)

Publication Number Publication Date
JPS5414651A true JPS5414651A (en) 1979-02-03
JPS6014376B2 JPS6014376B2 (en) 1985-04-12

Family

ID=13702701

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52079885A Expired JPS6014376B2 (en) 1977-07-06 1977-07-06 test equipment

Country Status (1)

Country Link
JP (1) JPS6014376B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5614912A (en) * 1979-07-18 1981-02-13 Nec Corp Test device
JPS5858698U (en) * 1981-10-12 1983-04-20 横河電機株式会社 Measuring instrument with self-diagnosis function
JPS61169782A (en) * 1985-01-22 1986-07-31 Chino Works Ltd Digital instrument
JP2010511869A (en) * 2006-11-30 2010-04-15 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド Self-testing, monitoring and diagnostics on grouped circuit modules
JP2021156619A (en) * 2020-03-25 2021-10-07 株式会社エヌエスアイテクス Semiconductor device and test method of semiconductor device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5614912A (en) * 1979-07-18 1981-02-13 Nec Corp Test device
JPS5858698U (en) * 1981-10-12 1983-04-20 横河電機株式会社 Measuring instrument with self-diagnosis function
JPS61169782A (en) * 1985-01-22 1986-07-31 Chino Works Ltd Digital instrument
JP2010511869A (en) * 2006-11-30 2010-04-15 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド Self-testing, monitoring and diagnostics on grouped circuit modules
JP2021156619A (en) * 2020-03-25 2021-10-07 株式会社エヌエスアイテクス Semiconductor device and test method of semiconductor device

Also Published As

Publication number Publication date
JPS6014376B2 (en) 1985-04-12

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