JPS61169782A - Digital instrument - Google Patents

Digital instrument

Info

Publication number
JPS61169782A
JPS61169782A JP60009659A JP965985A JPS61169782A JP S61169782 A JPS61169782 A JP S61169782A JP 60009659 A JP60009659 A JP 60009659A JP 965985 A JP965985 A JP 965985A JP S61169782 A JPS61169782 A JP S61169782A
Authority
JP
Japan
Prior art keywords
instrument
display
defective
key
checking
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60009659A
Other languages
Japanese (ja)
Inventor
Hideki Negishi
秀樹 根岸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chino Corp
Original Assignee
Chino Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chino Works Ltd filed Critical Chino Works Ltd
Priority to JP60009659A priority Critical patent/JPS61169782A/en
Publication of JPS61169782A publication Critical patent/JPS61169782A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To enable the discovery of defective points, by mounting a checking specialized ROM on an instrument to check displays, operation switches and other parts. CONSTITUTION:When an error signal is generated during the operation of an instrument or prior to the start of the operation, a checking-specialized ROM40 is mounted on the instrument to determine which hardware parts of the instrument are defective. A processing means 1 checks the hardware at the part where it is interposed by flashing a lamp of a display 2 according to the contents of the checking-specialized ROM40 or by indicating a symbol of a corresponding key on a display 2 upon the pressing of a key on an operation switch 3. This enables the identification of defective parts depending on whether the lamp is lighted as expected or the corresponding display is performed when the key is pressed.

Description

【発明の詳細な説明】 [産業上の利用分野] この発明は、表示器、操作スイッチを有し、マイクロコ
ンピュータにより所定の動作を行うデジタル計器に関す
るものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a digital instrument that has a display and operation switches and that performs predetermined operations using a microcomputer.

〔従来の技術] 近年、マイクロコンピュータを用いた輿節計、記録針等
のデジタル計器が開発されている。そして、これら計器
はセルフチェック機能を有しており、これは所定のプロ
グラムで動作中、計器の主要機能が異常となったときエ
ラー信号を発生し、プロセスを安全側にもっていくもの
であった。
[Prior Art] In recent years, digital instruments such as time meters and recording hands using microcomputers have been developed. Additionally, these instruments have a self-check function, which generates an error signal when a major function of the instrument becomes abnormal while operating according to a predetermined program, bringing the process to a safe side. .

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかしながら、計器が、エラーとなった場合、計器のど
のハード箇所、部位が不良となったかは、測定器等を使
用しなければ分らず、煩雑であった。
However, when an error occurs in a meter, it is difficult to know which hardware part or part of the meter has become defective without using a measuring device or the like.

この発明の目的は、以上の点に鑑み、容易に不良箇所の
発見を可能としたデジタル計器を提供することである。
In view of the above points, it is an object of the present invention to provide a digital meter that makes it possible to easily find defective locations.

E問題点を解決するための手段] この発明は、表示器、操作スイッチを有し、マイクロコ
ンピュータにより所定の動作を行うデジタル計器におい
て、チェック専用ROMを計器に取り付け、表示器、操
作スイッチ、その他の部位のチェックを行うようにした
デジタル計器である。
Means for Solving Problem E] This invention provides a digital instrument that has a display, an operation switch, and performs predetermined operations using a microcomputer, and a check-only ROM is attached to the instrument, and the display, operation switch, etc. This is a digital instrument designed to check the parts of the body.

[実施例] 第1図は、この発明に係る調節計の一実施例を示す構成
説明図である。
[Embodiment] FIG. 1 is a configuration explanatory diagram showing an embodiment of a controller according to the present invention.

図において、1は、表示器2を参照し操作スイッチ3を
操作してRAM41に格納された設定デ−タROM4ヰ
に格納されたプログラム等に従って調節演算、その他の
処理を行う処理手段で、入力、出力が可能となっている
In the figure, reference numeral 1 denotes a processing means that performs adjustment calculations and other processing according to settings data stored in a RAM 41 and programs stored in a ROM 41 by operating an operation switch 3 with reference to a display 2; , output is possible.

ここで、計器が動作中にエラー信号を発生した場合、あ
るいは動作を開始させる前に、計器のどのハード部位が
不良かを判別するため、チェック専用ROM40を計器
に取り付ける。
Here, in order to determine which hardware part of the meter is defective when the meter generates an error signal during operation or before starting operation, a check-only ROM 40 is attached to the meter.

すると、第2図で示すように、処理手段1は、このチェ
ック専用ROM40の内容に従って、表示器2のランプ
を点滅させたり、操作スイッチ3のキーを押すと、対応
したキーの記号を表示器2に表示させたりし、マイクロ
コンピュータのような処理手段1が介在する部分のハー
ドのチェックを行う。つまり、点灯すべきランプが点灯
するかどうか、キーを押したとき対応する表示がされる
か等によって不良箇所が分ることになる。
Then, as shown in FIG. 2, the processing means 1 causes the lamp on the display 2 to blink according to the contents of the check-only ROM 40, or when a key on the operation switch 3 is pressed, the symbol of the corresponding key is displayed on the display. 2, and checks the hardware of the part where the processing means 1, such as a microcomputer, intervenes. In other words, the location of the defect can be determined by whether a lamp that should be lit is lit, whether a corresponding display appears when a key is pressed, etc.

〔発明の効果〕〔Effect of the invention〕

以上述べたように、この発明は、ハードチェック専用の
ROMを計器に取り付けてチェックを行っているので、
きわめて容易かつ迅速に不良箇所、異常箇所の発見が可
能となる。
As mentioned above, this invention performs checks by attaching a ROM dedicated to hard checks to instruments.
It becomes possible to discover defective parts and abnormal parts very easily and quickly.

【図面の簡単な説明】[Brief explanation of drawings]

第1図、第2図は、この発明の一実施例を示す説明図で
ある。 1・・・処理手段、2・・・表示器、 3・・・操作ス
イッチ、 41・RAM、  42・ROM、 40−
・・チェック専用ROM
FIGS. 1 and 2 are explanatory diagrams showing one embodiment of the present invention. DESCRIPTION OF SYMBOLS 1...Processing means, 2...Display device, 3...Operation switch, 41.RAM, 42.ROM, 40-
・Check-only ROM

Claims (1)

【特許請求の範囲】[Claims] 1、表示器、操作スイッチを有し、マイクロコンピュー
タにより所定の動作を行うデジタル計器において、チェ
ック専用ROMを計器に取り付け、表示器、操作スイッ
チその他の部位のチェックを行うようにしたことを特徴
とするデジタル計器。
1. In a digital instrument that has a display, operation switches, and performs predetermined operations using a microcomputer, a check-only ROM is attached to the instrument to check the display, operation switches, and other parts. digital instrument.
JP60009659A 1985-01-22 1985-01-22 Digital instrument Pending JPS61169782A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60009659A JPS61169782A (en) 1985-01-22 1985-01-22 Digital instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60009659A JPS61169782A (en) 1985-01-22 1985-01-22 Digital instrument

Publications (1)

Publication Number Publication Date
JPS61169782A true JPS61169782A (en) 1986-07-31

Family

ID=11726335

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60009659A Pending JPS61169782A (en) 1985-01-22 1985-01-22 Digital instrument

Country Status (1)

Country Link
JP (1) JPS61169782A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0399369U (en) * 1990-01-31 1991-10-17

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5414651A (en) * 1977-07-06 1979-02-03 Hitachi Ltd Testing device
JPS58718A (en) * 1981-06-25 1983-01-05 Sharp Corp Inspecting method of apparatus which has applied microcomputer

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5414651A (en) * 1977-07-06 1979-02-03 Hitachi Ltd Testing device
JPS58718A (en) * 1981-06-25 1983-01-05 Sharp Corp Inspecting method of apparatus which has applied microcomputer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0399369U (en) * 1990-01-31 1991-10-17

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