JPS56143949A - X-ray diffraction apparatus - Google Patents
X-ray diffraction apparatusInfo
- Publication number
- JPS56143949A JPS56143949A JP4619180A JP4619180A JPS56143949A JP S56143949 A JPS56143949 A JP S56143949A JP 4619180 A JP4619180 A JP 4619180A JP 4619180 A JP4619180 A JP 4619180A JP S56143949 A JPS56143949 A JP S56143949A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- ray
- detector
- rays
- diffracted
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
PURPOSE:To detect the entire X-ray of Debye rings through simple operation by the constitution consisting of fixing a spot focus X-ray source and a tours-shaped X-ray detector and moving a sample on a straight line. CONSTITUTION:An X-ray tube 2 having a spot focus X-ray source is installed in the end part of a base bed 1, and an X-ray detector 3 is fixed on the base bed 1; also, a sample stage 5 is fitted freely slidably to a guide rail 4 and a sample 6 is mounted on the stage 5. When the sample 6 is spaced from the X-ray source 2 and is approached to the detector 3 by moving the stage 5, the decrease in the intensity of the X-rays entering the sample 6 is offset by the increase in the intensity of the diffracted X-rays entering the detector 3 and if the X-ray diffraction efficiency of the sample is constant, the diffracted X-rays of roughly fixed intensity are detected irrespective of the change in the diffraction angle; therefore, the comparison of the intensities of the diffracted X-rays at the respective diffraction angles is easy and there is no need for laborious operations.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4619180A JPS56143949A (en) | 1980-04-10 | 1980-04-10 | X-ray diffraction apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4619180A JPS56143949A (en) | 1980-04-10 | 1980-04-10 | X-ray diffraction apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS56143949A true JPS56143949A (en) | 1981-11-10 |
| JPS6315546B2 JPS6315546B2 (en) | 1988-04-05 |
Family
ID=12740152
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4619180A Granted JPS56143949A (en) | 1980-04-10 | 1980-04-10 | X-ray diffraction apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56143949A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4950031A (en) * | 1987-07-04 | 1990-08-21 | Mazda Motor Corporation | Automobile rear underbody structure |
| WO2002025257A1 (en) * | 2000-09-22 | 2002-03-28 | Kawasaki Steel Corporation | Quantitative measuring method and apparatus of metal phase using x-ray diffraction method, and method for making plated steel sheet using them |
| JP2002098657A (en) * | 2000-09-22 | 2002-04-05 | Kawasaki Steel Corp | Measurement method and device of amount of adhesion of metal phase contained in plated layer |
| JP2002098656A (en) * | 2000-09-27 | 2002-04-05 | Kawasaki Steel Corp | On-line measurement method and device of amount of adhesion of metal phase contained in plated layer |
-
1980
- 1980-04-10 JP JP4619180A patent/JPS56143949A/en active Granted
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4950031A (en) * | 1987-07-04 | 1990-08-21 | Mazda Motor Corporation | Automobile rear underbody structure |
| WO2002025257A1 (en) * | 2000-09-22 | 2002-03-28 | Kawasaki Steel Corporation | Quantitative measuring method and apparatus of metal phase using x-ray diffraction method, and method for making plated steel sheet using them |
| JP2002098657A (en) * | 2000-09-22 | 2002-04-05 | Kawasaki Steel Corp | Measurement method and device of amount of adhesion of metal phase contained in plated layer |
| US6821361B2 (en) | 2000-09-22 | 2004-11-23 | Jfe Steel Corporation | Quantitative measuring method and apparatus of metal phase using x-ray diffraction method, and method for making plated steel sheet using them |
| JP2002098656A (en) * | 2000-09-27 | 2002-04-05 | Kawasaki Steel Corp | On-line measurement method and device of amount of adhesion of metal phase contained in plated layer |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6315546B2 (en) | 1988-04-05 |
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