JPS56140643A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS56140643A JPS56140643A JP4298580A JP4298580A JPS56140643A JP S56140643 A JPS56140643 A JP S56140643A JP 4298580 A JP4298580 A JP 4298580A JP 4298580 A JP4298580 A JP 4298580A JP S56140643 A JPS56140643 A JP S56140643A
- Authority
- JP
- Japan
- Prior art keywords
- film
- substrate
- si3n4
- mask
- manufacture
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/76202—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Element Separation (AREA)
- Local Oxidation Of Silicon (AREA)
Abstract
PURPOSE:To prevent the lateral spread of an oxide film by selectively forming an SiO2 film on an Si substrate and oxidizing the top and the side thereof with Si3N4 as a mask. CONSTITUTION:The Si3N4 mask 7' is provided so as to cover the top and the sides of the SiO2 film 6' which is selectively provided on the Si substrate 1, and selective oxidating treatment is performed. In this method, a sufficiently thick SiO2 film 8 can be formed under the state a peak end B2 is contacted with the film 6', stress in the vicinity of the substrate surface is small, the lateral spread of the film 8 can be made small, and the high density devices can be obtained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4298580A JPS56140643A (en) | 1980-04-01 | 1980-04-01 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4298580A JPS56140643A (en) | 1980-04-01 | 1980-04-01 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56140643A true JPS56140643A (en) | 1981-11-04 |
Family
ID=12651321
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4298580A Pending JPS56140643A (en) | 1980-04-01 | 1980-04-01 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56140643A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5057451A (en) * | 1990-04-12 | 1991-10-15 | Actel Corporation | Method of forming an antifuse element with substantially reduced capacitance using the locos technique |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51124381A (en) * | 1975-04-16 | 1976-10-29 | Ibm | Method of manufacturing semiconductor device using twoolayer mask |
-
1980
- 1980-04-01 JP JP4298580A patent/JPS56140643A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51124381A (en) * | 1975-04-16 | 1976-10-29 | Ibm | Method of manufacturing semiconductor device using twoolayer mask |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5057451A (en) * | 1990-04-12 | 1991-10-15 | Actel Corporation | Method of forming an antifuse element with substantially reduced capacitance using the locos technique |
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