JPS56157025A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS56157025A JPS56157025A JP6018280A JP6018280A JPS56157025A JP S56157025 A JPS56157025 A JP S56157025A JP 6018280 A JP6018280 A JP 6018280A JP 6018280 A JP6018280 A JP 6018280A JP S56157025 A JPS56157025 A JP S56157025A
- Authority
- JP
- Japan
- Prior art keywords
- film
- contact hole
- etching
- sectional shape
- angle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
- H01L21/76802—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics
- H01L21/76804—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics by forming tapered via holes
Abstract
PURPOSE:To form the angle-cut contact hole in a sectional shape by a method wherein an isotropic etching is performed on the substance film provided on a semiconductor substrate and then an anisotripic etching is performed. CONSTITUTION:A thermal oxide film 3 and a CVDPSG film 4 are successively formed on the Si substrate having a diffusion layer on the surface, and a contact hole is formed by firstly performing an isotropic etching and then performing an anisotropic etching using a photoresist film 5 as a mask. Through these procedures, the angle-cut contact hole in the sectional shape is formed and the breaking of wire on a wiring layer can be prevented. Further, said section can be made more smoothly by performing a heat treatment and a glass frow on the PSG film 4.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6018280A JPS56157025A (en) | 1980-05-07 | 1980-05-07 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6018280A JPS56157025A (en) | 1980-05-07 | 1980-05-07 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56157025A true JPS56157025A (en) | 1981-12-04 |
Family
ID=13134754
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6018280A Pending JPS56157025A (en) | 1980-05-07 | 1980-05-07 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56157025A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5923876A (en) * | 1982-07-28 | 1984-02-07 | Hitachi Ltd | Etching method |
JPS5972138A (en) * | 1982-10-19 | 1984-04-24 | Toshiba Corp | Manufacture of semiconductor device |
JPS59200420A (en) * | 1983-04-28 | 1984-11-13 | Oki Electric Ind Co Ltd | Manufacture of semiconductor device |
JPS6243133A (en) * | 1985-08-20 | 1987-02-25 | Mitsubishi Electric Corp | Manufacture of semiconductor device |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5487172A (en) * | 1977-12-23 | 1979-07-11 | Hitachi Ltd | Manufacture for simiconductor device |
JPS5687666A (en) * | 1979-12-20 | 1981-07-16 | Toshiba Corp | Plasma etching method |
JPS5690525A (en) * | 1979-11-28 | 1981-07-22 | Fujitsu Ltd | Manufacture of semiconductor device |
-
1980
- 1980-05-07 JP JP6018280A patent/JPS56157025A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5487172A (en) * | 1977-12-23 | 1979-07-11 | Hitachi Ltd | Manufacture for simiconductor device |
JPS5690525A (en) * | 1979-11-28 | 1981-07-22 | Fujitsu Ltd | Manufacture of semiconductor device |
JPS5687666A (en) * | 1979-12-20 | 1981-07-16 | Toshiba Corp | Plasma etching method |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5923876A (en) * | 1982-07-28 | 1984-02-07 | Hitachi Ltd | Etching method |
JPS6214636B2 (en) * | 1982-07-28 | 1987-04-03 | Hitachi Ltd | |
JPS5972138A (en) * | 1982-10-19 | 1984-04-24 | Toshiba Corp | Manufacture of semiconductor device |
JPS59200420A (en) * | 1983-04-28 | 1984-11-13 | Oki Electric Ind Co Ltd | Manufacture of semiconductor device |
JPS6243133A (en) * | 1985-08-20 | 1987-02-25 | Mitsubishi Electric Corp | Manufacture of semiconductor device |
JPH051977B2 (en) * | 1985-08-20 | 1993-01-11 | Mitsubishi Electric Corp |
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