JPS56130667A - Measuring circuit for reverse recovery time of diode or the like - Google Patents

Measuring circuit for reverse recovery time of diode or the like

Info

Publication number
JPS56130667A
JPS56130667A JP3399080A JP3399080A JPS56130667A JP S56130667 A JPS56130667 A JP S56130667A JP 3399080 A JP3399080 A JP 3399080A JP 3399080 A JP3399080 A JP 3399080A JP S56130667 A JPS56130667 A JP S56130667A
Authority
JP
Japan
Prior art keywords
dut
flowed
recovery time
reverse recovery
turn
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3399080A
Other languages
Japanese (ja)
Inventor
Akira Aida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP3399080A priority Critical patent/JPS56130667A/en
Publication of JPS56130667A publication Critical patent/JPS56130667A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To use general analogue switch elements to measure a short reverse recovery time with a high precision, by controlling switching times of two analogue switches individually. CONSTITUTION:Element DUT to be measured is connected through detecting resistance Rd so that its forward direction becomes opposite to that of current source IS2. When the driving signal is input to terminal T, the square signal of width t1 is generated by Schmitt circuit SCH1 and is inverted by inverter IN and is input to the gate of analogue switch AS1 to turn on AS1. Thus, forward current IF is flowed to DUT, and reverse current IR is flowed back through AS1 and IS1 and is not flowed to DUT. When AS1 is turned off, IF does not become 0 immediately due to the floating capacity though IR is flowed to DUT. AS2 is caused to turn on just before turning-off of AS1 by Schmitt circuit SCH2 to short-circuit the floating capacity at the turning-off time of AS1. As a result, a very high-precision reverse recovery time value is obtained.
JP3399080A 1980-03-19 1980-03-19 Measuring circuit for reverse recovery time of diode or the like Pending JPS56130667A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3399080A JPS56130667A (en) 1980-03-19 1980-03-19 Measuring circuit for reverse recovery time of diode or the like

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3399080A JPS56130667A (en) 1980-03-19 1980-03-19 Measuring circuit for reverse recovery time of diode or the like

Publications (1)

Publication Number Publication Date
JPS56130667A true JPS56130667A (en) 1981-10-13

Family

ID=12401912

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3399080A Pending JPS56130667A (en) 1980-03-19 1980-03-19 Measuring circuit for reverse recovery time of diode or the like

Country Status (1)

Country Link
JP (1) JPS56130667A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU176261U1 (en) * 2017-04-10 2018-01-15 ФЕДЕРАЛЬНОЕ ГОСУДАРСТВЕННОЕ БЮДЖЕТНОЕ ОБРАЗОВАТЕЛЬНОЕ УЧРЕЖДЕНИЕ ВЫСШЕГО ОБРАЗОВАНИЯ "Брянский государственный технический университет" Diode reverse recovery time measuring device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU176261U1 (en) * 2017-04-10 2018-01-15 ФЕДЕРАЛЬНОЕ ГОСУДАРСТВЕННОЕ БЮДЖЕТНОЕ ОБРАЗОВАТЕЛЬНОЕ УЧРЕЖДЕНИЕ ВЫСШЕГО ОБРАЗОВАНИЯ "Брянский государственный технический университет" Diode reverse recovery time measuring device

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