JPS56117106A - Inspecting device for pattern defect - Google Patents
Inspecting device for pattern defectInfo
- Publication number
- JPS56117106A JPS56117106A JP1918480A JP1918480A JPS56117106A JP S56117106 A JPS56117106 A JP S56117106A JP 1918480 A JP1918480 A JP 1918480A JP 1918480 A JP1918480 A JP 1918480A JP S56117106 A JPS56117106 A JP S56117106A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- inspected
- photodetector array
- fourier converting
- spectrum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95623—Inspecting patterns on the surface of objects using a spatial filtering method
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Abstract
PURPOSE:To simplify the titled device by detecting defects in a pattern by means of the photodetector array arranged on a reverse Fourier converting surface while shifting the regulative pattern horizontally. CONSTITUTION:Laser beam 2 from laser oscillator 1 is converted into horizontal beam 4 through collimeter 3 to irradiate regulative pattern 5. Pattern 5 to be inspected is arranged on the front focus surface and space filter 8 having a negative pattern with the Fourier converting spectrum strength of normal pattern is arranged on the back focus surface. Normal patterns out of the Fourier converting spectrum of the pattern to be inspected 5 are absorbed into space filter 8 and the spectrum of defective patterns is transmitted and detected by photodetector array 11 through reverse Fourier converting lens 10. After making the pattern 8 to be inspected shift at a right angle to the optical axis, the area and position of a defective image can be detected with photodetector array 11, making it possible to simplify the device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1918480A JPS56117106A (en) | 1980-02-20 | 1980-02-20 | Inspecting device for pattern defect |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1918480A JPS56117106A (en) | 1980-02-20 | 1980-02-20 | Inspecting device for pattern defect |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56117106A true JPS56117106A (en) | 1981-09-14 |
JPS6330561B2 JPS6330561B2 (en) | 1988-06-20 |
Family
ID=11992244
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1918480A Granted JPS56117106A (en) | 1980-02-20 | 1980-02-20 | Inspecting device for pattern defect |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56117106A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0286529A2 (en) * | 1987-04-08 | 1988-10-12 | Commissariat A L'energie Atomique | Arrangement for determining the contrast of a display screen with regard to the direction of observation |
JPH0431745A (en) * | 1990-05-28 | 1992-02-03 | Res Dev Corp Of Japan | Apparatus for simultaneous detecting amplitude image and phase image using heterodyne-detecting light receiving device |
JP2010204653A (en) * | 2009-03-04 | 2010-09-16 | Samsung Mobile Display Co Ltd | Apparatus and method of inspecting mask |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54105967A (en) * | 1978-02-08 | 1979-08-20 | Toshiba Corp | Defect test system for pattern featuring directivity |
-
1980
- 1980-02-20 JP JP1918480A patent/JPS56117106A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54105967A (en) * | 1978-02-08 | 1979-08-20 | Toshiba Corp | Defect test system for pattern featuring directivity |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0286529A2 (en) * | 1987-04-08 | 1988-10-12 | Commissariat A L'energie Atomique | Arrangement for determining the contrast of a display screen with regard to the direction of observation |
FR2613830A1 (en) * | 1987-04-08 | 1988-10-14 | Commissariat Energie Atomique | DEVICE FOR DETERMINING THE CONTRAST OF A DISPLAY SCREEN BASED ON THE OBSERVATION DIRECTION |
JPH0431745A (en) * | 1990-05-28 | 1992-02-03 | Res Dev Corp Of Japan | Apparatus for simultaneous detecting amplitude image and phase image using heterodyne-detecting light receiving device |
JP2010204653A (en) * | 2009-03-04 | 2010-09-16 | Samsung Mobile Display Co Ltd | Apparatus and method of inspecting mask |
Also Published As
Publication number | Publication date |
---|---|
JPS6330561B2 (en) | 1988-06-20 |
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