JPS56111226A - Formation of fine pattern - Google Patents
Formation of fine patternInfo
- Publication number
- JPS56111226A JPS56111226A JP1303280A JP1303280A JPS56111226A JP S56111226 A JPS56111226 A JP S56111226A JP 1303280 A JP1303280 A JP 1303280A JP 1303280 A JP1303280 A JP 1303280A JP S56111226 A JPS56111226 A JP S56111226A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- layer
- water
- resist
- soluble high
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/11—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers
Abstract
PURPOSE:To improve pattern-forming precision, by forming a layer of water-soluble high-molecular substance between a substrate and a resist layer and forming a pattern identically with the resist. CONSTITUTION:A layer of water-soluble high-molecular substance, polyvinyl alcohol for instance, and a resist layer 4 are stacked on an SiO2 film 2 on an Si substrate 1. After an application of electron beam irradiation and developing to form a pattern 40, an ooze 41 sticks to the bottom. Then the layer 3 is developed by water to form a pattern 30 with the resist 40 as a mask. The ooze 41 is attached to the side wall of the pattern 30. Then the SiO2 film 2 is etched to form a pattern 20 employing such a dry method as an ion etching. Lastly by removing the pattern 30 by water, the desired pattern is obtained. With the water-soluble high-molecular substance layer formed identically with the pattern on the resist, the ooze at the bottom of the resist falls to the side wall of the layer of water-soluble high-molecular substance, resulting in the formation of ultra-fine patterns.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1303280A JPS56111226A (en) | 1980-02-07 | 1980-02-07 | Formation of fine pattern |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1303280A JPS56111226A (en) | 1980-02-07 | 1980-02-07 | Formation of fine pattern |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56111226A true JPS56111226A (en) | 1981-09-02 |
JPS6156866B2 JPS6156866B2 (en) | 1986-12-04 |
Family
ID=11821780
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1303280A Granted JPS56111226A (en) | 1980-02-07 | 1980-02-07 | Formation of fine pattern |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56111226A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07191325A (en) * | 1993-12-27 | 1995-07-28 | Nec Corp | Formation of liquid crystal oriented film |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH077404U (en) * | 1993-06-29 | 1995-02-03 | 武 亀井 | Ants pet dishware plate |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4940874A (en) * | 1972-08-25 | 1974-04-17 | ||
JPS52122477A (en) * | 1976-04-07 | 1977-10-14 | Hitachi Ltd | Processing of thin film patterns |
JPS5389673A (en) * | 1977-01-19 | 1978-08-07 | Oki Electric Ind Co Ltd | Fine pattern forming method of semiconductor device |
JPS54146966A (en) * | 1978-05-10 | 1979-11-16 | Nec Corp | Pattern forming method |
-
1980
- 1980-02-07 JP JP1303280A patent/JPS56111226A/en active Granted
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4940874A (en) * | 1972-08-25 | 1974-04-17 | ||
JPS52122477A (en) * | 1976-04-07 | 1977-10-14 | Hitachi Ltd | Processing of thin film patterns |
JPS5389673A (en) * | 1977-01-19 | 1978-08-07 | Oki Electric Ind Co Ltd | Fine pattern forming method of semiconductor device |
JPS54146966A (en) * | 1978-05-10 | 1979-11-16 | Nec Corp | Pattern forming method |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07191325A (en) * | 1993-12-27 | 1995-07-28 | Nec Corp | Formation of liquid crystal oriented film |
Also Published As
Publication number | Publication date |
---|---|
JPS6156866B2 (en) | 1986-12-04 |
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