JPS5594147A - Method of discriminating surface flaw of high temperature material to be detected - Google Patents

Method of discriminating surface flaw of high temperature material to be detected

Info

Publication number
JPS5594147A
JPS5594147A JP248579A JP248579A JPS5594147A JP S5594147 A JPS5594147 A JP S5594147A JP 248579 A JP248579 A JP 248579A JP 248579 A JP248579 A JP 248579A JP S5594147 A JPS5594147 A JP S5594147A
Authority
JP
Japan
Prior art keywords
detected
picture elements
high temperature
scale
flaws
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP248579A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6250775B2 (cs
Inventor
Nobuo Kimura
Yasuhide Nakai
Yoshiro Nishimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP248579A priority Critical patent/JPS5594147A/ja
Priority to US06/110,616 priority patent/US4319270A/en
Priority to GB8000811A priority patent/GB2042716B/en
Priority to DE3000875A priority patent/DE3000875C2/de
Priority to SE8000240A priority patent/SE8000240L/
Priority to FR8000652A priority patent/FR2446476A1/fr
Priority to BR8000224A priority patent/BR8000224A/pt
Publication of JPS5594147A publication Critical patent/JPS5594147A/ja
Publication of JPS6250775B2 publication Critical patent/JPS6250775B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP248579A 1979-01-12 1979-01-12 Method of discriminating surface flaw of high temperature material to be detected Granted JPS5594147A (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP248579A JPS5594147A (en) 1979-01-12 1979-01-12 Method of discriminating surface flaw of high temperature material to be detected
US06/110,616 US4319270A (en) 1979-01-12 1980-01-09 Surface inspection system for hot radiant material
GB8000811A GB2042716B (en) 1979-01-12 1980-01-10 Surface inspection of hot radiant material
DE3000875A DE3000875C2 (de) 1979-01-12 1980-01-11 Verfahren zur Ermittlung von Fehlern auf der Oberfläche eines warmen Werkstücks und Vorrichtung zur Durchführung des Verfahrens
SE8000240A SE8000240L (sv) 1979-01-12 1980-01-11 Ytinspektionssystem for vermeutstralande material
FR8000652A FR2446476A1 (fr) 1979-01-12 1980-01-11 Procede pour detecter des imperfections sur la surface d'une matiere rayonnant de la chaleur et dispositif pour sa mise en oeuvre
BR8000224A BR8000224A (pt) 1979-01-12 1980-01-14 Processo para detectar imperfeicoes na supeficie de um material radiante quente, sistema de inspecao de superficie, dispositivo de controle de "follow-up"

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP248579A JPS5594147A (en) 1979-01-12 1979-01-12 Method of discriminating surface flaw of high temperature material to be detected

Publications (2)

Publication Number Publication Date
JPS5594147A true JPS5594147A (en) 1980-07-17
JPS6250775B2 JPS6250775B2 (cs) 1987-10-27

Family

ID=11530647

Family Applications (1)

Application Number Title Priority Date Filing Date
JP248579A Granted JPS5594147A (en) 1979-01-12 1979-01-12 Method of discriminating surface flaw of high temperature material to be detected

Country Status (1)

Country Link
JP (1) JPS5594147A (cs)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56118647A (en) * 1980-02-25 1981-09-17 Hitachi Ltd Flaw inspecting apparatus
WO1983000557A1 (en) * 1981-07-29 1983-02-17 Horiguchi, Satoru Method and device for inspecting printed matter
JPS59196446A (ja) * 1983-04-22 1984-11-07 Toshiba Corp 不良認識装置
JPS608769A (ja) * 1983-06-29 1985-01-17 Fujitsu Ltd 物体検出装置
JPH01199139A (ja) * 1982-05-27 1989-08-10 I 2 S 対象物の透明度のコントラストにより対象物を検査する方法に用いる回路

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50143590A (cs) * 1974-05-08 1975-11-19

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50143590A (cs) * 1974-05-08 1975-11-19

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56118647A (en) * 1980-02-25 1981-09-17 Hitachi Ltd Flaw inspecting apparatus
WO1983000557A1 (en) * 1981-07-29 1983-02-17 Horiguchi, Satoru Method and device for inspecting printed matter
US4561103A (en) * 1981-07-29 1985-12-24 Dai Nippon Insatsu Kabushiki Kaisha Print inspecting method and apparatus
JPH01199139A (ja) * 1982-05-27 1989-08-10 I 2 S 対象物の透明度のコントラストにより対象物を検査する方法に用いる回路
JPS59196446A (ja) * 1983-04-22 1984-11-07 Toshiba Corp 不良認識装置
JPS608769A (ja) * 1983-06-29 1985-01-17 Fujitsu Ltd 物体検出装置

Also Published As

Publication number Publication date
JPS6250775B2 (cs) 1987-10-27

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