JPS50143590A - - Google Patents
Info
- Publication number
- JPS50143590A JPS50143590A JP5023174A JP5023174A JPS50143590A JP S50143590 A JPS50143590 A JP S50143590A JP 5023174 A JP5023174 A JP 5023174A JP 5023174 A JP5023174 A JP 5023174A JP S50143590 A JPS50143590 A JP S50143590A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5023174A JPS50143590A (cs) | 1974-05-08 | 1974-05-08 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5023174A JPS50143590A (cs) | 1974-05-08 | 1974-05-08 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS50143590A true JPS50143590A (cs) | 1975-11-19 |
Family
ID=12853235
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5023174A Pending JPS50143590A (cs) | 1974-05-08 | 1974-05-08 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS50143590A (cs) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5594147A (en) * | 1979-01-12 | 1980-07-17 | Kobe Steel Ltd | Method of discriminating surface flaw of high temperature material to be detected |
JPS5694248A (en) * | 1979-12-28 | 1981-07-30 | Fujitsu Ltd | Detector for foreign matter on surface |
JPS5911638A (ja) * | 1982-07-12 | 1984-01-21 | Hitachi Ltd | パタ−ン欠陥検出装置 |
-
1974
- 1974-05-08 JP JP5023174A patent/JPS50143590A/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5594147A (en) * | 1979-01-12 | 1980-07-17 | Kobe Steel Ltd | Method of discriminating surface flaw of high temperature material to be detected |
JPS5694248A (en) * | 1979-12-28 | 1981-07-30 | Fujitsu Ltd | Detector for foreign matter on surface |
JPS5911638A (ja) * | 1982-07-12 | 1984-01-21 | Hitachi Ltd | パタ−ン欠陥検出装置 |