JPS5563874A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS5563874A JPS5563874A JP13703178A JP13703178A JPS5563874A JP S5563874 A JPS5563874 A JP S5563874A JP 13703178 A JP13703178 A JP 13703178A JP 13703178 A JP13703178 A JP 13703178A JP S5563874 A JPS5563874 A JP S5563874A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- junction
- layers
- insulating film
- buffer circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
- H01L27/0255—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using diodes as protective elements
Abstract
PURPOSE:To prevent the surge breakdown of an MOS-type large scale integrated circuit, by providing the output part of an MOS-type output buffer circuit with a junction of smaller depth than another junction of the buffer circuit. CONSTITUTION:An MOS transistor, which comprises N<+>-layers (source and drain) 22, 23 in a P substrate 21, a gate electrode 25 on a gate insulating film 24 and electrode wirings 26, 28 coupled to the N<+>-layers 22, 23 through contact holes of an insulating film 27, is provided as one member of an output buffer circuit. An N<+>- layer 29 produced by diffusion in a part off a field insulating film 30 and having a much smaller junction depth Xj than the N<+>-layers 22, 23 is coupled to an output line 32 through a wiring layer 31 located in contact with the N<+>-layer 29. One end of the line 32 is connected to the wiring 28 and the other end is connected to a bonding pad. As a result, a surge voltage will break down a junction consisting of a P- layer 21 and the N<+>-layer 29 and be conducted to the substrate 21. The MOS transistor is thus protected from surge breakdown.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13703178A JPS5563874A (en) | 1978-11-07 | 1978-11-07 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13703178A JPS5563874A (en) | 1978-11-07 | 1978-11-07 | Semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5563874A true JPS5563874A (en) | 1980-05-14 |
Family
ID=15189221
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13703178A Pending JPS5563874A (en) | 1978-11-07 | 1978-11-07 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5563874A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4868137A (en) * | 1987-12-29 | 1989-09-19 | Nec Corporation | Method of making insulated-gate field effect transistor |
-
1978
- 1978-11-07 JP JP13703178A patent/JPS5563874A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4868137A (en) * | 1987-12-29 | 1989-09-19 | Nec Corporation | Method of making insulated-gate field effect transistor |
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