JPS5536775A - Copy device of test pattern - Google Patents

Copy device of test pattern

Info

Publication number
JPS5536775A
JPS5536775A JP11013278A JP11013278A JPS5536775A JP S5536775 A JPS5536775 A JP S5536775A JP 11013278 A JP11013278 A JP 11013278A JP 11013278 A JP11013278 A JP 11013278A JP S5536775 A JPS5536775 A JP S5536775A
Authority
JP
Japan
Prior art keywords
patterns
time
tested
pattern memory
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11013278A
Other languages
Japanese (ja)
Other versions
JPS5947264B2 (en
Inventor
Junji Nishiura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp, Takeda Riken Industries Co Ltd filed Critical Advantest Corp
Priority to JP53110132A priority Critical patent/JPS5947264B2/en
Publication of JPS5536775A publication Critical patent/JPS5536775A/en
Publication of JPS5947264B2 publication Critical patent/JPS5947264B2/en
Expired legal-status Critical Current

Links

Abstract

PURPOSE: To shorten time for obtaining test patterns, time necessary for copy, by writing expected patterns in a pattern memory without erasing patterns applied at that time.
CONSTITUTION: When applied patterns are applied to a device to be tested 13 from a pattern memory 11, either of the two of patterns applied at that time and the output of the device to be tested is selected by output pin appointed data every each bit, test pattrns are gained at a stroke and the patterns are memorized to the pattern memory 11. Thus, all applied patterns are successively sent to the device to be tested 13 for excellent articles, and test patterns containing applied patterns and expected patterns are automatically obtained if said supply is completed.
COPYRIGHT: (C)1980,JPO&Japio
JP53110132A 1978-09-06 1978-09-06 Test pattern copying device Expired JPS5947264B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP53110132A JPS5947264B2 (en) 1978-09-06 1978-09-06 Test pattern copying device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53110132A JPS5947264B2 (en) 1978-09-06 1978-09-06 Test pattern copying device

Publications (2)

Publication Number Publication Date
JPS5536775A true JPS5536775A (en) 1980-03-14
JPS5947264B2 JPS5947264B2 (en) 1984-11-17

Family

ID=14527828

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53110132A Expired JPS5947264B2 (en) 1978-09-06 1978-09-06 Test pattern copying device

Country Status (1)

Country Link
JP (1) JPS5947264B2 (en)

Also Published As

Publication number Publication date
JPS5947264B2 (en) 1984-11-17

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