JPS53138649A - Test method for digital circuit - Google Patents

Test method for digital circuit

Info

Publication number
JPS53138649A
JPS53138649A JP5347477A JP5347477A JPS53138649A JP S53138649 A JPS53138649 A JP S53138649A JP 5347477 A JP5347477 A JP 5347477A JP 5347477 A JP5347477 A JP 5347477A JP S53138649 A JPS53138649 A JP S53138649A
Authority
JP
Japan
Prior art keywords
test method
digital circuit
malfunction
existence
variation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5347477A
Other languages
Japanese (ja)
Other versions
JPS5833578B2 (en
Inventor
Yoshimitsu Sakakawa
Hiroshi Watanabe
Takeshi Mizusawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP52053474A priority Critical patent/JPS5833578B2/en
Publication of JPS53138649A publication Critical patent/JPS53138649A/en
Publication of JPS5833578B2 publication Critical patent/JPS5833578B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: To realize a test method for existence of the malfunction through a simple circuit constitution, by generating the pattern data containing all cases of variation and then applying the data to the tested digital circuit.
COPYRIGHT: (C)1978,JPO&Japio
JP52053474A 1977-05-10 1977-05-10 Digital circuit testing methods Expired JPS5833578B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP52053474A JPS5833578B2 (en) 1977-05-10 1977-05-10 Digital circuit testing methods

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP52053474A JPS5833578B2 (en) 1977-05-10 1977-05-10 Digital circuit testing methods

Publications (2)

Publication Number Publication Date
JPS53138649A true JPS53138649A (en) 1978-12-04
JPS5833578B2 JPS5833578B2 (en) 1983-07-20

Family

ID=12943842

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52053474A Expired JPS5833578B2 (en) 1977-05-10 1977-05-10 Digital circuit testing methods

Country Status (1)

Country Link
JP (1) JPS5833578B2 (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4944641A (en) * 1972-06-12 1974-04-26
JPS50266A (en) * 1973-05-09 1975-01-06

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4944641A (en) * 1972-06-12 1974-04-26
JPS50266A (en) * 1973-05-09 1975-01-06

Also Published As

Publication number Publication date
JPS5833578B2 (en) 1983-07-20

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