JPS55149830A - Inspection apparatus for appearance of spherical body - Google Patents

Inspection apparatus for appearance of spherical body

Info

Publication number
JPS55149830A
JPS55149830A JP5699379A JP5699379A JPS55149830A JP S55149830 A JPS55149830 A JP S55149830A JP 5699379 A JP5699379 A JP 5699379A JP 5699379 A JP5699379 A JP 5699379A JP S55149830 A JPS55149830 A JP S55149830A
Authority
JP
Japan
Prior art keywords
steel ball
light
identified
processed
spherical body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5699379A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6210379B2 (enrdf_load_stackoverflow
Inventor
Junichi Ishiwatari
Seiichiro Kimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NSK Ltd
Original Assignee
NSK Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NSK Ltd filed Critical NSK Ltd
Priority to JP5699379A priority Critical patent/JPS55149830A/ja
Publication of JPS55149830A publication Critical patent/JPS55149830A/ja
Publication of JPS6210379B2 publication Critical patent/JPS6210379B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/951—Balls

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP5699379A 1979-05-11 1979-05-11 Inspection apparatus for appearance of spherical body Granted JPS55149830A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5699379A JPS55149830A (en) 1979-05-11 1979-05-11 Inspection apparatus for appearance of spherical body

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5699379A JPS55149830A (en) 1979-05-11 1979-05-11 Inspection apparatus for appearance of spherical body

Publications (2)

Publication Number Publication Date
JPS55149830A true JPS55149830A (en) 1980-11-21
JPS6210379B2 JPS6210379B2 (enrdf_load_stackoverflow) 1987-03-05

Family

ID=13043009

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5699379A Granted JPS55149830A (en) 1979-05-11 1979-05-11 Inspection apparatus for appearance of spherical body

Country Status (1)

Country Link
JP (1) JPS55149830A (enrdf_load_stackoverflow)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57124205A (en) * 1981-01-27 1982-08-03 Fuji Electric Co Ltd Inspection device for surface of cylindrical body
JPS57137857A (en) * 1981-02-20 1982-08-25 Satake Eng Co Ltd Cracked grain detecting device
JPH07209210A (ja) * 1993-12-06 1995-08-11 Elpatronic Ag 容器の透明領域を光学的に検査する方法と装置
NL9402092A (nl) * 1994-12-09 1996-07-01 Skf Ind Trading & Dev Werkwijze voor het optisch inspecteren van een oppervlak, alsmede inrichting daarvoor.
CN102221524A (zh) * 2010-04-15 2011-10-19 上海瑞银电子科技有限公司 光源座
WO2013020277A1 (zh) * 2011-08-10 2013-02-14 天津大学 基于多图像传感器的钢球表面展开方法及装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52112579A (en) * 1976-02-13 1977-09-21 Staalkat Bv Process and apparatus for automatic inspection of eggs on splits and cracks on egg shell

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52112579A (en) * 1976-02-13 1977-09-21 Staalkat Bv Process and apparatus for automatic inspection of eggs on splits and cracks on egg shell

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57124205A (en) * 1981-01-27 1982-08-03 Fuji Electric Co Ltd Inspection device for surface of cylindrical body
JPS57137857A (en) * 1981-02-20 1982-08-25 Satake Eng Co Ltd Cracked grain detecting device
JPH07209210A (ja) * 1993-12-06 1995-08-11 Elpatronic Ag 容器の透明領域を光学的に検査する方法と装置
US5661294A (en) * 1993-12-06 1997-08-26 Elpatronic Ag Process and apparatus for the optical inspection of a transparent region of a container, in particular the mouth region
NL9402092A (nl) * 1994-12-09 1996-07-01 Skf Ind Trading & Dev Werkwijze voor het optisch inspecteren van een oppervlak, alsmede inrichting daarvoor.
CN102221524A (zh) * 2010-04-15 2011-10-19 上海瑞银电子科技有限公司 光源座
WO2013020277A1 (zh) * 2011-08-10 2013-02-14 天津大学 基于多图像传感器的钢球表面展开方法及装置

Also Published As

Publication number Publication date
JPS6210379B2 (enrdf_load_stackoverflow) 1987-03-05

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