JPS5461980A - Automatic inspector of surface flaws - Google Patents

Automatic inspector of surface flaws

Info

Publication number
JPS5461980A
JPS5461980A JP12937977A JP12937977A JPS5461980A JP S5461980 A JPS5461980 A JP S5461980A JP 12937977 A JP12937977 A JP 12937977A JP 12937977 A JP12937977 A JP 12937977A JP S5461980 A JPS5461980 A JP S5461980A
Authority
JP
Japan
Prior art keywords
shift register
signal
quantizing means
quantized
stored
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12937977A
Other languages
Japanese (ja)
Inventor
Hiromichi Fukuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP12937977A priority Critical patent/JPS5461980A/en
Publication of JPS5461980A publication Critical patent/JPS5461980A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array

Abstract

PURPOSE:To enable scanning to be performed without roughing the read resolving power on inspection face by providing a register in which always latest two-dimensional images are stored by the signals having been quantized by a quantizing means. CONSTITUTION:The surface to be examined 10 is scanned thereover in the arrow B direction by using an image sensor 12, and the change in the quantity of reflected light from the inspection face is converted to an electric signal which is then detected as a video signal. This video signal is supplied via line 503 to a quantizing means 14, which then converts this to a binary signal after threshold at a certain threshold voltage. The signal having been quantized by the quantizing means 14 is supplied to the shift register of an image reduction processing means 15. This shift register is stored with always latest two dimensional images. In this shift register, the (i) bits in the row direction correspond to the times of scanning.
JP12937977A 1977-10-27 1977-10-27 Automatic inspector of surface flaws Pending JPS5461980A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12937977A JPS5461980A (en) 1977-10-27 1977-10-27 Automatic inspector of surface flaws

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12937977A JPS5461980A (en) 1977-10-27 1977-10-27 Automatic inspector of surface flaws

Publications (1)

Publication Number Publication Date
JPS5461980A true JPS5461980A (en) 1979-05-18

Family

ID=15008116

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12937977A Pending JPS5461980A (en) 1977-10-27 1977-10-27 Automatic inspector of surface flaws

Country Status (1)

Country Link
JP (1) JPS5461980A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5713341A (en) * 1980-06-27 1982-01-23 Kirin Brewery Co Ltd Defect detector
JPS6252454A (en) * 1985-08-30 1987-03-07 Daido Steel Co Ltd Method and apparatus for judging flaw in fluorescent magnetic powder flaw detection
JPS62110148A (en) * 1985-10-14 1987-05-21 Mitsubishi Heavy Ind Ltd Method for determining flaw in magnetic particle test

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5713341A (en) * 1980-06-27 1982-01-23 Kirin Brewery Co Ltd Defect detector
JPS6249927B2 (en) * 1980-06-27 1987-10-22 Kirin Brewery
JPS6252454A (en) * 1985-08-30 1987-03-07 Daido Steel Co Ltd Method and apparatus for judging flaw in fluorescent magnetic powder flaw detection
JPS62110148A (en) * 1985-10-14 1987-05-21 Mitsubishi Heavy Ind Ltd Method for determining flaw in magnetic particle test

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