JPS55119071A - Characteristics measurement of semiconductor device - Google Patents

Characteristics measurement of semiconductor device

Info

Publication number
JPS55119071A
JPS55119071A JP2666779A JP2666779A JPS55119071A JP S55119071 A JPS55119071 A JP S55119071A JP 2666779 A JP2666779 A JP 2666779A JP 2666779 A JP2666779 A JP 2666779A JP S55119071 A JPS55119071 A JP S55119071A
Authority
JP
Japan
Prior art keywords
lead frame
lead
measuring
socket
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2666779A
Other languages
Japanese (ja)
Inventor
Hiroyuki Nakajima
Mutsuyo Kanetani
Kazuhiko Kimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP2666779A priority Critical patent/JPS55119071A/en
Publication of JPS55119071A publication Critical patent/JPS55119071A/en
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To shorten the characteristics measurement process by measuring characteristics of a semiconductor device under the condition in which a part of plural devices being fabricated employing one piece of lead frame is connected to the lead frame.
CONSTITUTION: A semiconductor device 11 is fabricated in the sequential processes of mounting circuit elements, wire bonding and resin molding employing a lead frame 1, followed by the separate cutting of all leads 6 except the tab lead 5 and the dam. The abore-mentioned lead frame 1 is placed on a measuring socket 13 to perform a charcteristics measurement of the semiconductor devices 11 simultaneously. As measuring terminals 14 are projected on the top of the socket 13 corresponding to each lead 6 of the semiconductor devices 11 connected to the lead frame 3, positioning the lead frame 1 on the socket 13 allows each lead 6 to conact the respective measuring terminal 14 for measurement. With such an arrangement, it is possible to measure the characteristics measurement of plural semiconductor devices at a time thereby shortening the characteristics measurement process.
COPYRIGHT: (C)1980,JPO&Japio
JP2666779A 1979-03-09 1979-03-09 Characteristics measurement of semiconductor device Pending JPS55119071A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2666779A JPS55119071A (en) 1979-03-09 1979-03-09 Characteristics measurement of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2666779A JPS55119071A (en) 1979-03-09 1979-03-09 Characteristics measurement of semiconductor device

Publications (1)

Publication Number Publication Date
JPS55119071A true JPS55119071A (en) 1980-09-12

Family

ID=12199747

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2666779A Pending JPS55119071A (en) 1979-03-09 1979-03-09 Characteristics measurement of semiconductor device

Country Status (1)

Country Link
JP (1) JPS55119071A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0534403A (en) * 1991-08-01 1993-02-09 Rohm Co Ltd Method of measuring property of semiconductor device
JPH06281698A (en) * 1993-11-26 1994-10-07 Toshiba Corp Ic automatic handling method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0534403A (en) * 1991-08-01 1993-02-09 Rohm Co Ltd Method of measuring property of semiconductor device
JPH06281698A (en) * 1993-11-26 1994-10-07 Toshiba Corp Ic automatic handling method

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