JPS5244178A - Semiconductor integrated circuit device - Google Patents

Semiconductor integrated circuit device

Info

Publication number
JPS5244178A
JPS5244178A JP50119749A JP11974975A JPS5244178A JP S5244178 A JPS5244178 A JP S5244178A JP 50119749 A JP50119749 A JP 50119749A JP 11974975 A JP11974975 A JP 11974975A JP S5244178 A JPS5244178 A JP S5244178A
Authority
JP
Japan
Prior art keywords
integrated circuit
semiconductor integrated
circuit device
build
affect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50119749A
Other languages
Japanese (ja)
Other versions
JPS592180B2 (en
Inventor
Yoshio Sakamoto
Kunio Seki
Ryozo Konya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP50119749A priority Critical patent/JPS592180B2/en
Publication of JPS5244178A publication Critical patent/JPS5244178A/en
Publication of JPS592180B2 publication Critical patent/JPS592180B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE: To build an element that does not affect the respective circuit operation of an IC in a position where measurement can be possible from external terminals, thereby easily classifying ICs of same outside dimension and of varying types.
COPYRIGHT: (C)1977,JPO&Japio
JP50119749A 1975-10-06 1975-10-06 hand dryer Expired JPS592180B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50119749A JPS592180B2 (en) 1975-10-06 1975-10-06 hand dryer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50119749A JPS592180B2 (en) 1975-10-06 1975-10-06 hand dryer

Publications (2)

Publication Number Publication Date
JPS5244178A true JPS5244178A (en) 1977-04-06
JPS592180B2 JPS592180B2 (en) 1984-01-17

Family

ID=14769185

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50119749A Expired JPS592180B2 (en) 1975-10-06 1975-10-06 hand dryer

Country Status (1)

Country Link
JP (1) JPS592180B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5622973A (en) * 1979-08-01 1981-03-04 Hitachi Ltd Discriminating device
JPS56157874A (en) * 1980-05-09 1981-12-05 Toshiba Corp Measuring method of characteristics of semiconductor device
JPS63122242A (en) * 1986-11-12 1988-05-26 Nec Corp Method for constituting master slice integrated circuit
JPH08274176A (en) * 1995-03-30 1996-10-18 Nec Corp Semiconductor device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5622973A (en) * 1979-08-01 1981-03-04 Hitachi Ltd Discriminating device
JPH039426B2 (en) * 1979-08-01 1991-02-08 Hitachi Ltd
JPS56157874A (en) * 1980-05-09 1981-12-05 Toshiba Corp Measuring method of characteristics of semiconductor device
JPS63122242A (en) * 1986-11-12 1988-05-26 Nec Corp Method for constituting master slice integrated circuit
JPH08274176A (en) * 1995-03-30 1996-10-18 Nec Corp Semiconductor device

Also Published As

Publication number Publication date
JPS592180B2 (en) 1984-01-17

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