JPS5496359A - Heat treatment method for semiconductor device - Google Patents

Heat treatment method for semiconductor device

Info

Publication number
JPS5496359A
JPS5496359A JP15985177A JP15985177A JPS5496359A JP S5496359 A JPS5496359 A JP S5496359A JP 15985177 A JP15985177 A JP 15985177A JP 15985177 A JP15985177 A JP 15985177A JP S5496359 A JPS5496359 A JP S5496359A
Authority
JP
Japan
Prior art keywords
tube
heat treatment
cover
gas
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15985177A
Other languages
Japanese (ja)
Other versions
JPS5746647B2 (en
Inventor
Katsuhiko Yoshida
Naoki Hachiman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Home Electronics Ltd
NEC Corp
Original Assignee
NEC Home Electronics Ltd
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Home Electronics Ltd, Nippon Electric Co Ltd filed Critical NEC Home Electronics Ltd
Priority to JP15985177A priority Critical patent/JPS5496359A/en
Publication of JPS5496359A publication Critical patent/JPS5496359A/en
Publication of JPS5746647B2 publication Critical patent/JPS5746647B2/ja
Granted legal-status Critical Current

Links

Abstract

PURPOSE: To enhance the heat treatment quality for the semiconductor wafer by using the auxiliary tube featuring an outer dameter smaller than the inner diameter of the furnace core tube in the heat treatment by the open tube method.
CONSTITUTION: Auxiliary tube 7 which is composed of the heat-resistant material and then inserted into furnace core tube 1 contains branch tube 72 and 73 which are switched via switching valve 7 and then linked to gas path tube 71 piercing through cover 3 of tube 1. Semiconductor wafers 5 held by boat 4 are distributed to tube 7, and the inactive gas is jetted in from tube 72 in the case of the diffusion process for the impurity when wafer 5 is put in and taken out of tube 1. And in the case of the heat treatment, tube 7 advances up to the virtual line position, cover 3 is mounted to exit 12 of tube 1, and the gas to create the treatment atmosphere is introduced through gas inlet 11 and then exhausted through tube 73. Thus, the oxidation due to the external atmosphere can be avoided when the wafer is put in and taken out, the slow cooling effect being expected. Furthermore, the external atmosphere is prevented from intruding through the gap between tube 7 and cover 3 under processing, thus realizing the uniformity and the quality of the heat treatment.
COPYRIGHT: (C)1979,JPO&Japio
JP15985177A 1977-12-28 1977-12-28 Heat treatment method for semiconductor device Granted JPS5496359A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15985177A JPS5496359A (en) 1977-12-28 1977-12-28 Heat treatment method for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15985177A JPS5496359A (en) 1977-12-28 1977-12-28 Heat treatment method for semiconductor device

Publications (2)

Publication Number Publication Date
JPS5496359A true JPS5496359A (en) 1979-07-30
JPS5746647B2 JPS5746647B2 (en) 1982-10-05

Family

ID=15702611

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15985177A Granted JPS5496359A (en) 1977-12-28 1977-12-28 Heat treatment method for semiconductor device

Country Status (1)

Country Link
JP (1) JPS5496359A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5632721A (en) * 1979-08-27 1981-04-02 Nec Corp Heat treating device
JPS607122A (en) * 1983-06-01 1985-01-14 アムテック・システムズ・インコーポレーテッド Method and device for treating plural semiconductor wafers in furnace
JPS61161711A (en) * 1985-01-11 1986-07-22 Denkoo:Kk Thermal treatment method of semiconductor and thermal treatment equipment
JPS62128524A (en) * 1985-11-29 1987-06-10 Deisuko Saiyaa Japan:Kk Vertical type semiconductor thermal treatment equipment with reaction tube having multiple structure
JPH01315131A (en) * 1988-03-09 1989-12-20 Tel Sagami Ltd Heat treatment and apparatus therefor
CN103038865A (en) * 2010-06-04 2013-04-10 信越化学工业株式会社 Heat-treatment furnace

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5632721A (en) * 1979-08-27 1981-04-02 Nec Corp Heat treating device
JPS607122A (en) * 1983-06-01 1985-01-14 アムテック・システムズ・インコーポレーテッド Method and device for treating plural semiconductor wafers in furnace
JPH0262942B2 (en) * 1983-06-01 1990-12-27 Amutetsuku Shisutemuzu Inc
JPS61161711A (en) * 1985-01-11 1986-07-22 Denkoo:Kk Thermal treatment method of semiconductor and thermal treatment equipment
JPS62128524A (en) * 1985-11-29 1987-06-10 Deisuko Saiyaa Japan:Kk Vertical type semiconductor thermal treatment equipment with reaction tube having multiple structure
JPH01315131A (en) * 1988-03-09 1989-12-20 Tel Sagami Ltd Heat treatment and apparatus therefor
CN103038865A (en) * 2010-06-04 2013-04-10 信越化学工业株式会社 Heat-treatment furnace

Also Published As

Publication number Publication date
JPS5746647B2 (en) 1982-10-05

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