JPS5344180A - Semiconductor inspecting method - Google Patents

Semiconductor inspecting method

Info

Publication number
JPS5344180A
JPS5344180A JP11912376A JP11912376A JPS5344180A JP S5344180 A JPS5344180 A JP S5344180A JP 11912376 A JP11912376 A JP 11912376A JP 11912376 A JP11912376 A JP 11912376A JP S5344180 A JPS5344180 A JP S5344180A
Authority
JP
Japan
Prior art keywords
inspecting method
semiconductor inspecting
inspection
semiconductor
defectives
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11912376A
Other languages
Japanese (ja)
Inventor
Kazuharu Saito
Yoshiaki Shiraishi
Nobuhiko Ito
Fumio Nakazawa
Katsuhiko Kita
Mitsutaka Nishikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Suwa Seikosha KK
Original Assignee
Seiko Epson Corp
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Suwa Seikosha KK filed Critical Seiko Epson Corp
Priority to JP11912376A priority Critical patent/JPS5344180A/en
Publication of JPS5344180A publication Critical patent/JPS5344180A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: The production of defectives and the decrease in yield owing to defects of electric characteristic inspection are prevented by beforehand applying a voltage of the extent of breaking the oxide film of Al electrodes prior to inspection.
COPYRIGHT: (C)1978,JPO&Japio
JP11912376A 1976-10-04 1976-10-04 Semiconductor inspecting method Pending JPS5344180A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11912376A JPS5344180A (en) 1976-10-04 1976-10-04 Semiconductor inspecting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11912376A JPS5344180A (en) 1976-10-04 1976-10-04 Semiconductor inspecting method

Publications (1)

Publication Number Publication Date
JPS5344180A true JPS5344180A (en) 1978-04-20

Family

ID=14753498

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11912376A Pending JPS5344180A (en) 1976-10-04 1976-10-04 Semiconductor inspecting method

Country Status (1)

Country Link
JP (1) JPS5344180A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6268851A (en) * 1985-09-20 1987-03-28 Asahi Chem Ind Co Ltd Impact-resistant polyamide composition

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6268851A (en) * 1985-09-20 1987-03-28 Asahi Chem Ind Co Ltd Impact-resistant polyamide composition

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