JPS5279893A - Semiconductor device and method of assembling same - Google Patents
Semiconductor device and method of assembling sameInfo
- Publication number
- JPS5279893A JPS5279893A JP51150983A JP15098376A JPS5279893A JP S5279893 A JPS5279893 A JP S5279893A JP 51150983 A JP51150983 A JP 51150983A JP 15098376 A JP15098376 A JP 15098376A JP S5279893 A JPS5279893 A JP S5279893A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- assembling same
- assembling
- same
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier or surface barrier
- H01L31/103—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier or surface barrier the potential barrier being of the PN homojunction type
- H01L31/1032—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier or surface barrier the potential barrier being of the PN homojunction type the devices comprising active layers formed only by AIIBVI compounds, e.g. HgCdTe IR photodiodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/34—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies not provided for in groups H01L21/0405, H01L21/0445, H01L21/06, H01L21/16 and H01L21/18 with or without impurities, e.g. doping materials
- H01L21/38—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions
- H01L21/383—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions using diffusion into or out of a solid from or into a gaseous phase
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/0296—Inorganic materials including, apart from doping material or other impurities, only AIIBVI compounds, e.g. CdS, ZnS, HgCdTe
- H01L31/02966—Inorganic materials including, apart from doping material or other impurities, only AIIBVI compounds, e.g. CdS, ZnS, HgCdTe including ternary compounds, e.g. HgCdTe
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7539500A FR2336804A1 (fr) | 1975-12-23 | 1975-12-23 | Perfectionnements apportes aux dispositifs semi-conducteurs, notamment aux detecteurs photovoltaiques comprenant un substrat a base d'un alliage cdxhg1-xte, et procede de fabrication d'un tel dispositif perfectionne |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5279893A true JPS5279893A (en) | 1977-07-05 |
JPS5433116B2 JPS5433116B2 (ja) | 1979-10-18 |
Family
ID=9164076
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP51150983A Granted JPS5279893A (en) | 1975-12-23 | 1976-12-17 | Semiconductor device and method of assembling same |
Country Status (6)
Country | Link |
---|---|
US (1) | US4132999A (ja) |
JP (1) | JPS5279893A (ja) |
DE (2) | DE2660229C2 (ja) |
FR (1) | FR2336804A1 (ja) |
GB (1) | GB1566886A (ja) |
NL (1) | NL163905C (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01245567A (ja) * | 1988-03-28 | 1989-09-29 | Toshiba Corp | 半導体受光装置及びその製造方法 |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4206003A (en) * | 1977-07-05 | 1980-06-03 | Honeywell Inc. | Method of forming a mercury cadmium telluride photodiode |
US4286278A (en) * | 1977-09-01 | 1981-08-25 | Honeywell Inc. | Hybrid mosaic IR/CCD focal plane |
IT1088411B (it) * | 1977-12-06 | 1985-06-10 | Cise Spa | Procedimento per la relaizzazione di rivelatori multispettrali per infrarosso |
JPS575325A (en) * | 1980-06-12 | 1982-01-12 | Junichi Nishizawa | Semicondoctor p-n junction device and manufacture thereof |
FR2488048A1 (fr) * | 1980-07-30 | 1982-02-05 | Telecommunications Sa | Detecteur photovoltaique sensible dans l'infrarouge proche |
DE3033457C2 (de) * | 1980-09-05 | 1986-05-15 | N.V. Philips' Gloeilampenfabrieken, Eindhoven | Verfahren zur Herstellung einer einen PN-Übergang aufweisenden Infrarot-Detektoranordnung |
FR2492171A1 (fr) * | 1980-10-10 | 1982-04-16 | Philips Nv | Procede pour fabriquer un dispositif detecteur de rayons infrarouges |
FR2501915A1 (fr) * | 1981-03-10 | 1982-09-17 | Telecommunications Sa | Photodetecteur sensible dans l'infra-rouge proche |
DE3278553D1 (en) * | 1981-06-24 | 1988-06-30 | Secr Defence Brit | Photo diodes |
EP0090669A3 (en) * | 1982-03-31 | 1990-12-19 | Honeywell Inc. | Electromagnetic radiation detector |
US4914495A (en) * | 1985-12-05 | 1990-04-03 | Santa Barbara Research Center | Photodetector with player covered by N layer |
US5079610A (en) * | 1985-12-05 | 1992-01-07 | Santa Barbara Research Center | Structure and method of fabricating a trapping-mode |
US5004698A (en) * | 1985-12-05 | 1991-04-02 | Santa Barbara Research Center | Method of making photodetector with P layer covered by N layer |
US5182217A (en) * | 1985-12-05 | 1993-01-26 | Santa Barbara Research Center | Method of fabricating a trapping-mode |
US4736104A (en) * | 1986-02-07 | 1988-04-05 | Texas Instruments Incorporated | Selenidization passivation |
US4726885A (en) * | 1986-02-07 | 1988-02-23 | Texas Instruments Incorporated | Selenidization passivation |
US4731640A (en) * | 1986-05-20 | 1988-03-15 | Westinghouse Electric Corp. | High resistance photoconductor structure for multi-element infrared detector arrays |
DE3743288A1 (de) | 1986-12-30 | 2015-06-18 | Société Anonyme de Télécommunications | Bispektrale Empfangsvorrichtung für elektromagnetische Strahlung |
US4885619A (en) * | 1987-08-24 | 1989-12-05 | Santa Barbara Research Center | HgCdTe MIS device having a CdTe heterojunction |
US5936268A (en) * | 1988-03-29 | 1999-08-10 | Raytheon Company | Epitaxial passivation of group II-VI infrared photodetectors |
US4956304A (en) * | 1988-04-07 | 1990-09-11 | Santa Barbara Research Center | Buried junction infrared photodetector process |
US5880510A (en) * | 1988-05-11 | 1999-03-09 | Raytheon Company | Graded layer passivation of group II-VI infrared photodetectors |
US4961098A (en) * | 1989-07-03 | 1990-10-02 | Santa Barbara Research Center | Heterojunction photodiode array |
US5049962A (en) * | 1990-03-07 | 1991-09-17 | Santa Barbara Research Center | Control of optical crosstalk between adjacent photodetecting regions |
US5192695A (en) * | 1991-07-09 | 1993-03-09 | Fermionics Corporation | Method of making an infrared detector |
EP0635892B1 (en) * | 1992-07-21 | 2002-06-26 | Raytheon Company | Bake-stable HgCdTe photodetector and method for fabricating same |
US5296384A (en) * | 1992-07-21 | 1994-03-22 | Santa Barbara Research Center | Bake-stable HgCdTe photodetector and method for fabricating same |
US5279974A (en) * | 1992-07-24 | 1994-01-18 | Santa Barbara Research Center | Planar PV HgCdTe DLHJ fabricated by selective cap layer growth |
JP5135651B2 (ja) * | 2001-05-15 | 2013-02-06 | 株式会社アクロラド | 半導体放射線検出素子 |
FR2865102B1 (fr) | 2004-01-19 | 2006-04-07 | Michel Evin | Machine de travail du sol, du type dechaumeuse |
US20110146788A1 (en) * | 2009-12-23 | 2011-06-23 | General Electric Company | Photovoltaic cell |
CN104616974B (zh) * | 2015-01-21 | 2017-06-27 | 中国科学院上海技术物理研究所 | 一种用于高能离子注入的复合掩膜的去除方法 |
CN104576335A (zh) * | 2015-01-21 | 2015-04-29 | 中国科学院上海技术物理研究所 | 一种用于高能离子注入的复合掩膜 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS499186A (ja) * | 1972-05-11 | 1974-01-26 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3496024A (en) * | 1961-10-09 | 1970-02-17 | Monsanto Co | Photovoltaic cell with a graded energy gap |
DE1261486B (de) * | 1964-07-31 | 1968-02-22 | Ibm Deutschland | Verfahren zum n-Dotieren definierter Bereiche von Halbleiterkoerpern |
FR2168934B1 (ja) * | 1972-01-27 | 1977-04-01 | Telecommunications Sa | |
US3949223A (en) * | 1973-11-01 | 1976-04-06 | Honeywell Inc. | Monolithic photoconductive detector array |
FR2281650A1 (fr) * | 1974-08-06 | 1976-03-05 | Telecommunications Sa | Procede de fabrication d'une photodiode sensible aux rayonnements infrarouges et photodiode obtenue par ce procede |
-
1975
- 1975-12-23 FR FR7539500A patent/FR2336804A1/fr active Granted
-
1976
- 1976-12-01 DE DE2660229A patent/DE2660229C2/de not_active Expired
- 1976-12-01 DE DE2654429A patent/DE2654429C2/de not_active Expired
- 1976-12-01 US US05/746,489 patent/US4132999A/en not_active Expired - Lifetime
- 1976-12-10 GB GB51747/76A patent/GB1566886A/en not_active Expired
- 1976-12-17 JP JP51150983A patent/JPS5279893A/ja active Granted
- 1976-12-22 NL NL7614249.A patent/NL163905C/xx not_active IP Right Cessation
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS499186A (ja) * | 1972-05-11 | 1974-01-26 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01245567A (ja) * | 1988-03-28 | 1989-09-29 | Toshiba Corp | 半導体受光装置及びその製造方法 |
Also Published As
Publication number | Publication date |
---|---|
NL163905B (nl) | 1980-05-16 |
NL7614249A (nl) | 1977-06-27 |
DE2654429C2 (de) | 1984-07-19 |
JPS5433116B2 (ja) | 1979-10-18 |
DE2660229C2 (de) | 1986-07-24 |
NL163905C (nl) | 1980-10-15 |
US4132999A (en) | 1979-01-02 |
FR2336804A1 (fr) | 1977-07-22 |
DE2654429A1 (de) | 1977-07-14 |
GB1566886A (en) | 1980-05-08 |
FR2336804B1 (ja) | 1978-06-30 |
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