JPS5015446A - - Google Patents

Info

Publication number
JPS5015446A
JPS5015446A JP49045621A JP4562174A JPS5015446A JP S5015446 A JPS5015446 A JP S5015446A JP 49045621 A JP49045621 A JP 49045621A JP 4562174 A JP4562174 A JP 4562174A JP S5015446 A JPS5015446 A JP S5015446A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP49045621A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5015446A publication Critical patent/JPS5015446A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B53/00—Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0466—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/78391—Field effect transistors with field effect produced by an insulated gate the gate comprising a layer which is used for its ferroelectric properties
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G11C11/223—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements using MOS with ferroelectric gate insulating film

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
JP49045621A 1973-04-24 1974-04-24 Pending JPS5015446A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US00354022A US3832700A (en) 1973-04-24 1973-04-24 Ferroelectric memory device

Publications (1)

Publication Number Publication Date
JPS5015446A true JPS5015446A (ja) 1975-02-18

Family

ID=23391570

Family Applications (1)

Application Number Title Priority Date Filing Date
JP49045621A Pending JPS5015446A (ja) 1973-04-24 1974-04-24

Country Status (5)

Country Link
US (1) US3832700A (ja)
JP (1) JPS5015446A (ja)
DE (1) DE2418808A1 (ja)
FR (1) FR2227598B1 (ja)
GB (1) GB1447604A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5198994A (en) * 1988-08-31 1993-03-30 Kabushiki Kaisha Toshiba Ferroelectric memory device
JPWO2017086464A1 (ja) * 2015-11-19 2018-05-31 ブランテック株式会社 保冷庫、移動体、氷スラリー供給システム、被保冷品輸送システム、被保冷品の保冷方法、被保冷品の輸送方法

Families Citing this family (56)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5346621B2 (ja) * 1974-10-21 1978-12-15
US4161038A (en) * 1977-09-20 1979-07-10 Westinghouse Electric Corp. Complementary metal-ferroelectric semiconductor transistor structure and a matrix of such transistor structure for performing a comparison
JPS6045368B2 (ja) * 1977-12-08 1985-10-09 セイコーエプソン株式会社 半導体ガスセンサ
US4873664A (en) * 1987-02-12 1989-10-10 Ramtron Corporation Self restoring ferroelectric memory
EP0293798B2 (en) 1987-06-02 1998-12-30 National Semiconductor Corporation Non-volatile memory ciruit using ferroelectric capacitor storage element
US5046043A (en) * 1987-10-08 1991-09-03 National Semiconductor Corporation Ferroelectric capacitor and memory cell including barrier and isolation layers
US5434811A (en) * 1987-11-19 1995-07-18 National Semiconductor Corporation Non-destructive read ferroelectric based memory circuit
KR940006708B1 (ko) * 1989-01-26 1994-07-25 세이꼬 엡슨 가부시끼가이샤 반도체 장치의 제조 방법
KR950000156B1 (ko) * 1989-02-08 1995-01-10 세이꼬 엡슨 가부시끼가이샤 반도체 장치
KR930002470B1 (ko) * 1989-03-28 1993-04-02 가부시키가이샤 도시바 전기적인 독출/기록동작이 가능한 불휘발성 반도체기억장치 및 그 정보독출방법
JP2573384B2 (ja) * 1990-01-24 1997-01-22 株式会社東芝 半導体記憶装置とその製造方法
US5146299A (en) * 1990-03-02 1992-09-08 Westinghouse Electric Corp. Ferroelectric thin film material, method of deposition, and devices using same
JP3169599B2 (ja) * 1990-08-03 2001-05-28 株式会社日立製作所 半導体装置、その駆動方法、その読み出し方法
JP2834603B2 (ja) * 1991-08-16 1998-12-09 ローム株式会社 強誘電体デバイス
EP0540993A1 (en) * 1991-11-06 1993-05-12 Ramtron International Corporation Structure and fabrication of high transconductance MOS field effect transistor using a buffer layer/ferroelectric/buffer layer stack as the gate dielectric
US5307305A (en) * 1991-12-04 1994-04-26 Rohm Co., Ltd. Semiconductor device having field effect transistor using ferroelectric film as gate insulation film
FR2688090B1 (fr) * 1992-02-27 1994-04-08 Commissariat A Energie Atomique Cellule memoire non volatile du type metal-ferroelectrique semi-conducteur.
JP3118063B2 (ja) * 1992-03-23 2000-12-18 ローム株式会社 不揮発性記憶素子およびこれを利用した不揮発性記憶装置、ならびに不揮発性記憶素子の製造方法
US5563081A (en) * 1992-03-23 1996-10-08 Rohm Co., Inc. Method for making a nonvolatile memory device utilizing a field effect transistor having a ferroelectric gate film
JPH0731705B2 (ja) * 1992-08-24 1995-04-10 東京工業大学長 自己学習型積和演算回路素子及び回路
US5523964A (en) * 1994-04-07 1996-06-04 Symetrix Corporation Ferroelectric non-volatile memory unit
JP2942088B2 (ja) * 1993-03-19 1999-08-30 ローム株式会社 半導体装置の動作方法、および半導体装置
US5666305A (en) * 1993-03-29 1997-09-09 Olympus Optical Co., Ltd. Method of driving ferroelectric gate transistor memory cell
JPH0745794A (ja) * 1993-07-26 1995-02-14 Olympus Optical Co Ltd 強誘電体メモリの駆動方法
US5504699A (en) * 1994-04-08 1996-04-02 Goller; Stuart E. Nonvolatile magnetic analog memory
US5541870A (en) * 1994-10-28 1996-07-30 Symetrix Corporation Ferroelectric memory and non-volatile memory cell for same
US5808676A (en) * 1995-01-03 1998-09-15 Xerox Corporation Pixel cells having integrated analog memories and arrays thereof
US5686745A (en) * 1995-06-19 1997-11-11 University Of Houston Three-terminal non-volatile ferroelectric/superconductor thin film field effect transistor
US5757042A (en) * 1996-06-14 1998-05-26 Radiant Technologies, Inc. High density ferroelectric memory with increased channel modulation and double word ferroelectric memory cell for constructing the same
US6048738A (en) * 1997-03-07 2000-04-11 Sharp Laboratories Of America, Inc. Method of making ferroelectric memory cell for VLSI RAM array
US5962884A (en) * 1997-03-07 1999-10-05 Sharp Laboratories Of America, Inc. Single transistor ferroelectric memory cell with asymmetrical ferroelectric polarization and method of making the same
US6018171A (en) * 1997-03-07 2000-01-25 Sharp Laboratories Of America, Inc. Shallow junction ferroelectric memory cell having a laterally extending p-n junction and method of making the same
US5932904A (en) * 1997-03-07 1999-08-03 Sharp Laboratories Of America, Inc. Two transistor ferroelectric memory cell
US5731608A (en) * 1997-03-07 1998-03-24 Sharp Microelectronics Technology, Inc. One transistor ferroelectric memory cell and method of making the same
US5942776A (en) * 1997-03-07 1999-08-24 Sharp Laboratories Of America, Inc. Shallow junction ferroelectric memory cell and method of making the same
US6067244A (en) * 1997-10-14 2000-05-23 Yale University Ferroelectric dynamic random access memory
US5907762A (en) * 1997-12-04 1999-05-25 Sharp Microelectronics Technology, Inc. Method of manufacture of single transistor ferroelectric memory cell using chemical-mechanical polishing
US6242771B1 (en) 1998-01-02 2001-06-05 Sharp Laboratories Of America, Inc. Chemical vapor deposition of PB5GE3O11 thin film for ferroelectric applications
JPH11251586A (ja) * 1998-03-03 1999-09-17 Fuji Electric Co Ltd 電界効果トランジスタ
US6525357B1 (en) 1999-10-20 2003-02-25 Agilent Technologies, Inc. Barrier layers ferroelectric memory devices
US7491642B2 (en) 2000-07-12 2009-02-17 The California Institute Of Technology Electrical passivation of silicon-containing surfaces using organic layers
JP2004519864A (ja) * 2000-08-24 2004-07-02 コバ・テクノロジーズ・インコーポレイテッド シングルトランジスタ希土類亜マンガン酸塩強誘電体不揮発性メモリセル
US20020164850A1 (en) 2001-03-02 2002-11-07 Gnadinger Alfred P. Single transistor rare earth manganite ferroelectric nonvolatile memory cell
US7066088B2 (en) * 2002-07-31 2006-06-27 Day International, Inc. Variable cut-off offset press system and method of operation
US6825517B2 (en) * 2002-08-28 2004-11-30 Cova Technologies, Inc. Ferroelectric transistor with enhanced data retention
US6714435B1 (en) * 2002-09-19 2004-03-30 Cova Technologies, Inc. Ferroelectric transistor for storing two data bits
US6888736B2 (en) 2002-09-19 2005-05-03 Cova Technologies, Inc. Ferroelectric transistor for storing two data bits
US6894916B2 (en) 2002-09-27 2005-05-17 International Business Machines Corporation Memory array employing single three-terminal non-volatile storage elements
US6744087B2 (en) 2002-09-27 2004-06-01 International Business Machines Corporation Non-volatile memory using ferroelectric gate field-effect transistors
DE10336397B4 (de) * 2003-08-06 2006-12-14 Forschungszentrum Jülich GmbH Vorrichtung zum Speichern digitaler Daten
US7297602B2 (en) * 2003-09-09 2007-11-20 Sharp Laboratories Of America, Inc. Conductive metal oxide gate ferroelectric memory transistor
US7378286B2 (en) * 2004-08-20 2008-05-27 Sharp Laboratories Of America, Inc. Semiconductive metal oxide thin film ferroelectric memory transistor
RU2383945C2 (ru) * 2006-06-09 2010-03-10 Юрий Генрихович Кригер Методы неразрушаемого считывания информации с ферроэлектрических элементов памяти
US10267773B2 (en) 2014-03-13 2019-04-23 Konica Minolta, Inc Phasing adder, ultrasound probe, acoustic sensor and ultrasound diagnosis apparatus
JP6375648B2 (ja) 2014-03-13 2018-08-22 コニカミノルタ株式会社 音響センサー、及び、超音波探触子
CN115548128B (zh) * 2022-12-05 2023-04-14 浙江大学杭州国际科创中心 一种铁电半导体器件、制备方法以及实现多铁电相的方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49131646A (ja) * 1973-04-20 1974-12-17

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL97896C (ja) * 1955-02-18
US2791761A (en) * 1955-02-18 1957-05-07 Bell Telephone Labor Inc Electrical switching and storage
JPS4844585B1 (ja) * 1969-04-12 1973-12-25

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49131646A (ja) * 1973-04-20 1974-12-17

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5198994A (en) * 1988-08-31 1993-03-30 Kabushiki Kaisha Toshiba Ferroelectric memory device
JPWO2017086464A1 (ja) * 2015-11-19 2018-05-31 ブランテック株式会社 保冷庫、移動体、氷スラリー供給システム、被保冷品輸送システム、被保冷品の保冷方法、被保冷品の輸送方法

Also Published As

Publication number Publication date
GB1447604A (en) 1976-08-25
US3832700A (en) 1974-08-27
FR2227598B1 (ja) 1979-06-15
DE2418808A1 (de) 1974-10-31
FR2227598A1 (ja) 1974-11-22

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