JPS50146385A - - Google Patents
Info
- Publication number
- JPS50146385A JPS50146385A JP50041939A JP4193975A JPS50146385A JP S50146385 A JPS50146385 A JP S50146385A JP 50041939 A JP50041939 A JP 50041939A JP 4193975 A JP4193975 A JP 4193975A JP S50146385 A JPS50146385 A JP S50146385A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US458555A US3917950A (en) | 1974-04-08 | 1974-04-08 | Fluoroscopic screen which is optically homogeneous |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS50146385A true JPS50146385A (ja) | 1975-11-25 |
Family
ID=23821230
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50041939A Pending JPS50146385A (ja) | 1974-04-08 | 1975-04-08 | |
| JP1983076122U Pending JPS5917879U (ja) | 1974-04-08 | 1983-05-23 | 螢光鏡板 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1983076122U Pending JPS5917879U (ja) | 1974-04-08 | 1983-05-23 | 螢光鏡板 |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US3917950A (ja) |
| JP (2) | JPS50146385A (ja) |
| CA (1) | CA1031082A (ja) |
| DE (1) | DE2514942A1 (ja) |
| DK (1) | DK146775A (ja) |
| FR (1) | FR2266901B1 (ja) |
| GB (1) | GB1458947A (ja) |
| IT (1) | IT1036204B (ja) |
| NL (1) | NL7503894A (ja) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5578942U (ja) * | 1978-11-22 | 1980-05-30 | ||
| JPS56126750A (en) * | 1980-03-11 | 1981-10-05 | Mitsubishi Electric Corp | Inspecting device for transmission of radiant ray |
| JPS5863559U (ja) * | 1981-10-24 | 1983-04-28 | 株式会社島津製作所 | Ｘ線透視装置 |
| JP2006524351A (ja) * | 2003-04-24 | 2006-10-26 | カール ツアイス エスエムエス ゲゼルシャフト ミット ベシュレンクテル ハフツング | 特にマイクロリトグラフィー用マスクなどの対象物の検査装置 |
| JP2008058023A (ja) * | 2006-08-29 | 2008-03-13 | Hamamatsu Photonics Kk | 光学式検査装置 |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4078180A (en) * | 1976-03-17 | 1978-03-07 | United States Steel Corporation | X-ray inspection of welds |
| US4107534A (en) * | 1977-06-13 | 1978-08-15 | Piltingsrud Harley V | Plutonium-americium detection probe with frontal light-guide-diffuser |
| US4263061A (en) * | 1978-03-27 | 1981-04-21 | Minnesota Mining And Manufacturing Company | Process for forming a high resolution X-ray intensifying screen with antireflecting substrate |
| US4204125A (en) * | 1978-03-27 | 1980-05-20 | Minnesota Mining And Manufacturing Company | High resolution X-ray intensifying screen with antireflecting substrate |
| US4360733A (en) * | 1980-09-08 | 1982-11-23 | Bicron Corporation | Window assembly for a deep well scintillation detector |
| JPS58204400A (ja) * | 1982-05-24 | 1983-11-29 | 富士写真フイルム株式会社 | 放射線像変換パネル |
| CA1270407A (en) * | 1984-04-06 | 1990-06-19 | Kaoru Tamura | Stimulable, phosphor-sheet, and method and device of conveying the same |
| US4636644A (en) * | 1984-05-01 | 1987-01-13 | Irt Corporation | Anti-parallax scintillator system for use with penetrating ionizing radiation |
| JPS61228399A (ja) * | 1985-04-03 | 1986-10-11 | 富士写真フイルム株式会社 | 放射線像変換パネルおよびその製法 |
| GB2199443B (en) * | 1986-12-04 | 1990-10-03 | Rank Cintel Ltd | Improvements in cathode ray tubes |
| EP0498908A1 (de) * | 1991-02-13 | 1992-08-19 | Siemens Aktiengesellschaft | Speicherleuchtschirm mit einem stimulierbaren Speicherleuchtstoff |
| US5498923A (en) * | 1994-01-05 | 1996-03-12 | At&T Corp. | Fluoresence imaging |
| AU4168599A (en) * | 1998-06-18 | 2000-01-05 | Hamamatsu Photonics K.K. | Scintillator panel and radiation image sensor |
| JP4550976B2 (ja) * | 2000-07-31 | 2010-09-22 | 浜松ホトニクス株式会社 | 光電陰極および電子管 |
| JP2002181997A (ja) * | 2000-12-14 | 2002-06-26 | Fuji Photo Film Co Ltd | 放射線像変換パネルおよび放射線画像情報読取方法 |
| DE10335125B4 (de) * | 2003-07-31 | 2007-09-13 | Siemens Ag | Verfahren zur Herstellung eines Leuchtstoffkörpers für einen Röntgendetektor |
| US7057187B1 (en) * | 2003-11-07 | 2006-06-06 | Xradia, Inc. | Scintillator optical system and method of manufacture |
| CN102695966B (zh) * | 2009-11-16 | 2015-08-05 | 圣戈本陶瓷及塑料股份有限公司 | 闪烁物品 |
| JP6487263B2 (ja) * | 2015-04-20 | 2019-03-20 | 浜松ホトニクス株式会社 | 放射線検出器及びその製造方法 |
| JP6862324B2 (ja) | 2017-09-27 | 2021-04-21 | 浜松ホトニクス株式会社 | シンチレータパネル及び放射線検出器 |
| US10490397B1 (en) * | 2018-07-18 | 2019-11-26 | Thermo Finnigan Llc | Methods and systems for detection of ion spatial distribution |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3745359A (en) * | 1971-03-22 | 1973-07-10 | Picker Corp | Scintillation crystal with reflection inhibiting material and scintillation device embodying the crystal |
-
1974
- 1974-04-08 US US458555A patent/US3917950A/en not_active Expired - Lifetime
-
1975
- 1975-03-27 CA CA223,236A patent/CA1031082A/en not_active Expired
- 1975-03-27 GB GB1297275A patent/GB1458947A/en not_active Expired
- 1975-04-02 NL NL7503894A patent/NL7503894A/xx not_active Application Discontinuation
- 1975-04-02 FR FR7510218A patent/FR2266901B1/fr not_active Expired
- 1975-04-05 DE DE19752514942 patent/DE2514942A1/de not_active Ceased
- 1975-04-07 DK DK146775A patent/DK146775A/da not_active IP Right Cessation
- 1975-04-08 IT IT67886/75A patent/IT1036204B/it active
- 1975-04-08 JP JP50041939A patent/JPS50146385A/ja active Pending
-
1983
- 1983-05-23 JP JP1983076122U patent/JPS5917879U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3745359A (en) * | 1971-03-22 | 1973-07-10 | Picker Corp | Scintillation crystal with reflection inhibiting material and scintillation device embodying the crystal |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5578942U (ja) * | 1978-11-22 | 1980-05-30 | ||
| JPS56126750A (en) * | 1980-03-11 | 1981-10-05 | Mitsubishi Electric Corp | Inspecting device for transmission of radiant ray |
| JPS5863559U (ja) * | 1981-10-24 | 1983-04-28 | 株式会社島津製作所 | Ｘ線透視装置 |
| JPS6336266Y2 (ja) * | 1981-10-24 | 1988-09-27 | ||
| JP2006524351A (ja) * | 2003-04-24 | 2006-10-26 | カール ツアイス エスエムエス ゲゼルシャフト ミット ベシュレンクテル ハフツング | 特にマイクロリトグラフィー用マスクなどの対象物の検査装置 |
| JP2011199302A (ja) * | 2003-04-24 | 2011-10-06 | Carl Zeiss Sms Gmbh | 特にマイクロリトグラフィー用マスクなどの対象物の検査装置 |
| JP4818099B2 (ja) * | 2003-04-24 | 2011-11-16 | カール ツァイス エスエムエス ゲーエムベーハー | 特にマイクロリトグラフィー用マスクなどの対象物の検査装置 |
| JP2008058023A (ja) * | 2006-08-29 | 2008-03-13 | Hamamatsu Photonics Kk | 光学式検査装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| IT1036204B (it) | 1979-10-30 |
| CA1031082A (en) | 1978-05-09 |
| FR2266901A1 (ja) | 1975-10-31 |
| DK146775A (ja) | 1975-10-09 |
| JPS5917879U (ja) | 1984-02-03 |
| NL7503894A (nl) | 1975-10-10 |
| US3917950A (en) | 1975-11-04 |
| GB1458947A (en) | 1976-12-15 |
| DE2514942A1 (de) | 1975-10-16 |
| FR2266901B1 (ja) | 1978-10-20 |