NL7503894A - Optisch homogeen uitgevoerd roentgenscherm. - Google Patents

Optisch homogeen uitgevoerd roentgenscherm.

Info

Publication number
NL7503894A
NL7503894A NL7503894A NL7503894A NL7503894A NL 7503894 A NL7503894 A NL 7503894A NL 7503894 A NL7503894 A NL 7503894A NL 7503894 A NL7503894 A NL 7503894A NL 7503894 A NL7503894 A NL 7503894A
Authority
NL
Netherlands
Prior art keywords
roents
homogous
optically
executed
screen
Prior art date
Application number
NL7503894A
Other languages
English (en)
Dutch (nl)
Original Assignee
Imagex Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Imagex Inc filed Critical Imagex Inc
Publication of NL7503894A publication Critical patent/NL7503894A/xx

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Multimedia (AREA)
  • General Physics & Mathematics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Pathology (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
  • Cathode-Ray Tubes And Fluorescent Screens For Display (AREA)
NL7503894A 1974-04-08 1975-04-02 Optisch homogeen uitgevoerd roentgenscherm. NL7503894A (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US458555A US3917950A (en) 1974-04-08 1974-04-08 Fluoroscopic screen which is optically homogeneous

Publications (1)

Publication Number Publication Date
NL7503894A true NL7503894A (nl) 1975-10-10

Family

ID=23821230

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7503894A NL7503894A (nl) 1974-04-08 1975-04-02 Optisch homogeen uitgevoerd roentgenscherm.

Country Status (9)

Country Link
US (1) US3917950A (xx)
JP (2) JPS50146385A (xx)
CA (1) CA1031082A (xx)
DE (1) DE2514942A1 (xx)
DK (1) DK146775A (xx)
FR (1) FR2266901B1 (xx)
GB (1) GB1458947A (xx)
IT (1) IT1036204B (xx)
NL (1) NL7503894A (xx)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4078180A (en) * 1976-03-17 1978-03-07 United States Steel Corporation X-ray inspection of welds
US4107534A (en) * 1977-06-13 1978-08-15 Piltingsrud Harley V Plutonium-americium detection probe with frontal light-guide-diffuser
US4204125A (en) * 1978-03-27 1980-05-20 Minnesota Mining And Manufacturing Company High resolution X-ray intensifying screen with antireflecting substrate
US4263061A (en) * 1978-03-27 1981-04-21 Minnesota Mining And Manufacturing Company Process for forming a high resolution X-ray intensifying screen with antireflecting substrate
JPS5578942U (xx) * 1978-11-22 1980-05-30
JPS56126750A (en) * 1980-03-11 1981-10-05 Mitsubishi Electric Corp Inspecting device for transmission of radiant ray
US4360733A (en) * 1980-09-08 1982-11-23 Bicron Corporation Window assembly for a deep well scintillation detector
JPS5863559U (ja) * 1981-10-24 1983-04-28 株式会社島津製作所 Ｘ線透視装置
JPS58204400A (ja) * 1982-05-24 1983-11-29 富士写真フイルム株式会社 放射線像変換パネル
DE3588045T2 (de) * 1984-04-06 1995-12-21 Fuji Photo Film Co Ltd Übertragungsmethode einer Phosphorfolie.
US4636644A (en) * 1984-05-01 1987-01-13 Irt Corporation Anti-parallax scintillator system for use with penetrating ionizing radiation
JPS61228399A (ja) * 1985-04-03 1986-10-11 富士写真フイルム株式会社 放射線像変換パネルおよびその製法
GB2199443B (en) * 1986-12-04 1990-10-03 Rank Cintel Ltd Improvements in cathode ray tubes
EP0498908A1 (de) * 1991-02-13 1992-08-19 Siemens Aktiengesellschaft Speicherleuchtschirm mit einem stimulierbaren Speicherleuchtstoff
US5498923A (en) * 1994-01-05 1996-03-12 At&T Corp. Fluoresence imaging
CN1163762C (zh) * 1998-06-18 2004-08-25 浜松光子学株式会社 闪烁体面板和放射线图象传感器
JP4550976B2 (ja) * 2000-07-31 2010-09-22 浜松ホトニクス株式会社 光電陰極および電子管
JP2002181997A (ja) * 2000-12-14 2002-06-26 Fuji Photo Film Co Ltd 放射線像変換パネルおよび放射線画像情報読取方法
DE10318560A1 (de) * 2003-04-24 2004-11-11 Carl Zeiss Sms Gmbh Anordnung zur Inspektion von Objekten, insbesondere von Masken in der Mikrolithographie
DE10335125B4 (de) * 2003-07-31 2007-09-13 Siemens Ag Verfahren zur Herstellung eines Leuchtstoffkörpers für einen Röntgendetektor
US7057187B1 (en) * 2003-11-07 2006-06-06 Xradia, Inc. Scintillator optical system and method of manufacture
JP4813294B2 (ja) * 2006-08-29 2011-11-09 浜松ホトニクス株式会社 光学式検査装置
CN102695966B (zh) * 2009-11-16 2015-08-05 圣戈本陶瓷及塑料股份有限公司 闪烁物品
JP6487263B2 (ja) * 2015-04-20 2019-03-20 浜松ホトニクス株式会社 放射線検出器及びその製造方法
JP6862324B2 (ja) * 2017-09-27 2021-04-21 浜松ホトニクス株式会社 シンチレータパネル及び放射線検出器
US10490397B1 (en) * 2018-07-18 2019-11-26 Thermo Finnigan Llc Methods and systems for detection of ion spatial distribution

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3745359A (en) * 1971-03-22 1973-07-10 Picker Corp Scintillation crystal with reflection inhibiting material and scintillation device embodying the crystal

Also Published As

Publication number Publication date
DE2514942A1 (de) 1975-10-16
IT1036204B (it) 1979-10-30
DK146775A (xx) 1975-10-09
FR2266901A1 (xx) 1975-10-31
CA1031082A (en) 1978-05-09
FR2266901B1 (xx) 1978-10-20
JPS5917879U (ja) 1984-02-03
US3917950A (en) 1975-11-04
JPS50146385A (xx) 1975-11-25
GB1458947A (en) 1976-12-15

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Legal Events

Date Code Title Description
BA A request for search or an international-type search has been filed
BB A search report has been drawn up
BC A request for examination has been filed
A85 Still pending on 85-01-01
BV The patent application has lapsed