JPH09500970A - 分光装置 - Google Patents
分光装置Info
- Publication number
- JPH09500970A JPH09500970A JP7530157A JP53015795A JPH09500970A JP H09500970 A JPH09500970 A JP H09500970A JP 7530157 A JP7530157 A JP 7530157A JP 53015795 A JP53015795 A JP 53015795A JP H09500970 A JPH09500970 A JP H09500970A
- Authority
- JP
- Japan
- Prior art keywords
- spectrum
- detector
- optical
- light
- filter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001228 spectrum Methods 0.000 claims abstract description 65
- 230000003287 optical effect Effects 0.000 claims abstract description 43
- 238000001069 Raman spectroscopy Methods 0.000 claims abstract description 21
- 239000006185 dispersion Substances 0.000 claims abstract description 9
- 230000003595 spectral effect Effects 0.000 claims description 16
- 238000004611 spectroscopical analysis Methods 0.000 claims 1
- 239000000523 sample Substances 0.000 description 14
- 230000008901 benefit Effects 0.000 description 9
- 238000004458 analytical method Methods 0.000 description 7
- 230000005540 biological transmission Effects 0.000 description 7
- 230000004075 alteration Effects 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 230000008859 change Effects 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 4
- 230000010287 polarization Effects 0.000 description 4
- 241000257465 Echinoidea Species 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000001237 Raman spectrum Methods 0.000 description 2
- 238000003491 array Methods 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000005499 meniscus Effects 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 244000303258 Annona diversifolia Species 0.000 description 1
- 235000002198 Annona diversifolia Nutrition 0.000 description 1
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 241000406668 Loxodonta cyclotis Species 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 238000005424 photoluminescence Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000035943 smell Effects 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
- G01J3/36—Investigating two or more bands of a spectrum by separate detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0202—Mechanical elements; Supports for optical elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.試料から出た散乱光のスペクトルを受ける光学的入力と、 少なくとも第一の方向に拡がる前記散乱光の検出器と、 前記光学的入力と前記検出器との間に配置されて前記検出器を横切る前記第一 の方向に前記スペクトルの一部を分散させる分散部材と、 前記光学的入力と前記検出器との間に配置されて前記検出器に対して少なくと も二つの異なる光路をたどるように前記散乱光を分け、この散乱光は前記それぞ れの光路により前記スペクトルの異なる部分となって前記検出器に到達する少な くとも一つの光スプリッタと を具えた分光分析装置。 2.前記検出器は、前記第一の方向に対して直角な第二の方向に拡がる二次元で あって、一方の前記光路によって前記検出器に達する前記スペクトルの第一の部 分の光は、他方の前記光路によって前記検出器に達するスペクトルの第二の部分 の光から前記第二の方向に間隔があいている請求項1に記載の分光分析装置。 3.少なくとも三つの異なる光路を有し、前記スペクトルの少なくとも三つの部 分の光は、前記光路のそれぞれ一つを介して前記検出器の前記第二の方向に隙間 を隔てたそれぞれの位置に達する請求項2に記載の分光分析装置。 4.前記検出器は、電荷結合素子である請求項2または請求項3に記載の分光分 析装置。 5.前記光スプリッタは、前記スペクトルの一部を一方の光路に沿って通過させ 、前記スペクトルの他の部分を他方の光路に沿って反射するフィルタである請求 項1から請求項4の何れかに記載の分光分析装置。 6.前記フィルタは、エッジフィルタである請求項5に記載の分光分析装置。 7.前記複数の光路に前記散乱光を分ける前記複数のフィルタを有する請求項5 または請求項6に記載の分光分析装置。 8.前記光スプリッタは、前記光学的入力と前記分散部材との間に位置する請求 項1から請求項7の何れかに記載の分光分析装置。 9.前記光スプリッタは、前記分散部材と前記検出器との間に位置する請求項1 から請求項7の何れかに記載の分光分析装置。 10.前記光路の前記光をそれぞれ検出器に焦点合わせする共通レンズを有し、 各光路はこの共通レンズの中央を通る請求項1から請求項9の何れかに記載の分 光分析装置。 11.前記分散部材および前記検出器は、前記光学的入力を通って受ける光とほ ぼ同一平面にある請求項1から請求項10の何れかに記載の分光分析装置。 12.検出される前記スペクトルは、ラマン散乱光のスペクトルである請求項1 から請求項11の何れかに記載の分光分析装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9410395A GB9410395D0 (en) | 1994-05-24 | 1994-05-24 | Spectroscopic apparatus |
GB9410395.9 | 1994-05-24 | ||
PCT/GB1995/001190 WO1995032408A1 (en) | 1994-05-24 | 1995-05-24 | Spectroscopic apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH09500970A true JPH09500970A (ja) | 1997-01-28 |
JP3660680B2 JP3660680B2 (ja) | 2005-06-15 |
Family
ID=10755636
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP53015795A Expired - Fee Related JP3660680B2 (ja) | 1994-05-24 | 1995-05-24 | 分光装置 |
Country Status (9)
Country | Link |
---|---|
US (1) | US5638173A (ja) |
EP (1) | EP0711408B1 (ja) |
JP (1) | JP3660680B2 (ja) |
KR (1) | KR960704216A (ja) |
DE (1) | DE69514485T2 (ja) |
GB (1) | GB9410395D0 (ja) |
TW (1) | TW324059B (ja) |
WO (1) | WO1995032408A1 (ja) |
ZA (1) | ZA954234B (ja) |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0989668A (ja) * | 1995-09-22 | 1997-04-04 | Nikon Corp | 光スペクトル検出装置 |
JPH09145477A (ja) * | 1995-11-20 | 1997-06-06 | Tokyo Instr:Kk | 分光器 |
JP2002514747A (ja) * | 1998-05-09 | 2002-05-21 | レニショウ パブリック リミテッド カンパニー | 電子顕微鏡および分光システム |
JP2003121361A (ja) * | 2001-10-11 | 2003-04-23 | Mitsubishi Heavy Ind Ltd | レーザ光を用いた微量成分測定方法及びその装置 |
JP2007093414A (ja) * | 2005-09-29 | 2007-04-12 | Photon Design:Kk | 分光装置 |
JP2008501104A (ja) * | 2004-05-29 | 2008-01-17 | アストリウム・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング | 光スペクトルを検出する方法及び装置 |
JP2010169493A (ja) * | 2009-01-22 | 2010-08-05 | National Institute Of Advanced Industrial Science & Technology | 分光放射計 |
JP2013044702A (ja) * | 2011-08-26 | 2013-03-04 | Nikon Corp | 分光ユニット及び走査型顕微鏡 |
JP2013072874A (ja) * | 2011-09-26 | 2013-04-22 | Raytheon Co | 統合された3チャネルの気体の検出及び測定の分光計 |
JP2014238385A (ja) * | 2013-05-10 | 2014-12-18 | 株式会社リコー | 分光特性取得装置、画像評価装置、画像形成装置 |
JP2015102465A (ja) * | 2013-11-26 | 2015-06-04 | 日本電気株式会社 | スリット幅変更装置及び方法並びにスペクトル出力装置 |
JP2017529529A (ja) * | 2014-08-28 | 2017-10-05 | レニショウ パブリック リミテッド カンパニーRenishaw Public Limited Company | 分光装置 |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19735205A1 (de) * | 1997-08-14 | 1999-02-25 | Gustav Prof Dr Techn Schweiger | Verfahren zur spektroskopischen Rußmessung |
DE19902625A1 (de) * | 1998-01-28 | 1999-09-30 | Leica Microsystems | Vorrichtung zur gleichzeitigen Detektion mehrerer Spektralbereiche eines Lichtstrahls |
US6885445B2 (en) | 1998-05-09 | 2005-04-26 | Renishaw Plc | Electron microscope and spectroscopy system |
US6337472B1 (en) * | 1998-10-19 | 2002-01-08 | The University Of Texas System Board Of Regents | Light imaging microscope having spatially resolved images |
JP2000283960A (ja) * | 1999-03-31 | 2000-10-13 | Shimadzu Corp | マイクロチップ電気泳動装置 |
US6351306B1 (en) | 1999-10-19 | 2002-02-26 | Kaiser Optical Systems, Inc. | Optical measurement probe calibration configurations |
US6690467B1 (en) | 2000-05-05 | 2004-02-10 | Pe Corporation | Optical system and method for optically analyzing light from a sample |
US6967717B1 (en) * | 2000-06-14 | 2005-11-22 | The United States Of America As Represented By The Secretary Of The Navy | Thermo-electrically cooled surface enhanced Raman spectroscopy sensor system |
US6958811B2 (en) | 2000-06-29 | 2005-10-25 | Carl Zeiss Jena Gmbh | Method for the detection of dyes in fluorescence microscopy |
US6747737B2 (en) | 2000-06-29 | 2004-06-08 | Carl Zeiss Jena Gmbh | Method for optical detection of an illuminated specimen in a plurality of detection channels |
US6858852B2 (en) | 2000-08-08 | 2005-02-22 | Carl Zeiss Jena Gmbh | Method and apparatus for rapid change of fluorescence bands in the detection of dyes in fluorescence microscopy |
US6947133B2 (en) * | 2000-08-08 | 2005-09-20 | Carl Zeiss Jena Gmbh | Method for increasing the spectral and spatial resolution of detectors |
US6670087B2 (en) * | 2000-11-07 | 2003-12-30 | Canon Kabushiki Kaisha | Toner, image-forming apparatus, process cartridge and image forming method |
US6788407B1 (en) | 2002-03-18 | 2004-09-07 | Itt Manufacturing Enterprises, Inc. | Laser interrogation of surface agents |
US20050182328A1 (en) * | 2002-08-09 | 2005-08-18 | Hamamatsu Photonics K.K. | System enabling chromaticity measurement in the visible and invisible ranges |
US7667882B2 (en) * | 2004-10-12 | 2010-02-23 | Georgia Tech Research Corp. | Fourier transform volume holographic spectrometer |
US7616303B2 (en) * | 2005-04-25 | 2009-11-10 | University Of Massachusetts | Systems and methods for correcting optical reflectance measurements |
US7397561B2 (en) * | 2005-11-07 | 2008-07-08 | Wafermasters, Incorporated | Spectroscopy system |
US7564547B2 (en) | 2005-11-07 | 2009-07-21 | Wafermasters, Inc. | Spectroscopy system |
IL173025A0 (en) * | 2006-01-09 | 2007-03-08 | Oren Aharon | A method and apparatus for high resolution spectroscopy |
US20080010019A1 (en) * | 2006-07-06 | 2008-01-10 | Thomas Richard A | High speed spectrum analyzer |
DE102006047913B4 (de) * | 2006-10-06 | 2013-08-08 | Carl Zeiss Microscopy Gmbh | Hochempfindliche spektralanalytische Einheit |
US8203716B2 (en) * | 2006-10-30 | 2012-06-19 | Georgia Tech Research Corporation | Tandem Fabry-Perot etalon cylindrical beam volume hologram for high resolution/large spectral range diffuse light spectroscopy |
US8077309B2 (en) | 2007-01-29 | 2011-12-13 | Applied Instrument Technologies, Inc. | Chemical analyzer for industrial process control |
US8922768B2 (en) * | 2010-10-04 | 2014-12-30 | Wasatch Photonics, Inc. | Multi-path spectrometer |
FR2969282B1 (fr) * | 2010-12-21 | 2014-07-18 | Horiba Jobin Yvon Sas | Dispositif et procede de visualisation et de mesure de diffusion raman |
US20150346102A1 (en) * | 2014-06-03 | 2015-12-03 | Innovative Photonic Solutions, Inc. | Compact Raman Probe Integrated with Wavelength Stabilized Diode Laser Source |
WO2016101986A1 (de) * | 2014-12-22 | 2016-06-30 | Spectro Analytical Instruments Gmbh | Gitterspektrometer mit umschaltbarem lichtweg |
CN108603839A (zh) | 2016-04-18 | 2018-09-28 | 惠普发展公司,有限责任合伙企业 | 散射辐射的多重光谱的同时检测 |
WO2020174239A1 (en) | 2019-02-27 | 2020-09-03 | Renishaw Plc | Spectroscopic apparatus |
US11280675B2 (en) * | 2019-06-18 | 2022-03-22 | Ruolin Li | Method, system and apparatus for a Raman spectroscopic measurement system |
JP2022071291A (ja) * | 2020-10-28 | 2022-05-16 | キヤノン株式会社 | 識別装置 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
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BE571401A (ja) * | ||||
US2453164A (en) * | 1945-05-19 | 1948-11-09 | Lane Wells Co | Plural grating spectrograph |
US3791737A (en) * | 1971-06-18 | 1974-02-12 | A Johansson | Spectrometer in which a desired number of spectral lines are focused at one fixed output slit |
US3733131A (en) * | 1971-08-05 | 1973-05-15 | Perkin Elmer Ltd | Optical beam switching devices utilizing a pair of plane mirrors |
JPS57111422A (en) * | 1980-12-29 | 1982-07-10 | Shimadzu Corp | Spectrum measuring device |
US4599001A (en) * | 1984-05-02 | 1986-07-08 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Multispectral linear array multiband selection device |
US4729658A (en) * | 1986-06-05 | 1988-03-08 | The Perkin-Elmer Corporation | Very wide spectral coverage grating spectrometer |
US4747688A (en) * | 1986-09-26 | 1988-05-31 | The United States Of America As Represented By The Secretary Of The Air Force | Fiber optic coherence meter |
GB8715949D0 (en) * | 1987-07-07 | 1987-08-12 | Beckman Riic Ltd | Spectrophotometers |
GB2256923B (en) * | 1990-02-02 | 1993-09-22 | De La Rue Thomas & Co Ltd | Detection apparatus |
WO1992017806A1 (en) * | 1991-04-05 | 1992-10-15 | Meridian Instruments, Inc. | Multiple path scanning microscope |
DE69227201T2 (de) * | 1991-11-16 | 1999-02-18 | Renishaw Plc | Spektroskopisches Verfahren |
FI90289C (fi) * | 1992-04-08 | 1994-01-10 | Valtion Teknillinen | Optinen komponentti |
DE4223212C2 (de) * | 1992-07-15 | 1999-03-18 | Bodenseewerk Perkin Elmer Co | Gitter-Polychromator |
US5442439A (en) * | 1993-04-21 | 1995-08-15 | Kaiser Optical Systems, Inc. | Spectrograph with multiplexing of different wavelength regions onto a single opto-electric detector array |
US5424826A (en) * | 1993-07-30 | 1995-06-13 | Control Development, Inc. | Wideband optical micro-spectrometer system |
-
1994
- 1994-05-24 GB GB9410395A patent/GB9410395D0/en active Pending
-
1995
- 1995-05-24 ZA ZA954234A patent/ZA954234B/xx unknown
- 1995-05-24 WO PCT/GB1995/001190 patent/WO1995032408A1/en active IP Right Grant
- 1995-05-24 JP JP53015795A patent/JP3660680B2/ja not_active Expired - Fee Related
- 1995-05-24 DE DE69514485T patent/DE69514485T2/de not_active Expired - Lifetime
- 1995-05-24 KR KR1019960700310A patent/KR960704216A/ko not_active Application Discontinuation
- 1995-05-24 EP EP95919558A patent/EP0711408B1/en not_active Expired - Lifetime
- 1995-05-24 US US08/578,651 patent/US5638173A/en not_active Expired - Lifetime
- 1995-06-09 TW TW084105893A patent/TW324059B/zh active
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0989668A (ja) * | 1995-09-22 | 1997-04-04 | Nikon Corp | 光スペクトル検出装置 |
JPH09145477A (ja) * | 1995-11-20 | 1997-06-06 | Tokyo Instr:Kk | 分光器 |
JP2002514747A (ja) * | 1998-05-09 | 2002-05-21 | レニショウ パブリック リミテッド カンパニー | 電子顕微鏡および分光システム |
JP2003121361A (ja) * | 2001-10-11 | 2003-04-23 | Mitsubishi Heavy Ind Ltd | レーザ光を用いた微量成分測定方法及びその装置 |
JP2008501104A (ja) * | 2004-05-29 | 2008-01-17 | アストリウム・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング | 光スペクトルを検出する方法及び装置 |
JP4642621B2 (ja) * | 2005-09-29 | 2011-03-02 | 株式会社フォトンデザイン | 分光装置 |
JP2007093414A (ja) * | 2005-09-29 | 2007-04-12 | Photon Design:Kk | 分光装置 |
JP2010169493A (ja) * | 2009-01-22 | 2010-08-05 | National Institute Of Advanced Industrial Science & Technology | 分光放射計 |
JP2013044702A (ja) * | 2011-08-26 | 2013-03-04 | Nikon Corp | 分光ユニット及び走査型顕微鏡 |
JP2013072874A (ja) * | 2011-09-26 | 2013-04-22 | Raytheon Co | 統合された3チャネルの気体の検出及び測定の分光計 |
JP2014238385A (ja) * | 2013-05-10 | 2014-12-18 | 株式会社リコー | 分光特性取得装置、画像評価装置、画像形成装置 |
JP2015102465A (ja) * | 2013-11-26 | 2015-06-04 | 日本電気株式会社 | スリット幅変更装置及び方法並びにスペクトル出力装置 |
JP2017529529A (ja) * | 2014-08-28 | 2017-10-05 | レニショウ パブリック リミテッド カンパニーRenishaw Public Limited Company | 分光装置 |
Also Published As
Publication number | Publication date |
---|---|
GB9410395D0 (en) | 1994-07-13 |
WO1995032408A1 (en) | 1995-11-30 |
EP0711408B1 (en) | 2000-01-12 |
KR960704216A (ko) | 1996-08-31 |
DE69514485T2 (de) | 2000-08-24 |
US5638173A (en) | 1997-06-10 |
ZA954234B (en) | 1996-01-22 |
DE69514485D1 (de) | 2000-02-17 |
TW324059B (en) | 1998-01-01 |
JP3660680B2 (ja) | 2005-06-15 |
EP0711408A1 (en) | 1996-05-15 |
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